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Philip R. Brierley
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Madison, WI, US
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last 30 patents
Information
Patent Grant
Diamond anvil spectroscope
Patent number
6,128,075
Issue date
Oct 3, 2000
Pike Technologies of Wisconsin, Inc.
Philip R. Brierley
G01 - MEASURING TESTING
Information
Patent Grant
Imaging stage for fourier transform infrared spectrometer
Patent number
5,965,889
Issue date
Oct 12, 1999
Pike Technologies of Wisconsin, Inc.
Philip R. Brierley
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer spectrometer having tiltable reflector assembly and...
Patent number
5,150,172
Issue date
Sep 22, 1992
Nicolet Instrument Corporation
Philip R. Brierley
G01 - MEASURING TESTING
Information
Patent Grant
Single adjustment specular reflection accessory for spectroscopy
Patent number
5,106,196
Issue date
Apr 21, 1992
Philip R. Brierley
G02 - OPTICS
Information
Patent Grant
Interferometer spectrometer having tiltable reflector assembly and...
Patent number
4,915,502
Issue date
Apr 10, 1990
Nicolet Instrument Corporation
Philip R. Brierley
G01 - MEASURING TESTING
Information
Patent Grant
Optical analytical instrument for testing the transmission and refl...
Patent number
4,786,169
Issue date
Nov 22, 1988
Nicolet Instrument Corporation
Philip R. Brierley
G01 - MEASURING TESTING
Information
Patent Grant
Optical analytical instrument with automatic sample changing
Patent number
4,695,727
Issue date
Sep 22, 1987
Nicolet Instrument Corporation
Philip R. Brierley
G01 - MEASURING TESTING