Pavel Margulis

Person

Ashdod, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Sensing unit having photon to electron converter
- Patent number 11,774,281
- Issue date Oct 3, 2023
- Applied Materials Israel Ltd.
- Pavel Margulis
- G01 - MEASURING TESTING
Information Patent Grant
High-gain stable avalanche photo-diode formed within a first semico...
- Patent number 11,282,971
- Issue date Mar 22, 2022
- Applied Materials Israel Ltd.
- Pavel Margulis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensing unit having photon to electron converter and a method
- Patent number 11,268,849
- Issue date Mar 8, 2022
- Applied Materials Israel Ltd.
- Pavel Margulis
- G01 - MEASURING TESTING
Information Patent Grant
Detection circuit having reduced noise
- Patent number 11,265,085
- Issue date Mar 1, 2022
- Applied Materials Israel Ltd.
- Pavel Margulis
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method for noise reduction and a detection circuit
- Patent number 11,226,230
- Issue date Jan 18, 2022
- Applied Materials Israel Ltd.
- Pavel Margulis
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Detection circuit and method for amplifying a photosensor output cu...
- Patent number 11,177,775
- Issue date Nov 16, 2021
- Applied Materials Israel Ltd.
- Pavel Margulis
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Supply unit and a method for driving an electrode of a charged part...
- Patent number 11,043,357
- Issue date Jun 22, 2021
- Applied Materials Israel Ltd.
- Pavel Margulis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection unit, scanning charged particle beam device and a method
- Patent number 10,388,490
- Issue date Aug 20, 2019
- Applied Materials Israel Ltd.
- Pavel Margulis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light detector and a method for detecting light
- Patent number 10,197,441
- Issue date Feb 5, 2019
- Applied Materials Israel Ltd.
- Raphael Matthews
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for scanning an object
- Patent number 9,881,765
- Issue date Jan 30, 2018
- Applied Materials Israel Ltd.
- Pavel Margulis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for control of avalanche photo-diode characterist...
- Patent number 9,869,582
- Issue date Jan 16, 2018
- Applied Materials Israel Ltd.
- Pavel Margulis
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for inspection using programmable filters
- Patent number 9,767,537
- Issue date Sep 19, 2017
- Applied Materials Israel Ltd.
- Pavel Margulis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for reducing dark current drift in a photodiode b...
- Patent number 9,299,872
- Issue date Mar 29, 2016
- Applied Materials Israel, Ltd.
- Pavel Margulis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for control of avalanche photo-diode characterist...
- Patent number 9,269,835
- Issue date Feb 23, 2016
- Applied Materials Israel, Ltd.
- Pavel Margulis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photo-detector device and a method for biasing a photomultiplier tu...
- Patent number 8,921,756
- Issue date Dec 30, 2014
- Applied Materials Israel, Ltd.
- Michael Heifets
- G01 - MEASURING TESTING
Information Patent Grant
Compensation of nonuniformity among multiple sensing diodes in a mu...
- Patent number 7,518,094
- Issue date Apr 14, 2009
- Applied Materials, Israel, Ltd.
- Pavel Margulis
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for line alignment to compensate for static...
- Patent number 6,831,736
- Issue date Dec 14, 2004
- Applied Materials Israel, Ltd.
- Rami Elichai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SENSING UNIT HAVING PHOTON TO ELECTRON CONVERTER AND A METHOD
- Publication number 20220136894
- Publication date May 5, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Pavel Margulis
- G01 - MEASURING TESTING
Information Patent Application
HIGH-GAIN STABLE AVALANCHE PHOTO-DIODE
- Publication number 20210249543
- Publication date Aug 12, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Pavel Margulis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTODETECTOR CONFIGURATIONS
- Publication number 20210208290
- Publication date Jul 8, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Pavel Margulis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTION CIRCUIT AND METHOD FOR AMPLIFYING A PHOTOSENSOR OUTPUT CU...
- Publication number 20210184634
- Publication date Jun 17, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Pavel Margulis
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD FOR CURING SOLID STATE PHOTOSENSORS
- Publication number 20210098315
- Publication date Apr 1, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Pavel Margulis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR NOISE REDUCTION AND A DETECTION CIRCUIT
- Publication number 20210033456
- Publication date Feb 4, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Pavel Margulis
- G01 - MEASURING TESTING
Information Patent Application
DETECTION CIRCUIT HAVING REDUCED NOISE
- Publication number 20210036782
- Publication date Feb 4, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Pavel Margulis
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SENSING UNIT HAVING PHOTON TO ELECTRON CONVERTER AND A METHOD
- Publication number 20200333180
- Publication date Oct 22, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Pavel Margulis
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR SCANNING AN OBJECT
- Publication number 20170309439
- Publication date Oct 26, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Pavel Margulis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR CONTROL OF AVALANCHE PHOTO-DIODE CHARACTERIST...
- Publication number 20160076938
- Publication date Mar 17, 2016
- APPLIED MATERIALS ISRAEL, LTD.
- Pavel Margulis
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR CONTROL OF AVALANCHE PHOTO-DIODE CHARACTERIST...
- Publication number 20150287841
- Publication date Oct 8, 2015
- APPLIED MATERIALS ISRAEL, LTD.
- Pavel Margulis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR REDUCING DARK CURRENT DRIFT IN A PHOTODIODE B...
- Publication number 20150145090
- Publication date May 28, 2015
- APPLIED MATERIALS ISRAEL, LTD.
- Pavel Margulis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTO-DETECTOR DEVICE AND A METHOD FOR BIASING A PHOTOMULTIPLIER TUBE
- Publication number 20130264464
- Publication date Oct 10, 2013
- Michael Heifets
- G01 - MEASURING TESTING
Information Patent Application
System and method for controlling the characteristics of multiple s...
- Publication number 20070278382
- Publication date Dec 6, 2007
- Applied Materials Israel Ltd.
- Pavel Margulis
- G01 - MEASURING TESTING
Information Patent Application
Method of and apparatus for line alignment to compensate for static...
- Publication number 20040066506
- Publication date Apr 8, 2004
- Applied Materials Israel Ltd.
- Rami Elichai
- G01 - MEASURING TESTING

Pavel Margulis

Person

Patents Grantslast 30 patents

Sensing unit having photon to electron converter

High-gain stable avalanche photo-diode formed within a first semico...

Sensing unit having photon to electron converter and a method

Detection circuit having reduced noise

Method for noise reduction and a detection circuit

Detection circuit and method for amplifying a photosensor output cu...

Supply unit and a method for driving an electrode of a charged part...

Detection unit, scanning charged particle beam device and a method

Light detector and a method for detecting light

Method and system for scanning an object

Method and device for control of avalanche photo-diode characterist...

System and method for inspection using programmable filters

System and method for reducing dark current drift in a photodiode b...

Method and device for control of avalanche photo-diode characterist...

Photo-detector device and a method for biasing a photomultiplier tu...

Compensation of nonuniformity among multiple sensing diodes in a mu...

Method of and apparatus for line alignment to compensate for static...

Patents Applicationslast 30 patents

SENSING UNIT HAVING PHOTON TO ELECTRON CONVERTER AND A METHOD

HIGH-GAIN STABLE AVALANCHE PHOTO-DIODE

PHOTODETECTOR CONFIGURATIONS

DETECTION CIRCUIT AND METHOD FOR AMPLIFYING A PHOTOSENSOR OUTPUT CU...

METHOD FOR CURING SOLID STATE PHOTOSENSORS

METHOD FOR NOISE REDUCTION AND A DETECTION CIRCUIT

DETECTION CIRCUIT HAVING REDUCED NOISE

SENSING UNIT HAVING PHOTON TO ELECTRON CONVERTER AND A METHOD

METHOD AND SYSTEM FOR SCANNING AN OBJECT

METHOD AND DEVICE FOR CONTROL OF AVALANCHE PHOTO-DIODE CHARACTERIST...

METHOD AND DEVICE FOR CONTROL OF AVALANCHE PHOTO-DIODE CHARACTERIST...

SYSTEM AND METHOD FOR REDUCING DARK CURRENT DRIFT IN A PHOTODIODE B...

PHOTO-DETECTOR DEVICE AND A METHOD FOR BIASING A PHOTOMULTIPLIER TUBE

System and method for controlling the characteristics of multiple s...

Method of and apparatus for line alignment to compensate for static...