Peter P. Cuevas

Person

Los Gatos, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
DRAM with selective epitaxial cell transistor
- Patent number 11,626,407
- Issue date Apr 11, 2023
- Integrated Silicon Solution, (Cayman) Inc.
- Andrew J. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selector transistor with continuously variable current drive
- Patent number 11,545,524
- Issue date Jan 3, 2023
- Integrated Silicon Solution, (Cayman) Inc.
- Andrew J. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selector transistor with metal replacement gate wordline
- Patent number 11,444,123
- Issue date Sep 13, 2022
- Integrated Silicon Solution, (Cayman) Inc.
- Dafna Beery
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
DRAM with selective epitaxial transistor and buried bitline
- Patent number 11,329,048
- Issue date May 10, 2022
- Integrated Silicon Solution, (Cayman) Inc.
- Andrew J. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
DRAM with selective epitaxial cell transistor
- Patent number 11,302,697
- Issue date Apr 12, 2022
- Integrated Silicon Solution, (Cayman) Inc.
- Andrew J. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Predicting tunnel barrier endurance using redundant memory structures
- Patent number 10,236,075
- Issue date Mar 19, 2019
- Spin Memory, Inc.
- Kuk-Hwan Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Modified current source (MCS) with seamless range switching
- Patent number 7,812,589
- Issue date Oct 12, 2010
- Qualitau, Inc.
- James Borthwick
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connector for semiconductor device test fixture and test...
- Patent number 7,405,573
- Issue date Jul 29, 2008
- QualiTau, Inc.
- Peter P. Cuevas
- G01 - MEASURING TESTING
Information Patent Grant
High temperature open ended zero insertion force (ZIF) test socket
- Patent number 7,172,450
- Issue date Feb 6, 2007
- QualiTau, Inc.
- Robert James Sylvia
- G01 - MEASURING TESTING
Information Patent Grant
Dual channel source measurement unit for semiconductor device testing
- Patent number 7,151,389
- Issue date Dec 19, 2006
- QualiTau, Inc.
- Tal Raichman
- G01 - MEASURING TESTING
Information Patent Grant
Automatic range finder for electric current testing
- Patent number 7,098,648
- Issue date Aug 29, 2006
- QualiTau, Inc.
- Gedaliahoo Krieger
- G01 - MEASURING TESTING
Information Patent Grant
Pulsed current generator circuit with charge booster
- Patent number 7,049,713
- Issue date May 23, 2006
- QualiTau, Inc.
- Peter Cuevas
- G01 - MEASURING TESTING
Information Patent Grant
Test socket for packaged semiconductor devices
- Patent number 6,798,228
- Issue date Sep 28, 2004
- QualiTau, Inc.
- Peter Cuevas
- G01 - MEASURING TESTING
Information Patent Grant
High-temperature minimal (zero) insertion force socket
- Patent number 6,592,389
- Issue date Jul 15, 2003
- QualiTau, Inc.
- Peter Cuevas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ZIF socket and actuator for DIP
- Patent number 6,565,373
- Issue date May 20, 2003
- QualiTau, Inc.
- Peter Cuevas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Programmable connector
- Patent number 6,469,494
- Issue date Oct 22, 2002
- Qualitau, Inc.
- Peter P. Cuevas
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional programmable connector
- Patent number 6,150,829
- Issue date Nov 21, 2000
- Qualitau, Inc.
- Peter P. Cuevas
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DRAM WITH SELECTIVE EPITAXIAL CELL TRANSISTOR
- Publication number 20220189961
- Publication date Jun 16, 2022
- Integrated Silicon Solution, (Cayman) Inc.
- Andrew J. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTOR TRANSISTOR WITH METAL REPLACEMENT GATE WORDLINE
- Publication number 20210391386
- Publication date Dec 16, 2021
- SPIN (assignment for benefit of creditors), LLC
- Dafna Beery
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DRAM WITH SELECTIVE EPITAXIAL TRANSISTOR AND BURIED BITLINE
- Publication number 20210305256
- Publication date Sep 30, 2021
- Spin Memory, Inc.
- Andrew J. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DRAM WITH SELECTIVE EPITAXIAL CELL TRANSISTOR
- Publication number 20210233913
- Publication date Jul 29, 2021
- Spin Memory, Inc.
- Andrew J. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTOR TRANSISTOR WITH CONTINUOUSLY VARIABLE CURRENT DRIVE
- Publication number 20210217814
- Publication date Jul 15, 2021
- Spin Memory, Inc.
- Andrew J. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY CELL USING SELECTIVE EPITAXIAL VERTICAL CHANNEL MOS SELECTOR...
- Publication number 20200127052
- Publication date Apr 23, 2020
- Spin Memory, Inc.
- Andrew J. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MODIFIED CURRENT SOURCE (MCS) WITH SEAMLESS RANGE SWITCHING
- Publication number 20100052633
- Publication date Mar 4, 2010
- QUALITAU, INC.
- James BORTHWICK
- G01 - MEASURING TESTING
Information Patent Application
Automatic range finder for electric current testing
- Publication number 20050206367
- Publication date Sep 22, 2005
- QualiTau, Inc.
- Gedaliahoo Krieger
- G01 - MEASURING TESTING
Information Patent Application
Dual channel source measurement unit for semiconductor device testing
- Publication number 20050194963
- Publication date Sep 8, 2005
- QualiTau, Inc.
- Tal Raichman
- G01 - MEASURING TESTING
Information Patent Application
Pulsed current generator circuit with charge booster
- Publication number 20050128655
- Publication date Jun 16, 2005
- QualiTau, Inc.
- Peter Cuevas
- G01 - MEASURING TESTING
Information Patent Application
Test socket for packaged semiconductor devices
- Publication number 20040135592
- Publication date Jul 15, 2004
- QualiTau, Inc.
- Peter Cuevas
- G01 - MEASURING TESTING
Information Patent Application
High-temperature minimal (zero) insertion force socket
- Publication number 20030003791
- Publication date Jan 2, 2003
- QualiTau, Inc.
- Peter Cuevas
- H01 - BASIC ELECTRIC ELEMENTS

Peter P. Cuevas

Person

Patents Grantslast 30 patents

DRAM with selective epitaxial cell transistor

Selector transistor with continuously variable current drive

Selector transistor with metal replacement gate wordline

DRAM with selective epitaxial transistor and buried bitline

DRAM with selective epitaxial cell transistor

Predicting tunnel barrier endurance using redundant memory structures

Modified current source (MCS) with seamless range switching

Electrical connector for semiconductor device test fixture and test...

High temperature open ended zero insertion force (ZIF) test socket

Dual channel source measurement unit for semiconductor device testing

Automatic range finder for electric current testing

Pulsed current generator circuit with charge booster

Test socket for packaged semiconductor devices

High-temperature minimal (zero) insertion force socket

ZIF socket and actuator for DIP

Programmable connector

Three-dimensional programmable connector

Patents Applicationslast 30 patents

DRAM WITH SELECTIVE EPITAXIAL CELL TRANSISTOR

SELECTOR TRANSISTOR WITH METAL REPLACEMENT GATE WORDLINE

DRAM WITH SELECTIVE EPITAXIAL TRANSISTOR AND BURIED BITLINE

DRAM WITH SELECTIVE EPITAXIAL CELL TRANSISTOR

SELECTOR TRANSISTOR WITH CONTINUOUSLY VARIABLE CURRENT DRIVE

MEMORY CELL USING SELECTIVE EPITAXIAL VERTICAL CHANNEL MOS SELECTOR...

MODIFIED CURRENT SOURCE (MCS) WITH SEAMLESS RANGE SWITCHING

Automatic range finder for electric current testing

Dual channel source measurement unit for semiconductor device testing

Pulsed current generator circuit with charge booster

Test socket for packaged semiconductor devices

High-temperature minimal (zero) insertion force socket