Rainer Becker

Person

Pfungstadt, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and devices for extending a time period until changing a me...
- Patent number 11,977,097
- Issue date May 7, 2024
- Carl Zeiss SMT GmbH
- Gabriel Baralia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and devices for extending a time period until changing a me...
- Patent number 11,353,478
- Issue date Jun 7, 2022
- Carl Zeiss SMT GmbH
- Gabriel Baralia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for electron beam induced etching
- Patent number 9,023,666
- Issue date May 5, 2015
- Carl Zeiss SMS GmbH
- Nicole Auth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for electron beam induced etching of layers contaminated wit...
- Patent number 8,632,687
- Issue date Jan 21, 2014
- Carl Zeiss SMS GmbH
- Nicole Auth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for removing a material from a sample
- Patent number 8,623,230
- Issue date Jan 7, 2014
- Carl Zeiss SMS GmbH
- Nicole Auth
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for electron beam induced deposition of conductive material
- Patent number 8,318,593
- Issue date Nov 27, 2012
- Carl Zeiss SMS GmbH
- Nicole Auth
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus and method for investigating and/or modifying a sample
- Patent number 8,247,782
- Issue date Aug 21, 2012
- Carl Zeiss SMS GmbH
- Klaus Edinger
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...
- Publication number 20240272198
- Publication date Aug 15, 2024
- Carl Zeiss SMT GMBH
- Gabriel Baralia
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...
- Publication number 20220291255
- Publication date Sep 15, 2022
- Carl Zeiss SMT GMBH
- Gabriel Baralia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...
- Publication number 20190317126
- Publication date Oct 17, 2019
- Carl Zeiss SMT GMBH
- Gabriel Baralia
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INVESTIGATING AND/OR MODIFYING A SAMPLE
- Publication number 20110210181
- Publication date Sep 1, 2011
- CARL ZEISS SMS GMBH
- Klaus Edinger
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD FOR ELECTRON BEAM INDUCED ETCHING
- Publication number 20110183444
- Publication date Jul 28, 2011
- CARL ZEISS SMS GMBH
- Nicole Auth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ELECTRON BEAM INDUCED DEPOSITION OF CONDUCTIVE MATERIAL
- Publication number 20110183517
- Publication date Jul 28, 2011
- CARL ZEISS SMS GMBH
- Nicole Auth
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD FOR ELECTRON BEAM INDUCED ETCHING OF LAYERS CONTAMINATED WIT...
- Publication number 20110183523
- Publication date Jul 28, 2011
- CARL ZEISS SMS GMBH
- Nicole Auth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR REMOVING A MATERIAL FROM A SAMPLE
- Publication number 20100282596
- Publication date Nov 11, 2010
- NAWOTEC GMBH
- Nicole Auth
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Rainer Becker

Person

Patents Grantslast 30 patents

Methods and devices for extending a time period until changing a me...

Methods and devices for extending a time period until changing a me...

Method for electron beam induced etching

Method for electron beam induced etching of layers contaminated wit...

Methods and systems for removing a material from a sample

Method for electron beam induced deposition of conductive material

Apparatus and method for investigating and/or modifying a sample

Patents Applicationslast 30 patents

METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...

METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...

METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A ME...

APPARATUS AND METHOD FOR INVESTIGATING AND/OR MODIFYING A SAMPLE

METHOD FOR ELECTRON BEAM INDUCED ETCHING

METHOD FOR ELECTRON BEAM INDUCED DEPOSITION OF CONDUCTIVE MATERIAL

METHOD FOR ELECTRON BEAM INDUCED ETCHING OF LAYERS CONTAMINATED WIT...

METHODS AND SYSTEMS FOR REMOVING A MATERIAL FROM A SAMPLE