SCANNING SIMULTANEOUS PHASE-SHIFTING INTERFEROMETER

Abstract
An optical measuring apparatus for comprising, in combination, a polarization type interferometer including a polarization type beam splitter in which a polarized beam of light is split into orthogonally polarized reference and test beams, an array of detectors arranged in a line for creating a plurality of phase shifting interferograms, and a scanning device for moving the object in a direction perpendicular to a long axis of the detectors.
Description

BRIEF DESCRIPTION OF THE DRAWINGS

Further features and advantages of the invention will be seen from the following detailed description, taken in conjunction with the accompanying drawings, wherein like numerals depict like parts, and wherein



FIG. 1 is an example of interferogram showing interference patterns;



FIG. 2 is a plan view of a first embodiment of the invention; and



FIG. 3 is a plan view of an alternative embodiment of the invention.





DETAILED DESCRIPTION OF PREFERRED EMBODIMENT

In the preferred embodiment, a polarization version of Twyman-Green interferometer shown in FIG. 2 is adopted as a simultaneous phase shifting interferometer. A linearly polarized beam of light 12 from a coherent source 10 is expanded and collimated. The source 10 can be a laser, light emitting diode (LED), or a white light source. This beam is then directed towards a polarization type beam splitter 30 where it is split into a reference beam and a test beam. After passing through the beam splitter 30 both beams are mutually orthogonally polarized. Both beams then pass through quarter-wave plates 40a and 40b oriented in such a way that the polarizations of both beams are changed to circular. The reference beam is directed towards a reference surface 50 from which it reflects and propagates back through the quarter-wave plate 40a and the beam splitter into the interferometer. The test beam reflects from the measured surface 60 and returns into the interferometer through the quarter-wave plate 40b and the beam splitter 30.


After passing two times through the quarter-wave plates, both beams are linearly polarized with polarization direction rotated 900 with respect to the polarization direction of the illuminating beams and remain orthogonally polarized to each other. An imaging system 70 creates a sharp image of measured surface 60 on the set of linear detectors 100. Both test and reference beams are split equally into multiple channels 71 by a non-polarizing beam splitter 70 located between the imaging element and the set of linear detectors 100. A combination of polarization elements 80 and 90 in front of each linear detector 100 introduces predetermined phase shifts, which are different for each of those detectors, so that the phase of the interfering beams can be calculated using the principle of phase shifting. Data acquisition into a computer from the set of linear detectors 100 are synchronized together, so that multiple interferograms are collected at the same instance, which makes the measurement significantly insensitive to vibrations.


A measured object 60 is mounted on a linear scanner 110 that is capable of moving the object in a direction perpendicular to the long axis of the of the linear detector arrays. Alternatively, as shown in FIG. 3, the linear scanner 110 may be attached to the interferometer 120 instead of the measurement object 60. In either case, the scanning speed is synchronized with the rate of data collection from the linear detectors and the measurement of the entire surface can be constructed by combining the consecutive measurements into a single surface map using a line-by-line reconstruction procedure.


Exposure time for collecting a single line of data can be very short—typically few tens of microseconds—and the data transfer rate ranges from 1 to 100 MPixels/s. This allows for scanning speeds from 2.5 to 250 mm/s assuming a typical size of a linear CCD detector of 4000 pixels and pixel size of 10×10 um. As a result an area of 200×200 mm. could be measured in between 4 and 400 s.


Various changes may be made in the invention without departing from the scope thereof. By way of example, the polarization version of the Twyman-Green interferometer can be replaced by any other interferometer in which reference and test beams are mutually orthogonally polarized. Also other devices capable of beam splitting for producing orthogonally polarized beams (such as polarization type cube or plate beam-splitters, Wollaston or Rochon prism, polarization beam displacer, combination of polarizers, etc) can be used instead of a typical polarization type beam splitter to obtain orthogonally polarized beams in any type of the interferometer.


And, the CCD imaging detector can be any device capable of producing a multitude of phase-shifted interferograms simultaneously. In particular the detector could be an arrangement of multiple linear detector arrays. The detector also could be a module composed of independent detector arrays, or a two-dimensional detector array where each row of the array is treated as a linear detector, or a two-dimensional detector array where each 2×2 set of pixels are composed of polarization optics for phase-shifting.

Claims
  • 1. An optical measuring apparatus for comprising, in combination: a polarization type interferometer including a polarization type beam splitter in which a polarized beam of light is split into orthogonally polarized reference and test beams;an array of detectors arranged in a line for creating a plurality of phase shifting interferograms; anda scanning device for moving the object in a direction perpendicular to a long axis of the detectors.
  • 2. The apparatus of claim 1, wherein the detectors comprise pixilated detectors.
  • 3. The apparatus of claim 1, wherein the interferometer is a Twyman-Green polarization interferometer.
  • 4. The apparatus of claim 1, wherein the interferometer is a Fizeau polarization interferometer.
  • 5. The apparatus of claim 2, wherein the pixilated detectors comprise linear CCD detectors.
  • 6. The apparatus of claim 2, wherein the pixilated detectors comprise an array of three linear detectors.
  • 7. The measuring apparatus of claim 1, wherein test and reference beams from an output of the interferometer are split into three channels and projected independently on the three linear detectors.
  • 8. The apparatus of claim 1, wherein an arrangement of optical elements is provided to introduce known and different values of phase shifts between said test and reference beams for each of the channels.
  • 9. The measuring apparatus of claim 1, wherein the moving stage is a linear translation stage.
  • 10. The apparatus of claim 9, wherein rate of motion of the translation stage is synchronized with a rate of data collection.
  • 11. The apparatus of claim 10, wherein phase information obtained from said linear detectors are combined together to create a 3D map of the measured surface.
  • 12. The apparatus of claim 10, wherein phase information is collected by a computer and a 3D map is constructed using the computer.
  • 13. An optical measuring apparatus for comprising, in combination: a polarization type interferometer including a polarization type beam splitter in which a polarized beam of light is split into orthogonally polarized reference and test beams;an array of detectors arranged in a row for creating a plurality of phase shifting interferograms; anda scanning device attached to the interferometer for moving the interferometer in a direction perpendicular to a long axis of the detectors.
  • 14. The apparatus of claim 13, wherein the detectors comprise pixilated detectors.
  • 15. The apparatus of claim 13, wherein the interferometer is a Twyman-Green polarization interferometer.
  • 16. The apparatus of claim 13, wherein the interferometer is a Fizeau polarization interferometer.
  • 17. The apparatus of claim 14, wherein the pixilated detectors comprise linear CCD detectors.
  • 18. The apparatus of claim 14, wherein the pixilated detectors comprise an array of three linear detectors.
  • 19. The measuring apparatus of claim 13, wherein test and reference beams from an output of the interferometer are split into three channels and projected independently on the three linear detectors.
  • 20. The apparatus such of claim 13, wherein an arrangement of optical elements is provided to introduce known and different values of phase shifts between said test and reference beams for each of the channels.
  • 21. The measuring apparatus of claim 13, wherein the moving stage is a linear translation-stage.
  • 22. The apparatus of claim 21, wherein rate of motion of the translation stage is synchronized with a rate of data collection.
  • 23. The apparatus of claim 22, wherein phase information obtained from said linear detectors are combined together to create a 3D map of the measured surface.
  • 24. The apparatus of claim 22, wherein phase information is collected by a computer and a 3D map is constructed using the computer.
CROSS REFERENCE TO RELATED APPLICATION

This application claims priority from U.S. Provisional Application Ser. No. 60/817,276, filed Jun. 29, 2006, the contents of which are incorporated herein by reference.

Provisional Applications (1)
Number Date Country
60817276 Jun 2006 US