Peter Slota, JR.

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Vestal, NY, US

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Patents Applicationslast 30 patents

Information Patent Application
CIRCUIT FOR DETECTING STRUCTURAL DEFECTS IN AN INTEGRATED CIRCUIT C...
- Publication number 20120187953
- Publication date Jul 26, 2012
- International Business Machines Corporation
- Luke D. LACROIX
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PACKAGE USING THROUGH SUBSTRATE VIAS TO GROUND LID
- Publication number 20120074559
- Publication date Mar 29, 2012
- International Business Machines Corporation
- Timothy W. Budell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR TEST CHIP DEVICE TO MIMIC FIELD THERMAL MINI-CYCLES T...
- Publication number 20120049874
- Publication date Mar 1, 2012
- International Business CorporationA
- Luke D. LaCroix
- G01 - MEASURING TESTING