Membership
Tour
Register
Log in
Raghav Babulnath
Follow
Person
San Jose, CA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Inspection for multiple process steps in a single inspection process
Patent number
10,712,289
Issue date
Jul 14, 2020
KLA-Tencor Corp.
Oksen Toros Baris
G01 - MEASURING TESTING
Information
Patent Grant
Creating defect samples for array regions
Patent number
10,620,134
Issue date
Apr 14, 2020
KLA-Tencor Corp.
Vidyasagar Anantha
G01 - MEASURING TESTING
Information
Patent Grant
Defect detection and classification based on attributes determined...
Patent number
10,127,652
Issue date
Nov 13, 2018
KLA-Tencor Corp.
Lisheng Gao
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Sub-pixel alignment of inspection to design
Patent number
9,996,942
Issue date
Jun 12, 2018
KLA-Tencor Corp.
Santosh Bhattacharyya
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Dynamic design attributes for wafer inspection
Patent number
9,865,512
Issue date
Jan 9, 2018
KLA-Tencor Corp.
Thirupurasundari Jayaraman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Adaptive nuisance filter
Patent number
9,835,566
Issue date
Dec 5, 2017
KLA-Tencor Corp.
Ardis Liang
G01 - MEASURING TESTING
Information
Patent Grant
Repeater detection
Patent number
9,766,187
Issue date
Sep 19, 2017
KLA-Tencor Corp.
Hong Chen
G01 - MEASURING TESTING
Information
Patent Grant
Based sampling and binning for yield critical defects
Patent number
9,563,943
Issue date
Feb 7, 2017
KLA-Tencor Corp.
Satya Kurada
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Based sampling and binning for yield critical defects
Patent number
9,310,320
Issue date
Apr 12, 2016
KLA-Tencor Corp.
Satya Kurada
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Creating Defect Samples for Array Regions
Publication number
20190346375
Publication date
Nov 14, 2019
KLA-Tencor Corporation
Vidyasagar Anantha
G01 - MEASURING TESTING
Information
Patent Application
Design Based Sampling and Binning for Yield Critical Defects
Publication number
20170103517
Publication date
Apr 13, 2017
KLA-Tencor Corporation
Satya Kurada
G01 - MEASURING TESTING
Information
Patent Application
Sub-Pixel Alignment of Inspection to Design
Publication number
20160275672
Publication date
Sep 22, 2016
KLA-Tencor Corporation
Santosh Bhattacharyya
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Adaptive Nuisance Filter
Publication number
20160258879
Publication date
Sep 8, 2016
KLA-Tencor Corporation
Ardis Liang
G01 - MEASURING TESTING
Information
Patent Application
Design Based Sampling and Binning for Yield Critical Defects
Publication number
20160225138
Publication date
Aug 4, 2016
KLA-Tencor Corporation
Satya Kurada
G01 - MEASURING TESTING
Information
Patent Application
Repeater Detection
Publication number
20160061745
Publication date
Mar 3, 2016
KLA-Tencor Corporation
Hong Chen
G01 - MEASURING TESTING
Information
Patent Application
Inspection for Multiple Process Steps in a Single Inspection Process
Publication number
20160033420
Publication date
Feb 4, 2016
KLA-Tencor Corporation
Oksen Toros Baris
G01 - MEASURING TESTING
Information
Patent Application
DEFECT DETECTION AND CLASSIFICATION BASED ON ATTRIBUTES DETERMINED...
Publication number
20150221076
Publication date
Aug 6, 2015
KLA-Tencor Corporation
Lisheng Gao
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Detecting IC Reliability Defects
Publication number
20150120220
Publication date
Apr 30, 2015
KLA-Tencor Corporation
Joanne Wu
G01 - MEASURING TESTING
Information
Patent Application
Design Based Sampling and Binning for Yield Critical Defects
Publication number
20140307947
Publication date
Oct 16, 2014
KLA-Tencor Corporation
Satya Kurada
G01 - MEASURING TESTING
Information
Patent Application
DYNAMIC DESIGN ATTRIBUTES FOR WAFER INSPECTION
Publication number
20140303921
Publication date
Oct 9, 2014
KLA-Tencor Corporation
Thirupurasundari Jayaraman
H01 - BASIC ELECTRIC ELEMENTS