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R. Shawn Blanton
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Sewickley, PA, US
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last 30 patents
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Patent Grant
System and method to test integrated circuits on a wafer
Patent number
7,325,180
Issue date
Jan 29, 2008
Carnegie Mellon University
Lawrence Pileggi
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
SYSTEM AND METHOD TO TEST INTEGRATED CIRCUITS ON A WAFER
Publication number
20050138499
Publication date
Jun 23, 2005
Lawrence Pileggi
G01 - MEASURING TESTING
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Patent Application
Built-in self test of MEMS
Publication number
20040113647
Publication date
Jun 17, 2004
Nilmoni Deb
B81 - MICRO-STRUCTURAL TECHNOLOGY