Premachandran CHIRAYARIKATHUVEEDU

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Clifton Park, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for quantifying defects due to through silicon...
- Patent number 9,335,368
- Issue date May 10, 2016
- GLOBALFOUNDRIES Inc.
- Luigi Pantisano
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
OVERHANG MODEL FOR REDUCING PASSIVATION STRESS AND METHOD FOR PRODU...
- Publication number 20190273051
- Publication date Sep 5, 2019
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Aarthi SRIDHARAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MITIGATING TRANSIENT TSV-INDUCED IC SUBSTRATE NOISE AND RESULTING D...
- Publication number 20170033061
- Publication date Feb 2, 2017
- GLOBALFOUNDRIES INC.
- Mohamed RABIE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR QUANTIFYING DEFECTS DUE TO THROUGH SILICON...
- Publication number 20160116526
- Publication date Apr 28, 2016
- GLOBAL FOUNDRIES Inc.
- Luigi PANTISANO
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE AND METHOD OF CANCELLING TSV-INDUCED SUBSTRATE STRESS
- Publication number 20150228555
- Publication date Aug 13, 2015
- GLOBALFOUNDRIES INC.
- Mohamed A. RABIE
- H01 - BASIC ELECTRIC ELEMENTS