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Ray Beffa
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Patents Grants
last 30 patents
Information
Patent Grant
256 Meg dynamic random access memory
Patent number
8,189,423
Issue date
May 29, 2012
Round Rock Research, LLC
Brent Keeth
G11 - INFORMATION STORAGE
Information
Patent Grant
256 Meg dynamic random access memory
Patent number
7,969,810
Issue date
Jun 28, 2011
Round Rock Research, LLC
Brent Keeth
G11 - INFORMATION STORAGE
Information
Patent Grant
Method in an integrated circuit (IC) manufacturing process for iden...
Patent number
7,885,782
Issue date
Feb 8, 2011
Micron Technology, Inc.
Raymond J. Beffa
G01 - MEASURING TESTING
Information
Patent Grant
Method for sorting integrated circuit devices
Patent number
7,875,821
Issue date
Jan 25, 2011
Micron Technology, Inc.
Raymond J. Beffa
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Grant
Method for sorting integrated circuit devices
Patent number
7,682,847
Issue date
Mar 23, 2010
Micron Technology, Inc.
Raymond J. Beffa
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Grant
Method for isolating a short-circuited integrated circuit (IC) from...
Patent number
7,567,091
Issue date
Jul 28, 2009
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Grant
Sorting a group of integrated circuit devices for those devices req...
Patent number
7,502,659
Issue date
Mar 10, 2009
Micron Technology, Inc.
Raymond J. Beffa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
256 Meg dynamic random access memory
Patent number
7,489,564
Issue date
Feb 10, 2009
Micron Technology, Inc.
Brent Keeth
G11 - INFORMATION STORAGE
Information
Patent Grant
256 Meg dynamic random access memory
Patent number
7,477,556
Issue date
Jan 13, 2009
Micron Technology, Inc.
Brent Keeth
G11 - INFORMATION STORAGE
Information
Patent Grant
256 Meg dynamic random access memory
Patent number
7,477,557
Issue date
Jan 13, 2009
Micron Technology, Inc.
Brent Keeth
G11 - INFORMATION STORAGE
Information
Patent Grant
Method for sorting integrated circuit devices
Patent number
7,446,277
Issue date
Nov 4, 2008
Micron Technology, Inc.
Raymond J. Beffa
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Grant
Method for sorting integrated circuit devices
Patent number
7,368,678
Issue date
May 6, 2008
Micron Technology, Inc.
Raymond J. Beffa
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Grant
Device and method for isolating a short-circuited integrated circui...
Patent number
7,323,896
Issue date
Jan 29, 2008
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Grant
System for isolating a short-circuited integrated circuit (IC) from...
Patent number
7,315,179
Issue date
Jan 1, 2008
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Grant
Method for sorting integrated circuit devices
Patent number
7,276,672
Issue date
Oct 2, 2007
Micron Technology, Inc.
Raymond J. Beffa
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Grant
Device and method for isolating a short-circuited integrated circui...
Patent number
7,276,927
Issue date
Oct 2, 2007
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Grant
Method for isolating a short-circuited integrated circuit (IC) from...
Patent number
7,276,926
Issue date
Oct 2, 2007
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for isolating a short-circuited integrated circui...
Patent number
7,212,020
Issue date
May 1, 2007
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Grant
Method in an integrated circuit (IC) manufacturing process for iden...
Patent number
7,124,050
Issue date
Oct 17, 2006
Micron Technology, Inc.
Raymond J. Beffa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Integrated circuit devices having reducing variable retention chara...
Patent number
7,120,073
Issue date
Oct 10, 2006
Micron Technology, Inc.
Russell L. Meyer
G11 - INFORMATION STORAGE
Information
Patent Grant
Sorting a group of integrated circuit devices for those devices req...
Patent number
7,117,063
Issue date
Oct 3, 2006
Micro Technology, Inc.
Raymond J. Beffa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Sorting a group of integrated circuit devices for those devices req...
Patent number
7,107,117
Issue date
Sep 12, 2006
Micron Technology, Inc.
Raymond J. Beffa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System for optimizing anti-fuse repair time using fuse id
Patent number
7,069,484
Issue date
Jun 27, 2006
Micron Technology, Inc.
Ray Beffa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Device and method for isolating a short-circuited integrated circui...
Patent number
7,034,561
Issue date
Apr 25, 2006
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Grant
Data compression circuit and method for testing memory devices
Patent number
RE38956
Issue date
Jan 31, 2006
Micron Technology, Inc.
Ray Beffa
365 - Static information storage and retrieval
Information
Patent Grant
Method in an integrated circuit (IC) manufacturing process for iden...
Patent number
6,944,567
Issue date
Sep 13, 2005
Micron Technology, Inc.
Raymond J. Beffa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of reducing variable retention characteristics in DRAM cells
Patent number
6,898,138
Issue date
May 24, 2005
Micron Technology, Inc.
Russell L. Meyer
G11 - INFORMATION STORAGE
Information
Patent Grant
Reduced terminal testing system
Patent number
6,852,999
Issue date
Feb 8, 2005
Micron Technology, Inc.
Warren M. Farnworth
G11 - INFORMATION STORAGE
Information
Patent Grant
Device and method for isolating a short-circuited integrated circui...
Patent number
6,831,475
Issue date
Dec 14, 2004
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Grant
Reduced terminal testing system
Patent number
6,815,968
Issue date
Nov 9, 2004
Micron Technology, Inc.
Warren M. Farnworth
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
256 Meg dynamic random access memory
Publication number
20110261628
Publication date
Oct 27, 2011
Round Rock Research, LLC
Brent Keeth
G11 - INFORMATION STORAGE
Information
Patent Application
METHOD FOR SORTING INTEGRATED CIRCUIT DEVICES
Publication number
20110089088
Publication date
Apr 21, 2011
Micron Technology, Inc.
Raymond J. Beffa
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Application
SYSTEM FOR ISOLATING A SHORT-CIRCUITED INTEGRATED CIRCUIT (IC) FROM...
Publication number
20090273360
Publication date
Nov 5, 2009
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Application
256 Meg dynamic random access memory
Publication number
20090245009
Publication date
Oct 1, 2009
Brent Keeth
G11 - INFORMATION STORAGE
Information
Patent Application
METHOD FOR SORTING INTEGRATED CIRCUIT DEVICES
Publication number
20090060703
Publication date
Mar 5, 2009
Micron Technology, Inc.
Raymond J. Beffa
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Application
METHOD FOR SORTING INTEGRATED CIRCUIT DEVICES
Publication number
20090038997
Publication date
Feb 12, 2009
Micron Technology, Inc.
Raymond J. Beffa
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Application
Method for Isolating a Short-Circuited Integrated Circuit (IC) From...
Publication number
20080111574
Publication date
May 15, 2008
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Application
Sorting a group of integrated circuit devices for those devices req...
Publication number
20070239308
Publication date
Oct 11, 2007
Raymond J. Beffa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
256 Meg dynamic random access memory
Publication number
20070152743
Publication date
Jul 5, 2007
Brent Keeth
G11 - INFORMATION STORAGE
Information
Patent Application
Device and method for isolating a short-circuited integrated circui...
Publication number
20070103167
Publication date
May 10, 2007
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Application
Method in an integrated circuit (IC) manufacturing process for iden...
Publication number
20070094632
Publication date
Apr 26, 2007
Raymond J. Beffa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Device and method for isolating a short-circuited integrated circui...
Publication number
20070075723
Publication date
Apr 5, 2007
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Application
Device and method for isolating a short-circuited integrated circui...
Publication number
20070075725
Publication date
Apr 5, 2007
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Application
Device and method for isolating a short-circuited integrated circui...
Publication number
20070075722
Publication date
Apr 5, 2007
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Application
256 Meg dynamic random access memory
Publication number
20070008811
Publication date
Jan 11, 2007
Brent Keeth
G11 - INFORMATION STORAGE
Information
Patent Application
256 Meg dynamic random access memory
Publication number
20070008794
Publication date
Jan 11, 2007
Brent Keeth
G11 - INFORMATION STORAGE
Information
Patent Application
Device and method for isolating a short-circuited integrated circui...
Publication number
20060192582
Publication date
Aug 31, 2006
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Application
Sorting a group of integrated circuit devices for those devices req...
Publication number
20060030963
Publication date
Feb 9, 2006
Raymond J. Beffa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method in an integrated circuit (IC) manufacturing process for iden...
Publication number
20050228606
Publication date
Oct 13, 2005
Raymond J. Beffa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method for sorting integrated circuit devices
Publication number
20050189267
Publication date
Sep 1, 2005
Raymond J. Beffa
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Application
Integrated circuit devices having reducing variable retention chara...
Publication number
20050174871
Publication date
Aug 11, 2005
Russell L. Meyer
G11 - INFORMATION STORAGE
Information
Patent Application
Device and method for isolating a short-circuited integrated circui...
Publication number
20050093566
Publication date
May 5, 2005
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Application
System for optimizing anti-fuse repair time using fuse id
Publication number
20050091560
Publication date
Apr 28, 2005
Ray Beffa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Sorting a group of integrated circuit devices for those devices req...
Publication number
20040172152
Publication date
Sep 2, 2004
Raymond J. Beffa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Device and method for isolating a short-circuited integrated circui...
Publication number
20040130345
Publication date
Jul 8, 2004
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Application
Method of reducing variable retention characteristics in DRAM cells
Publication number
20040042306
Publication date
Mar 4, 2004
Russell L. Meyer
G11 - INFORMATION STORAGE
Information
Patent Application
Method in an integrated circuit (IC) manufacturing process for iden...
Publication number
20040024551
Publication date
Feb 5, 2004
Raymond J. Beffa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Reduced terminal testing system
Publication number
20030178692
Publication date
Sep 25, 2003
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Application
Method of sorting a group of integrated circuit devices for those d...
Publication number
20030139839
Publication date
Jul 24, 2003
Raymond J. Beffa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
256 Meg dynamic random access memory
Publication number
20030021136
Publication date
Jan 30, 2003
Brent Keeth
H01 - BASIC ELECTRIC ELEMENTS