Philip Schmidt

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Harvester, MO, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of calibrating a semiconductor wafer drying apparatus
- Patent number 6,649,883
- Issue date Nov 18, 2003
- MEMC Electronic Materials, Inc.
- Yoshio Iwamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for cleaning semiconductor wafers
- Patent number 6,318,389
- Issue date Nov 20, 2001
- MEMC Electronic Materials, Inc.
- Philip R. Schmidt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Collector for an automated on-line bath analysis system
- Patent number 6,210,640
- Issue date Apr 3, 2001
- MEMC Electronic Materials, Inc.
- Kenneth A. Ruth
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of calibrating a semiconductor wafer drying apparatus
- Publication number 20020148826
- Publication date Oct 17, 2002
- Yoshio Iwamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Process for collecting and analyzing the content of a liquid in an...
- Publication number 20010000334
- Publication date Apr 19, 2001
- Kenneth Ruth
- G01 - MEASURING TESTING
Information Patent Application
Process for collecting and analyzing the content of a liquid in an...
- Publication number 20010000322
- Publication date Apr 19, 2001
- Kenneth Ruth
- G01 - MEASURING TESTING