Raffi Garabedian

Person

Monrovia, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Probe head with machine mounting pads and method of forming same
- Patent number 8,232,816
- Issue date Jul 31, 2012
- Advantest America, Inc.
- Salleh Ismail
- G01 - MEASURING TESTING
Information Patent Grant
Post and tip design for a probe contact
- Patent number 7,922,888
- Issue date Apr 12, 2011
- Touchdown Technologies, Inc.
- Salleh Ismail
- G01 - MEASURING TESTING
Information Patent Grant
Method for repairing a microelectromechanical system
- Patent number 7,761,966
- Issue date Jul 27, 2010
- Touchdown Technologies, Inc.
- Lakshmikanth Namburi
- G01 - MEASURING TESTING
Information Patent Grant
Method of forming probe card assembly
- Patent number 7,759,952
- Issue date Jul 20, 2010
- Touchdown Technologies, Inc.
- Raffi Garabedian
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly and method of forming same
- Patent number 7,728,612
- Issue date Jun 1, 2010
- Touchdown Technologies, Inc.
- Raffi Garabedian
- G01 - MEASURING TESTING
Information Patent Grant
Torsion spring probe contactor design
- Patent number 7,724,010
- Issue date May 25, 2010
- Touchdown Technologies, Inc.
- Melvin Khoo
- G01 - MEASURING TESTING
Information Patent Grant
Probe card substrate with bonded via
- Patent number 7,692,436
- Issue date Apr 6, 2010
- Touchdown Technologies, Inc.
- Raffi Garabedian
- G01 - MEASURING TESTING
Information Patent Grant
Distributive optical switching control system
- Patent number 7,437,071
- Issue date Oct 14, 2008
- Cisco Technology, Inc.
- Sudharshan Bhat
- G02 - OPTICS
Information Patent Grant
Probe card assembly
- Patent number 7,365,553
- Issue date Apr 29, 2008
- Touchdown Technologies, Inc.
- Raffi Garabedian
- G01 - MEASURING TESTING
Information Patent Grant
Torsion spring probe contactor design
- Patent number 7,362,119
- Issue date Apr 22, 2008
- Touchdown Technologies, Inc.
- Melvin Khoo
- G01 - MEASURING TESTING
Information Patent Grant
Process for forming microstructures
- Patent number 7,271,022
- Issue date Sep 18, 2007
- Touchdown Technologies, Inc.
- Weilong Tang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Process for forming MEMS
- Patent number 7,264,984
- Issue date Sep 4, 2007
- Touchdown Technologies, Inc.
- Raffi Garabedian
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Post and tip design for a probe contact
- Patent number 7,245,135
- Issue date Jul 17, 2007
- Touchdown Technologies, Inc.
- Salleh Ismail
- G01 - MEASURING TESTING
Information Patent Grant
Probe head with machined mounting pads and method of forming same
- Patent number 7,180,316
- Issue date Feb 20, 2007
- Touchdown Technologies, Inc.
- Salleh Ismail
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD SUBSTRATE WITH BONDED VIA
- Publication number 20100308854
- Publication date Dec 9, 2010
- TOUCHDOWN TECHNOLOGIES, INC.
- Raffi Garabedian
- G01 - MEASURING TESTING
Information Patent Application
Probe card substrate with bonded via
- Publication number 20090237099
- Publication date Sep 24, 2009
- TOUCHDOWN TECHNOLOGIES, INC.
- Raffi Garabedian
- G01 - MEASURING TESTING
Information Patent Application
PLANARIZING PROBE CARD
- Publication number 20090146675
- Publication date Jun 11, 2009
- TOUCHDOWN TECHNOLOGIES, INC.
- Ken Karklin
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR REPARING A MICROELECTROMECHANICAL SYSTEM
- Publication number 20090021277
- Publication date Jan 22, 2009
- TOUCHDOWN TECHNOLOGIES, INC.
- Lakshmikanth Namburi
- G01 - MEASURING TESTING
Information Patent Application
SEMICODUCTOR TESTING DEVICE WITH ELASTOMER INTERPOSER
- Publication number 20080297182
- Publication date Dec 4, 2008
- TOUCHDOWN TECHNOLOGIES, INC.
- Ken Karklin
- G01 - MEASURING TESTING
Information Patent Application
Probe card assembly and method of forming same
- Publication number 20080211525
- Publication date Sep 4, 2008
- TOUCHDOWN TECHNOLOGIES, INC.
- Raffi Garabedian
- G01 - MEASURING TESTING
Information Patent Application
Torsion spring probe contactor design
- Publication number 20080106289
- Publication date May 8, 2008
- TOUCHDOWN TECHNOLOGIES, INC.
- Melvin Khoo
- G01 - MEASURING TESTING
Information Patent Application
Method of forming probe card assembly
- Publication number 20080007281
- Publication date Jan 10, 2008
- TOUCHDOWN TECHNOLOGIES, INC.
- Raffi Garabedian
- G01 - MEASURING TESTING
Information Patent Application
Post and tip design for a probe contact
- Publication number 20070240306
- Publication date Oct 18, 2007
- TOUCHDOWN TECHNOLOGIES., INC.
- Salleh Ismail
- G01 - MEASURING TESTING
Information Patent Application
Probe head with machine mounting pads and method of forming same
- Publication number 20070182430
- Publication date Aug 9, 2007
- TOUCHDOWN TECHNOLOGIES, INC.
- Salleh Ismail
- G01 - MEASURING TESTING
Information Patent Application
Probe card assembly
- Publication number 20070145988
- Publication date Jun 28, 2007
- TOUCHDOWN TECHNOLOGIES, INC.
- Raffi Garabedian
- G01 - MEASURING TESTING
Information Patent Application
Lateral interposer contact design and probe card assembly
- Publication number 20070075717
- Publication date Apr 5, 2007
- TOUCHDOWN TECHNOLOGIES, INC.
- David Kinghorn
- G01 - MEASURING TESTING
Information Patent Application
Lateral interposer contact design and probe card assembly
- Publication number 20070057685
- Publication date Mar 15, 2007
- TOUCHDOWN TECHNOLOGIES, INC.
- Raffi Garabedian
- G01 - MEASURING TESTING
Information Patent Application
Post and tip design for a probe contact
- Publication number 20070024297
- Publication date Feb 1, 2007
- TOUCHDOWN TECHNOLOGIES, INC.
- Salleh Ismail
- G01 - MEASURING TESTING
Information Patent Application
Torsion spring probe contactor design
- Publication number 20070024298
- Publication date Feb 1, 2007
- TOUCHDOWN TECHNOLOGIES, INC.
- Melvin Khoo
- G01 - MEASURING TESTING
Information Patent Application
Process for forming microstructures
- Publication number 20060134820
- Publication date Jun 22, 2006
- TOUCHDOWN TECHNOLOGIES, INC.
- Weilong Tang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Process for forming MEMS
- Publication number 20060134819
- Publication date Jun 22, 2006
- Integrated Micromachines, Inc.
- Weilong Tang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Distributive optical switching control system
- Publication number 20020176648
- Publication date Nov 28, 2002
- Sudharshan Bhat
- G02 - OPTICS

Raffi Garabedian

Person

Patents Grantslast 30 patents

Probe head with machine mounting pads and method of forming same

Post and tip design for a probe contact

Method for repairing a microelectromechanical system

Method of forming probe card assembly

Probe card assembly and method of forming same

Torsion spring probe contactor design

Probe card substrate with bonded via

Distributive optical switching control system

Probe card assembly

Torsion spring probe contactor design

Process for forming microstructures

Process for forming MEMS

Post and tip design for a probe contact

Probe head with machined mounting pads and method of forming same

Patents Applicationslast 30 patents

PROBE CARD SUBSTRATE WITH BONDED VIA

Probe card substrate with bonded via

PLANARIZING PROBE CARD

DEVICE AND METHOD FOR REPARING A MICROELECTROMECHANICAL SYSTEM

SEMICODUCTOR TESTING DEVICE WITH ELASTOMER INTERPOSER

Probe card assembly and method of forming same

Torsion spring probe contactor design

Method of forming probe card assembly

Post and tip design for a probe contact

Probe head with machine mounting pads and method of forming same

Probe card assembly

Lateral interposer contact design and probe card assembly

Lateral interposer contact design and probe card assembly

Post and tip design for a probe contact

Torsion spring probe contactor design

Process for forming microstructures

Process for forming MEMS

Distributive optical switching control system