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Ralf Schmid
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Rosenfeld, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Device and method for operating a charged particle device with mult...
Patent number
10,748,743
Issue date
Aug 18, 2020
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Benjamin John Cook
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Light-assisted testing of an optoelectronic module
Patent number
8,222,911
Issue date
Jul 17, 2012
Applied Materials GmbH
Bernhard Gunter Mueller
G02 - OPTICS
Information
Patent Grant
Method for beam calibration and usage of a calibration body
Patent number
8,009,299
Issue date
Aug 30, 2011
Applied Materials GmbH
Matthias Brunner
G01 - MEASURING TESTING
Information
Patent Grant
In-line electron beam test system
Patent number
7,973,546
Issue date
Jul 5, 2011
Applied Materials, Inc.
Fayez E. Abboud
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Configurable prober for TFT LCD array test
Patent number
7,847,566
Issue date
Dec 7, 2010
Applied Materials, Inc.
Matthias Brunner
G01 - MEASURING TESTING
Information
Patent Grant
Prober for electronic device testing on large area substrates
Patent number
7,786,742
Issue date
Aug 31, 2010
Applied Materials, Inc.
Sriram Krishnaswami
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
In-line electron beam test system
Patent number
7,746,088
Issue date
Jun 29, 2010
Applied Materials, Inc.
Fayez E. Abboud
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method to reduce cross talk in a multi column e-beam test system
Patent number
7,569,818
Issue date
Aug 4, 2009
Applied Materials, Inc.
Ralf Schmid
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
In-line electron beam test system
Patent number
7,535,238
Issue date
May 19, 2009
Applied Materials, Inc.
Fayez E. Abboud
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for testing function of active microstructural...
Patent number
7,375,505
Issue date
May 20, 2008
Applied Materials, Inc.
Matthias Brunner
G01 - MEASURING TESTING
Information
Patent Grant
Configurable prober for TFT LCD array test
Patent number
7,355,418
Issue date
Apr 8, 2008
Applied Materials, Inc.
Matthias Brunner
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
Configurable prober for TFT LCD array testing
Patent number
7,319,335
Issue date
Jan 15, 2008
Applied Materials, Inc.
Matthias Brunner
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
Method for testing pixels for LCD TFT displays
Patent number
7,256,606
Issue date
Aug 14, 2007
Applied Materials, Inc.
Axel Wenzel
G01 - MEASURING TESTING
Information
Patent Grant
Deflection system for a particle beam device
Patent number
7,105,833
Issue date
Sep 12, 2006
AKT Electron Beam Technology GmbH
Matthias Brunner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for testing a substrate
Patent number
6,730,906
Issue date
May 4, 2004
Applied Materials, Inc.
Matthias Brunner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charge neutralization of electron beam systems
Patent number
6,465,795
Issue date
Oct 15, 2002
Applied Materials, Inc.
Juan R. Madonado
G01 - MEASURING TESTING
Information
Patent Grant
Method for the recognition of testing errors in the test of microwi...
Patent number
5,373,233
Issue date
Dec 13, 1994
Siemens Aktiengesellschaft
Matthias Brunner
G01 - MEASURING TESTING
Information
Patent Grant
Method for the recognition of testing errors in the test of microwi...
Patent number
5,258,706
Issue date
Nov 2, 1993
Siemens Aktiengesellschaft
Matthias Brunner
G01 - MEASURING TESTING
Information
Patent Grant
Device for the detecting of charged secondary particles
Patent number
4,983,833
Issue date
Jan 8, 1991
Siemens Aktiengesellschaft
Matthias Brunner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for localizing weak points within an electrica...
Patent number
4,640,626
Issue date
Feb 3, 1987
Siemens Aktiengesellschaft
Ralf Schmid
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR INSPECTING A SPECIMEN AND CHARGED PARTICLE BEAM DEVICE
Publication number
20220392735
Publication date
Dec 8, 2022
Pieter Kruit
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEVICE AND METHOD FOR OPERATING A CHARGED PARTICLE DEVICE WITH MULT...
Publication number
20200258714
Publication date
Aug 13, 2020
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
Benjamin John Cook
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IN-LINE ELECTRON BEAM TEST SYSTEM
Publication number
20100327162
Publication date
Dec 30, 2010
Fayez E. Abboud
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR BEAM CALIBRATION AND USAGE OF A CALIBRATION BODY
Publication number
20100188666
Publication date
Jul 29, 2010
APPLIED MATERIALS GMBH
Matthias Brunner
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Application
IN-LINE ELECTRON BEAM TEST SYSTEM
Publication number
20090195262
Publication date
Aug 6, 2009
Fayez E. Abboud
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LIGHT-ASSISTED TESTING OF AN OPTOELECTRONIC MODULE
Publication number
20090179656
Publication date
Jul 16, 2009
APPLIED MATERIALS GMBH
Bernhard Gunter Mueller
G02 - OPTICS
Information
Patent Application
Configurable Prober for TFT LCD Array Test
Publication number
20080061807
Publication date
Mar 13, 2008
Matthias Brunner
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Application
PROBER FOR ELECTRONIC DEVICE TESTING ON LARGE AREA SUBSTRATES
Publication number
20070296426
Publication date
Dec 27, 2007
APPLIED MATERIALS, INC.
SRIRAM KRISHNASWAMI
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Application
METHOD TO REDUCE CROSS TALK IN A MULTI COLUMN E-BEAM TEST SYSTEM
Publication number
20070216428
Publication date
Sep 20, 2007
Ralf Schmid
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Application
In-line electron beam test system
Publication number
20060244467
Publication date
Nov 2, 2006
APPLIED MATERIALS, INC.
Fayez E. Abboud
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for testing pixels for LCD TFT displays
Publication number
20060028230
Publication date
Feb 9, 2006
APPLIED MATERIALS, INC.
Axel Wenzel
G02 - OPTICS
Information
Patent Application
Method and apparatus for testing function of active microstructural...
Publication number
20050212545
Publication date
Sep 29, 2005
Matthias Brunner
G01 - MEASURING TESTING
Information
Patent Application
Configurable prober for TFT LCD array testing
Publication number
20050179451
Publication date
Aug 18, 2005
APPLIED MATERIALS, INC.
Matthias Brunner
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Application
Configurable prober for TFT LCD array test
Publication number
20050179452
Publication date
Aug 18, 2005
APPLIED MATERIALS, INC.
Matthias Brunner
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Application
Deflection system for a particle beam device
Publication number
20040188630
Publication date
Sep 30, 2004
Matthias Brunner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and apparatus for testing a substrate
Publication number
20020024023
Publication date
Feb 28, 2002
Matthias Brunner
H01 - BASIC ELECTRIC ELEMENTS