Philip Brundage

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Portland, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Protective shutter for charged particle microscope
- Patent number 11,749,496
- Issue date Sep 5, 2023
- FEI Company
- Philip Brundage
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for the planarization of surfaces
- Patent number 10,930,514
- Issue date Feb 23, 2021
- FEI Company
- Philip Brundage
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit probe for charged particle beam system
- Patent number 9,709,600
- Issue date Jul 18, 2017
- FEI Company
- Paul Johannes L. Barends
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PROTECTIVE SHUTTER FOR CHARGED PARTICLE MICROSCOPE
- Publication number 20220406562
- Publication date Dec 22, 2022
- FEI Company
- Philip Brundage
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for the Planarization of Surfaces
- Publication number 20190378689
- Publication date Dec 12, 2019
- FEI Company
- Philip BRUNDAGE
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Circuit Probe for Charged Particle Beam System
- Publication number 20150048815
- Publication date Feb 19, 2015
- FEI Company
- Paul Johannes L. Barends
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Actively Monitoring an Inductively-Coupled...
- Publication number 20130250293
- Publication date Sep 26, 2013
- FEI Company
- Mark W. Utlaut
- H01 - BASIC ELECTRIC ELEMENTS