Raymond J. Castonguay

Person

Tucson, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods for determining error in an interferometry system
- Patent number 9,534,883
- Issue date Jan 3, 2017
- Piotr Szwaykowski
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric system with reduced vibration sensitivity and relat...
- Patent number 8,004,687
- Issue date Aug 23, 2011
- Trology, LLC
- Piotr Szwaykowski
- G01 - MEASURING TESTING
Information Patent Grant
High resolution three dimensional topography using a flatbed scanner
- Patent number 7,808,654
- Issue date Oct 5, 2010
- Engineering Synthesis Design, Inc.
- Raymond Joseph Castonguay
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Scanning simultaneous phase-shifting interferometer
- Patent number 7,561,279
- Issue date Jul 14, 2009
- Engineering Synthesis Design, Inc.
- Raymond Castonguay
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous phase shifting module for use in interferometry
- Patent number 7,483,145
- Issue date Jan 27, 2009
- Trology, LLC
- Piotr Szwaykowski
- G01 - MEASURING TESTING
Information Patent Grant
Spherical scattering-light device for simultaneous phase and intens...
- Patent number 7,256,895
- Issue date Aug 14, 2007
- Raymond J. Castonguay
- G01 - MEASURING TESTING
Information Patent Grant
Process of acquiring with an X=Y scannable array camera light emant...
- Patent number 5,729,640
- Issue date Mar 17, 1998
- Breault Research Organization
- Raymond Joseph Castonguay
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring reflected light utilizing spherically arran...
- Patent number 5,640,246
- Issue date Jun 17, 1997
- Breault Research Organization
- Raymond Joseph Castonguay
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for collecting light and its method of manufacture
- Patent number 5,615,294
- Issue date Mar 25, 1997
- Breault Research Organization
- Raymond J. Castonguay
- G01 - MEASURING TESTING
Information Patent Grant
Process of reconstructing a single data profile of rapidly measured...
- Patent number 5,475,617
- Issue date Dec 12, 1995
- Breault Research Organization, Inc.
- Raymond J. Castonguay
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method of rapidly measuring hemispherical scattered o...
- Patent number 5,313,542
- Issue date May 17, 1994
- Breault Research Organization, Inc.
- Raymond J. Castonguay
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTERFEROMETRIC SYSTEM WITH REDUCED VIBRATION SENSITIVITY AND RELAT...
- Publication number 20120026507
- Publication date Feb 2, 2012
- Piotr Szwaykowski
- G01 - MEASURING TESTING
Information Patent Application
SCANNING SIMULTANEOUS PHASE-SHIFTING INTERFEROMETER
- Publication number 20080043224
- Publication date Feb 21, 2008
- Raymond Castonguay
- G01 - MEASURING TESTING
Information Patent Application
Simultaneous phase shifting module for use in interferometry
- Publication number 20060146340
- Publication date Jul 6, 2006
- Piotr Szwaykowski
- G01 - MEASURING TESTING
Information Patent Application
Interferometric system with reduced vibration sensitivity and reala...
- Publication number 20060146341
- Publication date Jul 6, 2006
- Piotr Szwaykowski
- G01 - MEASURING TESTING
Information Patent Application
Spherical light-scatter and far-field phase measurement
- Publication number 20040165189
- Publication date Aug 26, 2004
- Raymond J. Castonguay
- G01 - MEASURING TESTING

Raymond J. Castonguay

Person

Patents Grantslast 30 patents

Methods for determining error in an interferometry system

Interferometric system with reduced vibration sensitivity and relat...

High resolution three dimensional topography using a flatbed scanner

Scanning simultaneous phase-shifting interferometer

Simultaneous phase shifting module for use in interferometry

Spherical scattering-light device for simultaneous phase and intens...

Process of acquiring with an X=Y scannable array camera light emant...

Apparatus for measuring reflected light utilizing spherically arran...

Apparatus for collecting light and its method of manufacture

Process of reconstructing a single data profile of rapidly measured...

Apparatus and method of rapidly measuring hemispherical scattered o...

Patents Applicationslast 30 patents

INTERFEROMETRIC SYSTEM WITH REDUCED VIBRATION SENSITIVITY AND RELAT...

SCANNING SIMULTANEOUS PHASE-SHIFTING INTERFEROMETER

Simultaneous phase shifting module for use in interferometry

Interferometric system with reduced vibration sensitivity and reala...

Spherical light-scatter and far-field phase measurement