Ralph G. Whitten

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Test assembly including a test die for testing a semiconductor prod...
- Patent number 7,557,596
- Issue date Jul 7, 2009
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing signal paths between an integrated circuit wafer...
- Patent number 7,053,637
- Issue date May 30, 2006
- FormFactor, Inc.
- Ralph G. Whitten
- G01 - MEASURING TESTING
Information Patent Grant
Special contact points for accessing internal circuitry of an integ...
- Patent number 6,940,093
- Issue date Sep 6, 2005
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Test assembly including a test die for testing a semiconductor prod...
- Patent number 6,825,052
- Issue date Nov 30, 2004
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing signal paths between an integrated circuit wafer...
- Patent number 6,724,209
- Issue date Apr 20, 2004
- Ralph G. Whitten
- G01 - MEASURING TESTING
Information Patent Grant
Large contactor with multiple, aligned contactor units
- Patent number 6,690,185
- Issue date Feb 10, 2004
- FormFactor, Inc.
- Igor Y Khandros
- G01 - MEASURING TESTING
Information Patent Grant
Special contact points for accessing internal circuitry of an integ...
- Patent number 6,621,260
- Issue date Sep 16, 2003
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Special contact points for accessing internal circuitry of an integ...
- Patent number 6,603,324
- Issue date Aug 5, 2003
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Special contact points for accessing internal circuitry of an integ...
- Patent number 6,597,187
- Issue date Jul 22, 2003
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Test assembly including a test die for testing a semiconductor prod...
- Patent number 6,551,844
- Issue date Apr 22, 2003
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing signal paths between an integrated circuit wafer...
- Patent number 6,476,630
- Issue date Nov 5, 2002
- FormFactor, Inc.
- Ralph G. Whitten
- G01 - MEASURING TESTING
Information Patent Grant
Special contact points for accessing internal circuitry of an integ...
- Patent number 6,456,099
- Issue date Sep 24, 2002
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Concurrent design and subsequent partitioning of product and test die
- Patent number 6,429,029
- Issue date Aug 6, 2002
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Method for fabrication of programmable interconnect structure
- Patent number 6,150,199
- Issue date Nov 21, 2000
- QuickLogic Corporation
- Ralph G. Whitten
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabrication of programmable interconnect structure
- Patent number 5,989,943
- Issue date Nov 23, 1999
- QuickLogic Corporation
- Ralph G. Whitten
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated two-terminal fuse-antifuse and fuse and integrated two-t...
- Patent number 5,903,041
- Issue date May 11, 1999
- Aptix Corporation
- Michael David La Fleur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrically programmable interconnect structure having a PECVD amo...
- Patent number 5,780,919
- Issue date Jul 14, 1998
- QuickLogic Corporation
- Hua-Thye Chua
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field programmable gate array having reproducible metal-to-metal am...
- Patent number 5,717,230
- Issue date Feb 10, 1998
- QuickLogic Corporation
- Hua-Thye Chua
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making and an apparatus for a flat diffraction grating li...
- Patent number 5,661,592
- Issue date Aug 26, 1997
- Silicon Light Machines
- Jonathan G. Bornstein
- G02 - OPTICS
Information Patent Grant
Electrically programmable interconnect structure having a PECVD amo...
- Patent number 5,502,315
- Issue date Mar 26, 1996
- QuickLogic Corporation
- Hua-Thye Chua
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrically programmable interconnect element for integrated circuits
- Patent number 5,451,811
- Issue date Sep 19, 1995
- Aptix Corporation
- Ralph G. Whitten
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Two-stage programmable interconnect architecture
- Patent number 5,412,261
- Issue date May 2, 1995
- Aptix Corporation
- Ralph G. Whitten
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Structures for electrostatic discharge protection of electrical and...
- Patent number 5,341,267
- Issue date Aug 23, 1994
- Aptix Corporation
- Ralph G. Whitten
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fusible link structure for integrated circuits
- Patent number 4,796,075
- Issue date Jan 3, 1989
- Advanced Micro Devices, Inc.
- Ralph G. Whitten
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Special contact points for accessing internal circuitry of an inter...
- Publication number 20060006384
- Publication date Jan 12, 2006
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Test assembly including a test die for testing a semiconductor prod...
- Publication number 20050156165
- Publication date Jul 21, 2005
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Method for testing signal paths between an integrated circuit wafer...
- Publication number 20040148122
- Publication date Jul 29, 2004
- FormFactor, Inc.
- Ralph G. Whitten
- G01 - MEASURING TESTING
Information Patent Application
Test assembly including a test die for testing a semiconductor prod...
- Publication number 20040004216
- Publication date Jan 8, 2004
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Special contact points for accessing internal circuitry of an integ...
- Publication number 20010052786
- Publication date Dec 20, 2001
- FormFactor, Inc. a Delaware coporation
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Special contact points for accessing internal circuitry of an integ...
- Publication number 20010020747
- Publication date Sep 13, 2001
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Special contact points for accessing internal circuitry of an integ...
- Publication number 20010020743
- Publication date Sep 13, 2001
- FormFactor. Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
Special contact points for accessing internal circuitry of an integ...
- Publication number 20010015773
- Publication date Aug 23, 2001
- FormFactor, Inc., a Delaware corporation
- Benjamin N. Eldridge
- G01 - MEASURING TESTING

Ralph G. Whitten

Person

Patents Grantslast 30 patents

Test assembly including a test die for testing a semiconductor prod...

Method for testing signal paths between an integrated circuit wafer...

Special contact points for accessing internal circuitry of an integ...

Test assembly including a test die for testing a semiconductor prod...

Method for testing signal paths between an integrated circuit wafer...

Large contactor with multiple, aligned contactor units

Special contact points for accessing internal circuitry of an integ...

Special contact points for accessing internal circuitry of an integ...

Special contact points for accessing internal circuitry of an integ...

Test assembly including a test die for testing a semiconductor prod...

Method for testing signal paths between an integrated circuit wafer...

Special contact points for accessing internal circuitry of an integ...

Concurrent design and subsequent partitioning of product and test die

Method for fabrication of programmable interconnect structure

Method for fabrication of programmable interconnect structure

Integrated two-terminal fuse-antifuse and fuse and integrated two-t...

Electrically programmable interconnect structure having a PECVD amo...

Field programmable gate array having reproducible metal-to-metal am...

Method of making and an apparatus for a flat diffraction grating li...

Electrically programmable interconnect structure having a PECVD amo...

Electrically programmable interconnect element for integrated circuits

Two-stage programmable interconnect architecture

Structures for electrostatic discharge protection of electrical and...

Fusible link structure for integrated circuits

Patents Applicationslast 30 patents

Special contact points for accessing internal circuitry of an inter...

Test assembly including a test die for testing a semiconductor prod...

Method for testing signal paths between an integrated circuit wafer...

Test assembly including a test die for testing a semiconductor prod...

Special contact points for accessing internal circuitry of an integ...

Special contact points for accessing internal circuitry of an integ...

Special contact points for accessing internal circuitry of an integ...

Special contact points for accessing internal circuitry of an integ...