Rami Saban

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Holon, IL

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Patents Grantslast 30 patents

Information Patent Grant
Testability architecture for modularized integrated circuits
- Patent number 6,493,840
- Issue date Dec 10, 2002
- National Semiconductor Corporation
- Alon Shacham
- G01 - MEASURING TESTING
Information Patent Grant
Testability method for modularized integrated circuits
- Patent number 6,060,897
- Issue date May 9, 2000
- National Semiconductor Corporation
- Alon Shacham
- G01 - MEASURING TESTING
Information Patent Grant
Fully digital data separator and frequency multiplier
- Patent number 5,592,515
- Issue date Jan 7, 1997
- National Semiconductor Corporation
- Rami Saban
- G11 - INFORMATION STORAGE
Information Patent Grant
Fully digital data separator and frequency multiplier
- Patent number 5,553,100
- Issue date Sep 3, 1996
- National Semiconductor Corporation
- Rami Saban
- G11 - INFORMATION STORAGE
Information Patent Grant
Digital frequency multiplier utilizing digital controlled oscillator
- Patent number 5,438,300
- Issue date Aug 1, 1995
- National Semiconductor Corporation
- Rami Saban
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method of prechecking the validity of a write access request
- Patent number 5,438,670
- Issue date Aug 1, 1995
- National Semiconductor Corporation
- Gigi Baror
- G06 - COMPUTING CALCULATING COUNTING