Piotr Szwaykowski

Person

Glendale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Extending the range of spectrally controlled interferometry by supe...
- Patent number 11,385,044
- Issue date Jul 12, 2022
- APRE INSTRUMENTS, INC.
- Piotr Szwaykowski
- G01 - MEASURING TESTING
Information Patent Grant
Extending the range of spectrally controlled interferometry by supe...
- Patent number 10,641,599
- Issue date May 5, 2020
- APRE INSTRUMENTS, LLC
- Piotr Szwaykowski
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric non-contact optical probe and measurement
- Patent number 9,581,437
- Issue date Feb 28, 2017
- APRE INSTRUMENTS, LLC
- Robert Smythe
- G01 - MEASURING TESTING
Information Patent Grant
Methods for determining error in an interferometry system
- Patent number 9,534,883
- Issue date Jan 3, 2017
- Piotr Szwaykowski
- G01 - MEASURING TESTING
Information Patent Grant
Computer generated reference for measurements of aspheric surfaces
- Patent number 8,482,740
- Issue date Jul 9, 2013
- Engineering Synthesis Design, Inc.
- Piotr Szwaykowski
- G01 - MEASURING TESTING
Information Patent Grant
White light scanning interferometer with simultaneous phase-shiftin...
- Patent number 8,269,980
- Issue date Sep 18, 2012
- Engineering Synthesis Design, Inc.
- Piotr Szwaykowski
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric system with reduced vibration sensitivity and relat...
- Patent number 8,004,687
- Issue date Aug 23, 2011
- Trology, LLC
- Piotr Szwaykowski
- G01 - MEASURING TESTING
Information Patent Grant
Scanning simultaneous phase-shifting interferometer
- Patent number 7,561,279
- Issue date Jul 14, 2009
- Engineering Synthesis Design, Inc.
- Raymond Castonguay
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous phase shifting module for use in interferometry
- Patent number 7,483,145
- Issue date Jan 27, 2009
- Trology, LLC
- Piotr Szwaykowski
- G01 - MEASURING TESTING
Information Patent Grant
Common path, interferometric systems and methods using a birefringe...
- Patent number 5,973,784
- Issue date Oct 26, 1999
- Electro-Optical Sciences, Inc.
- Piotr Szwaykowski
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
EXTENDING THE RANGE OF SPECTRALLY CONTROLLED INTERFEROMETRY BY SUPE...
- Publication number 20200240764
- Publication date Jul 30, 2020
- APRE INSTRUMENTS, LLC
- PIOTR SZWAYKOWSKI
- G01 - MEASURING TESTING
Information Patent Application
EXTENDING THE RANGE OF SPECTRALLY CONTROLLED INTERFEROMETRY BY SUPE...
- Publication number 20180149463
- Publication date May 31, 2018
- APRE INSTRUMENTS, LLC
- PIOTR SZWAYKOWSKI
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC NON-CONTACT OPTICAL PROBE AND MEASUREMENT
- Publication number 20160091299
- Publication date Mar 31, 2016
- ROBERT SMYTHE
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC SYSTEM WITH REDUCED VIBRATION SENSITIVITY AND RELAT...
- Publication number 20120026507
- Publication date Feb 2, 2012
- Piotr Szwaykowski
- G01 - MEASURING TESTING
Information Patent Application
SCANNING SIMULTANEOUS PHASE-SHIFTING INTERFEROMETER
- Publication number 20080043224
- Publication date Feb 21, 2008
- Raymond Castonguay
- G01 - MEASURING TESTING
Information Patent Application
Simultaneous phase shifting module for use in interferometry
- Publication number 20060146340
- Publication date Jul 6, 2006
- Piotr Szwaykowski
- G01 - MEASURING TESTING
Information Patent Application
Interferometric system with reduced vibration sensitivity and reala...
- Publication number 20060146341
- Publication date Jul 6, 2006
- Piotr Szwaykowski
- G01 - MEASURING TESTING

Piotr Szwaykowski

Person

Patents Grantslast 30 patents

Extending the range of spectrally controlled interferometry by supe...

Extending the range of spectrally controlled interferometry by supe...

Interferometric non-contact optical probe and measurement

Methods for determining error in an interferometry system

Computer generated reference for measurements of aspheric surfaces

White light scanning interferometer with simultaneous phase-shiftin...

Interferometric system with reduced vibration sensitivity and relat...

Scanning simultaneous phase-shifting interferometer

Simultaneous phase shifting module for use in interferometry

Common path, interferometric systems and methods using a birefringe...

Patents Applicationslast 30 patents

EXTENDING THE RANGE OF SPECTRALLY CONTROLLED INTERFEROMETRY BY SUPE...

EXTENDING THE RANGE OF SPECTRALLY CONTROLLED INTERFEROMETRY BY SUPE...

INTERFEROMETRIC NON-CONTACT OPTICAL PROBE AND MEASUREMENT

INTERFEROMETRIC SYSTEM WITH REDUCED VIBRATION SENSITIVITY AND RELAT...

SCANNING SIMULTANEOUS PHASE-SHIFTING INTERFEROMETER

Simultaneous phase shifting module for use in interferometry

Interferometric system with reduced vibration sensitivity and reala...