Randy J. Schwindt

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer probe station having a skirting component
- Patent number 7,589,518
- Issue date Sep 15, 2009
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Grant
Probe holder for testing of a test device
- Patent number 7,504,842
- Issue date Mar 17, 2009
- Cascade Microtech, Inc.
- Randy Schwindt
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe station having a skirting component
- Patent number 7,492,147
- Issue date Feb 17, 2009
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station having a skirting component
- Patent number 7,330,023
- Issue date Feb 12, 2008
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Grant
Probe holder for testing of a test device
- Patent number 7,221,174
- Issue date May 22, 2007
- Cascade Microtech, Inc.
- Randy Schwindt
- G01 - MEASURING TESTING
Information Patent Grant
Low-current probe card
- Patent number 7,071,718
- Issue date Jul 4, 2006
- Gascade Microtech, Inc.
- Randy J. Schwindt
- G01 - MEASURING TESTING
Information Patent Grant
Probe holder for testing of a test device
- Patent number 7,057,407
- Issue date Jun 6, 2006
- Cascade Microtech, Inc.
- Randy Schwindt
- G01 - MEASURING TESTING
Information Patent Grant
Low-current probe card
- Patent number 6,995,579
- Issue date Feb 7, 2006
- Cascade Microtech, Inc.
- Randy J. Schwindt
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe station for low-current measurements
- Patent number 6,980,012
- Issue date Dec 27, 2005
- Cascase Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Grant
Probe holder for testing of a test device
- Patent number 6,850,082
- Issue date Feb 1, 2005
- Casecade Microtech, Inc.
- Randy Schwindt
- G01 - MEASURING TESTING
Information Patent Grant
Low-current probe card
- Patent number 6,781,396
- Issue date Aug 24, 2004
- Cascade Microtech, Inc.
- Randy J. Schwindt
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe station for low-current measurements
- Patent number 6,720,782
- Issue date Apr 13, 2004
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Grant
Low-current probe card
- Patent number 6,507,208
- Issue date Jan 14, 2003
- Cascade Microtech, Inc.
- Randy J. Schwindt
- G01 - MEASURING TESTING
Information Patent Grant
Probe holder for testing of a test device
- Patent number 6,496,024
- Issue date Dec 17, 2002
- Cascade Microtech, Inc.
- Randy Schwindt
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe station for low-current measurements
- Patent number 6,492,822
- Issue date Dec 10, 2002
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Grant
Probe holder for low current measurements
- Patent number 6,384,615
- Issue date May 7, 2002
- Cascade Microtech, Inc.
- Randy Schwindt
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Wafer probe station for low-current measurements
- Patent number 6,335,628
- Issue date Jan 1, 2002
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Grant
Low-current probe card
- Patent number 6,249,133
- Issue date Jun 19, 2001
- Cascade Microtech, Inc.
- Randy J. Schwindt
- G01 - MEASURING TESTING
Information Patent Grant
Probe holder for low current measurements
- Patent number 6,232,789
- Issue date May 15, 2001
- Cascade Microtech, Inc.
- Randy Schwindt
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Wafer probe station for low-current measurements
- Patent number 6,232,788
- Issue date May 15, 2001
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Grant
Low-current probe card with reduced triboelectric current generatin...
- Patent number 6,137,302
- Issue date Oct 24, 2000
- Cascade Microtech, Inc.
- Randy J. Schwindt
- G01 - MEASURING TESTING
Information Patent Grant
Low-current probe card
- Patent number 6,075,376
- Issue date Jun 13, 2000
- Randy J. Schwindt
- G01 - MEASURING TESTING
Information Patent Grant
Probe station for low current, low voltage parametric measurements...
- Patent number 6,031,383
- Issue date Feb 29, 2000
- Wentworth Laboratories, Inc.
- George H. Streib
- G01 - MEASURING TESTING
Information Patent Grant
Low-current probe card with reduced triboelectric current generatin...
- Patent number 5,729,150
- Issue date Mar 17, 1998
- Cascade Microtech, Inc.
- Randy J. Schwindt
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe station for low-current measurements
- Patent number 5,663,653
- Issue date Sep 2, 1997
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Grant
Probe station having conductive coating added to thermal chuck insu...
- Patent number 5,610,529
- Issue date Mar 11, 1997
- Cascade Microtech, Inc.
- Randy Schwindt
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe station having full guarding
- Patent number 5,457,398
- Issue date Oct 10, 1995
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station having integrated guarding, Kelvin connection a...
- Patent number 5,434,512
- Issue date Jul 18, 1995
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station having integrated guarding, Kelvin connection a...
- Patent number 5,345,170
- Issue date Sep 6, 1994
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE

Patents Applicationslast 30 patents

Information Patent Application
Wafer probe station having a skirting component
- Publication number 20070290700
- Publication date Dec 20, 2007
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Application
Probe holder for testing of a test device
- Publication number 20070194803
- Publication date Aug 23, 2007
- Cascade Microtech, Inc.
- Randy Schwindt
- G01 - MEASURING TESTING
Information Patent Application
Probe holder for testing of a test device
- Publication number 20060208748
- Publication date Sep 21, 2006
- Cascade Microtech, Inc.
- Randy Schwindt
- G01 - MEASURING TESTING
Information Patent Application
Low-current probe card
- Publication number 20060202708
- Publication date Sep 14, 2006
- Cascade Microtech, Inc.
- Randy J. Schwindt
- G01 - MEASURING TESTING
Information Patent Application
Low-current probe card
- Publication number 20050231226
- Publication date Oct 20, 2005
- Cascade Microtech, Inc.
- Randy J. Schwindt
- G01 - MEASURING TESTING
Information Patent Application
Wafer probe station having a skirting component
- Publication number 20050194983
- Publication date Sep 8, 2005
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Application
Wafer probe station having a skirting component
- Publication number 20050184744
- Publication date Aug 25, 2005
- CascadeMicrotech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Application
Probe holder for testing of a test device
- Publication number 20050035777
- Publication date Feb 17, 2005
- Randy Schwindt
- G01 - MEASURING TESTING
Information Patent Application
Low-current probe card
- Publication number 20040227537
- Publication date Nov 18, 2004
- Randy J. Schwindt
- G01 - MEASURING TESTING
Information Patent Application
Wafer probe station for low-current measurements
- Publication number 20040061514
- Publication date Apr 1, 2004
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Application
Low-current probe card
- Publication number 20030071644
- Publication date Apr 17, 2003
- Randy J. Schwindt
- G01 - MEASURING TESTING
Information Patent Application
Wafer probe station for low-current measurements
- Publication number 20030057979
- Publication date Mar 27, 2003
- Randy J. Schwindt
- G01 - MEASURING TESTING
Information Patent Application
Probe holder for testing of a test device
- Publication number 20030034789
- Publication date Feb 20, 2003
- Randy Schwindt
- B82 - NANO-TECHNOLOGY
Information Patent Application
Probe holder for low current measurements
- Publication number 20020079911
- Publication date Jun 27, 2002
- Randy Schwindt
- B82 - NANO-TECHNOLOGY
Information Patent Application
Wafer probe station for low-current measurements
- Publication number 20020043981
- Publication date Apr 18, 2002
- Randy J. Schwindt
- G01 - MEASURING TESTING
Information Patent Application
Low-current probe card
- Publication number 20010011902
- Publication date Aug 9, 2001
- Randy J. Schwindt
- G01 - MEASURING TESTING
Information Patent Application
Probe holder for low current measurements
- Publication number 20010009378
- Publication date Jul 26, 2001
- Randy Schwindt
- B82 - NANO-TECHNOLOGY
Information Patent Application
Wafer probe station for low-current measurements
- Publication number 20010009377
- Publication date Jul 26, 2001
- Randy J. Schwindt
- G01 - MEASURING TESTING

Randy J. Schwindt

Person

Patents Grantslast 30 patents

Wafer probe station having a skirting component

Probe holder for testing of a test device

Wafer probe station having a skirting component

Wafer probe station having a skirting component

Probe holder for testing of a test device

Low-current probe card

Probe holder for testing of a test device

Low-current probe card

Wafer probe station for low-current measurements

Probe holder for testing of a test device

Low-current probe card

Wafer probe station for low-current measurements

Low-current probe card

Probe holder for testing of a test device

Wafer probe station for low-current measurements

Probe holder for low current measurements

Wafer probe station for low-current measurements

Low-current probe card

Probe holder for low current measurements

Wafer probe station for low-current measurements

Low-current probe card with reduced triboelectric current generatin...

Low-current probe card

Probe station for low current, low voltage parametric measurements...

Low-current probe card with reduced triboelectric current generatin...

Wafer probe station for low-current measurements

Probe station having conductive coating added to thermal chuck insu...

Wafer probe station having full guarding

Wafer probe station having integrated guarding, Kelvin connection a...

Wafer probe station having integrated guarding, Kelvin connection a...

Patents Applicationslast 30 patents

Wafer probe station having a skirting component

Probe holder for testing of a test device

Probe holder for testing of a test device

Low-current probe card

Low-current probe card

Wafer probe station having a skirting component

Wafer probe station having a skirting component

Probe holder for testing of a test device

Low-current probe card

Wafer probe station for low-current measurements

Low-current probe card

Wafer probe station for low-current measurements

Probe holder for testing of a test device

Probe holder for low current measurements

Wafer probe station for low-current measurements

Low-current probe card

Probe holder for low current measurements

Wafer probe station for low-current measurements