Pradeep Pandey

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for monolayer deposition (MLD)
- Patent number 7,838,072
- Issue date Nov 23, 2010
- Tokyo Electron Limited
- Sanjeev Kaushal
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for creating a built-in self test (BIST) table for monitorin...
- Patent number 7,526,699
- Issue date Apr 28, 2009
- Tokyo Electron Limited
- Sanjeev Kaushal
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Monitoring a monolayer deposition (MLD) system using a built-in sel...
- Patent number 7,519,885
- Issue date Apr 14, 2009
- Tokyo Electron Limited
- Sanjeev Kaushal
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for monolayer deposition
- Patent number 7,459,175
- Issue date Dec 2, 2008
- Tokyo Electron Limited
- Sanjeev Kaushal
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Wafer curvature estimation, monitoring, and compensation
- Patent number 7,452,793
- Issue date Nov 18, 2008
- Tokyo Electron Limited
- Sanjeev Kaushal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Built-in self test for a thermal processing system
- Patent number 7,444,572
- Issue date Oct 28, 2008
- Tokyo Electron Limited
- Sanjeev Kaushal
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Monitoring a thermal processing system
- Patent number 7,406,644
- Issue date Jul 29, 2008
- Tokyo Electron Limited
- Sanjeev Kaushal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monitoring a single-wafer processing system
- Patent number 7,340,377
- Issue date Mar 4, 2008
- Tokyo Electron Limited
- Sanjeev Kaushal
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Monitoring a system during low-pressure processes
- Patent number 7,302,363
- Issue date Nov 27, 2007
- Tokyo Electron Limited
- Sanjeev Kaushal
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Built-in self test for a thermal processing system
- Patent number 7,165,011
- Issue date Jan 16, 2007
- Tokyo Electron Limited
- Sanjeev Kaushal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Media flow method for transferring real-time data between asynchron...
- Patent number 7,126,957
- Issue date Oct 24, 2006
- UTStarcom, Inc.
- Sridhar G. Sharma Isukapalli
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Methods for adaptive real time control of a thermal processing system
- Patent number 7,101,816
- Issue date Sep 5, 2006
- Tokyo Electron Limited
- Sanjeev Kaushal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adaptive real time control of a reticle/mask system
- Patent number 7,025,280
- Issue date Apr 11, 2006
- Tokyo Electron Limited
- Sanjeev Kaushal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Batch-type heat treatment apparatus and control method for the batc...
- Patent number 6,803,548
- Issue date Oct 12, 2004
- Tokyo Electron Limited
- Wenling Wang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Batch type heat treatment system, method for controlling same, and...
- Patent number 6,730,885
- Issue date May 4, 2004
- Tokyo Electron Limited
- Fujio Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduction of switching transients via large signal/small signal thr...
- Patent number 6,452,291
- Issue date Sep 17, 2002
- Voyan Technology
- Mark Erickson
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Method for computer-aided design of a product or process
- Patent number 6,289,255
- Issue date Sep 11, 2001
- Voyan Technology
- Sunil C. Shah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for dynamic optimization
- Patent number 6,289,508
- Issue date Sep 11, 2001
- Voyan Technology
- Mark A. Erickson
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for real-time nonlinear system state estimation and control
- Patent number 6,285,971
- Issue date Sep 4, 2001
- Voyan Technology
- Sunil C. Shah
- G05 - CONTROLLING REGULATING
Information Patent Grant
Real-time planner for design
- Patent number 6,195,594
- Issue date Feb 27, 2001
- Voyan Technology
- Sunil C. Shah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for dynamic optimization
- Patent number 6,167,360
- Issue date Dec 26, 2000
- Voyan Technology
- Mark A. Erickson
- G05 - CONTROLLING REGULATING
Information Patent Grant
Multiple scale signal processing and control system
- Patent number 6,041,172
- Issue date Mar 21, 2000
- Voyan Technology
- Sunil C. Shah
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for real-time nonlinear system state estimation and control
- Patent number 5,991,525
- Issue date Nov 23, 1999
- Voyan Technology
- Sunil C. Shah
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for computer-aided design of a product or process
- Patent number 5,880,959
- Issue date Mar 9, 1999
- Voyan Technology
- Sunil C. Shah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thermal reactor optimization
- Patent number 5,517,594
- Issue date May 14, 1996
- Relman, Inc.
- Sunil C. Shah
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR CREATING A BUILT-IN SELF TEST (BIST) TABLE FOR MONITORIN...
- Publication number 20070259285
- Publication date Nov 8, 2007
- TOKYO ELECTRON LIMITED
- Sanjeev Kaushal
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
MONITORING A THERMAL PROCESSING SYSTEM
- Publication number 20070255991
- Publication date Nov 1, 2007
- TOKYO ELECTRON LIMITED
- Sanjeev Kaushal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MONITORING A SYSTEM DURING LOW-PRESSURE PROCESSES
- Publication number 20070239375
- Publication date Oct 11, 2007
- TOKYO ELECTRON LIMITED
- Sanjeev Kaushal
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
MONITORING A MONOLAYER DEPOSITION (MLD) SYSTEM USING A BUILT-IN SEL...
- Publication number 20070234953
- Publication date Oct 11, 2007
- TOKYO ELECTRON LIMITED
- Sanjeev Kaushal
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
MONITORING A SINGLE-WAFER PROCESSING SYSTEM
- Publication number 20070233427
- Publication date Oct 4, 2007
- TOKYO ELECTRON LIMITED
- Sanjeev Kaushal
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Built-in self test for a thermal processing system
- Publication number 20070061652
- Publication date Mar 15, 2007
- Tokyo Electron Limited, TBS Broadcast Center
- Sanjeev Kaushal
- G05 - CONTROLLING REGULATING
Information Patent Application
Wafer curvature estimation, monitoring, and compensation
- Publication number 20060241891
- Publication date Oct 26, 2006
- TOKYO ELECTRON LIMITED
- Sanjeev Kaushal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for monolayer deposition
- Publication number 20060166501
- Publication date Jul 27, 2006
- TOKYO ELECTRON LIMITED
- Sanjeev Kaushal
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Method and apparatus for monolayer deposition (MLD)
- Publication number 20060165890
- Publication date Jul 27, 2006
- TOKYO ELECTRON LIMITED
- Sanjeev Kaushal
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Adaptive real time control of a reticle/mask system
- Publication number 20050167514
- Publication date Aug 4, 2005
- Sanjeev Kaushal
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods for adaptive real time control of a thermal processing system
- Publication number 20050149886
- Publication date Jul 7, 2005
- TOKYO ELECTRON LIMITED
- Sanjeev Kaushal
- H01 - BASIC ELECTRIC ELEMENTS

Pradeep Pandey

Person

Patents Grantslast 30 patents

Method and apparatus for monolayer deposition (MLD)

Method for creating a built-in self test (BIST) table for monitorin...

Monitoring a monolayer deposition (MLD) system using a built-in sel...

Method for monolayer deposition

Wafer curvature estimation, monitoring, and compensation

Built-in self test for a thermal processing system

Monitoring a thermal processing system

Monitoring a single-wafer processing system

Monitoring a system during low-pressure processes

Built-in self test for a thermal processing system

Media flow method for transferring real-time data between asynchron...

Methods for adaptive real time control of a thermal processing system

Adaptive real time control of a reticle/mask system

Batch-type heat treatment apparatus and control method for the batc...

Batch type heat treatment system, method for controlling same, and...

Reduction of switching transients via large signal/small signal thr...

Method for computer-aided design of a product or process

Method and apparatus for dynamic optimization

Method for real-time nonlinear system state estimation and control

Real-time planner for design

Method and apparatus for dynamic optimization

Multiple scale signal processing and control system

Method for real-time nonlinear system state estimation and control

Method for computer-aided design of a product or process

Thermal reactor optimization

Patents Applicationslast 30 patents

METHOD FOR CREATING A BUILT-IN SELF TEST (BIST) TABLE FOR MONITORIN...

MONITORING A THERMAL PROCESSING SYSTEM

MONITORING A SYSTEM DURING LOW-PRESSURE PROCESSES

MONITORING A MONOLAYER DEPOSITION (MLD) SYSTEM USING A BUILT-IN SEL...

MONITORING A SINGLE-WAFER PROCESSING SYSTEM

Built-in self test for a thermal processing system

Wafer curvature estimation, monitoring, and compensation

Method and apparatus for monolayer deposition

Method and apparatus for monolayer deposition (MLD)

Adaptive real time control of a reticle/mask system

Methods for adaptive real time control of a thermal processing system