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Peter Van Der Meulen
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Eindhoven, NL
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Patents Grants
last 30 patents
Information
Patent Grant
Magnetic resonance examination system with a user interface
Patent number
10,739,431
Issue date
Aug 11, 2020
Koninklijke Philips N.V.
Paul Augustinus Peter Kaufholz
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance method and device for measuring a periodically v...
Patent number
6,438,404
Issue date
Aug 20, 2002
U.S. Philips Corporation
Johan S. Van Den Brink
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance imaging method with pulse sequence optimization...
Patent number
5,758,646
Issue date
Jun 2, 1998
U.S. Philips Corporation
Peter Van Der Meulen
G01 - MEASURING TESTING
Information
Patent Grant
Eddy current compensation in magnetic resonance imaging
Patent number
5,455,512
Issue date
Oct 3, 1995
U.S. Philips Corporation
Johannes P. Groen
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance imaging method and apparatus employing eddy curr...
Patent number
5,450,010
Issue date
Sep 12, 1995
U.S. Philips Corporation
Peter Van Der Meulen
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for magnetic resonance imaging
Patent number
5,410,249
Issue date
Apr 25, 1995
U.S. Philips Corporation
Gerrit H. Van Yperen
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance device
Patent number
5,359,289
Issue date
Oct 25, 1994
U.S. Philips Corporation
Peter van der Meulen
G01 - MEASURING TESTING
Information
Patent Grant
Method and arrangement for suppressing coherent interferences in ma...
Patent number
4,873,487
Issue date
Oct 10, 1989
U.S. Philips Corp.
Peter Van Der Meulen
G01 - MEASURING TESTING
Information
Patent Grant
Method of reducing MR image artefacts in off-center images
Patent number
4,849,698
Issue date
Jul 18, 1989
U.S. Philips Corporation
Peter Van Der Meulen
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance imaging method, and device for determining the p...
Patent number
4,814,708
Issue date
Mar 21, 1989
U.S. Philips Corporation
Peter Van Der Meulen
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance imaging method utilizing small excitation pulses
Patent number
4,742,301
Issue date
May 3, 1988
U.S. Philips Corporation
Peter van der Meulen
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MAGNETIC RESONANCE EXAMINATION SYSTEM WITH A USER INTERFACE
Publication number
20180356482
Publication date
Dec 13, 2018
PAUL AUGUSTINUS PETER KAUFHOLZ
G01 - MEASURING TESTING
Information
Patent Application
MR IMAGING WITH B1 MAPPING
Publication number
20140070805
Publication date
Mar 13, 2014
Koninklijke Philips N.V.
Peter Van Der Meulen
G01 - MEASURING TESTING
Information
Patent Application
DETERMINATION OF SUSCEPTIBILITY-INDUCED MAGNETIC FIELD GRADIENTS BY...
Publication number
20100002926
Publication date
Jan 7, 2010
Koninklijke Philips Electronics N.V.
Hannes Dahnke
G01 - MEASURING TESTING