Raymond John CHANEY

Person

Berkeley, GB

People

Patents Grantslast 30 patents

Information Patent Grant
Laser device
- Patent number 10,056,734
- Issue date Aug 21, 2018
- Renishaw plc
- Nigel Joseph Copner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Rotation detection kit
- Patent number 8,368,887
- Issue date Feb 5, 2013
- Renishaw plc
- Stephen Mark Angood
- G01 - MEASURING TESTING
Information Patent Grant
Motion detection and analysis
- Patent number 6,934,641
- Issue date Aug 23, 2005
- Renishaw PLC
- Mark A. Chapman
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for producing and guiding a light beam
- Patent number 6,597,505
- Issue date Jul 22, 2003
- Renishaw PLC
- Raymond J Chaney
- G01 - MEASURING TESTING
Information Patent Grant
Frequency stabilized semiconductor laser
- Patent number 6,345,060
- Issue date Feb 5, 2002
- Renishaw PLC
- Nigel J Copner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Real-time compensation system and method
- Patent number 5,975,744
- Issue date Nov 2, 1999
- Renishaw plc
- Seamus McFadden
- G05 - CONTROLLING REGULATING
Information Patent Grant
Detector for explosive substances
- Patent number 5,818,047
- Issue date Oct 6, 1998
- Renishaw plc
- Raymond J Chaney
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic apparatus and methods
- Patent number 5,689,333
- Issue date Nov 18, 1997
- Renishaw plc
- David N. Batchelder
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Laser interferometer for measuring object displacement over large d...
- Patent number 5,638,177
- Issue date Jun 10, 1997
- Renishaw plc
- Raymond J. Chaney
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measuring apparatus for making absolute measurement...
- Patent number 5,541,730
- Issue date Jul 30, 1996
- Renishaw plc
- Raymond J. Chaney
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for calibration of an angular displacement
- Patent number 5,341,702
- Issue date Aug 30, 1994
- Renishaw Transducer Systems Limited
- Raymond J. Chaney
- E21 - EARTH DRILLING MINING
Information Patent Grant
Two component straightness interferometer apparatus for measuring m...
- Patent number 5,337,145
- Issue date Aug 9, 1994
- Renishaw Transducer Systems, Limited
- Raymond J. Chaney
- G01 - MEASURING TESTING
Information Patent Grant
Absolute gas refractometer wherein the optical path difference of s...
- Patent number 5,313,271
- Issue date May 17, 1994
- Renishaw Transducer Systems Limited
- Raymond J. Chaney
- G01 - MEASURING TESTING
Information Patent Grant
Laser interferometer for measuring distance using a frequency diffe...
- Patent number 5,274,436
- Issue date Dec 28, 1993
- Renishaw plc
- Raymond J. Chaney
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measurement of angular displacement
- Patent number 5,237,390
- Issue date Aug 17, 1993
- Renishaw plc
- Raymond J. Chaney
- G01 - MEASURING TESTING
Information Patent Grant
Optical apparatus for use with inteferometric measuring devices
- Patent number 5,056,921
- Issue date Oct 15, 1991
- Renishaw plc
- Raymond J. Chaney
- G01 - MEASURING TESTING
Information Patent Grant
Straightness interferometer system
- Patent number 5,026,163
- Issue date Jun 25, 1991
- Renishaw plc
- David R. McMurtry
- G01 - MEASURING TESTING
Information Patent Grant
Scales for position determining apparatus having marks of different...
- Patent number 5,004,982
- Issue date Apr 2, 1991
- Renishaw plc
- Raymond J. Chaney
- G01 - MEASURING TESTING
Information Patent Grant
Optical detection system with means for equalizing ambient light le...
- Patent number 4,996,416
- Issue date Feb 26, 1991
- Renishaw plc
- Raymond J. Chaney
- G01 - MEASURING TESTING
Information Patent Grant
Combined scale and interferometer
- Patent number 4,950,079
- Issue date Aug 21, 1990
- Renishaw plc
- David R. McMurtry
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring apparatus for use on machines
- Patent number 4,892,407
- Issue date Jan 9, 1990
- Renishaw plc
- David R. McMurtry
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LASER DEVICE
- Publication number 20170155229
- Publication date Jun 1, 2017
- RENISHAW PLC
- Nigel Joseph COPNER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ROTATION DETECTION KIT
- Publication number 20100053615
- Publication date Mar 4, 2010
- RENISHAW PLC
- Stephen Mark Angood
- G01 - MEASURING TESTING
Information Patent Application
Dynamic Air Turbulence Compensation for Laser Measurement Apparatus
- Publication number 20090257067
- Publication date Oct 15, 2009
- RENISHAW PLC
- Mark Adrian Vincent Chapman
- G01 - MEASURING TESTING
Information Patent Application
Optical readhead
- Publication number 20070177157
- Publication date Aug 2, 2007
- RENISHAW PLC
- David Roberts McMurtry
- G01 - MEASURING TESTING
Information Patent Application
Laser calibration apparatus
- Publication number 20060215179
- Publication date Sep 28, 2006
- David Roberts McMurtry
- G01 - MEASURING TESTING
Information Patent Application
Frequency stabilized laser system comprising phase modulation of ba...
- Publication number 20050185685
- Publication date Aug 25, 2005
- RENISHAW PLC
- Mark Adrian Vincent Chapman
- G11 - INFORMATION STORAGE
Information Patent Application
Motion detection and analysis
- Publication number 20040107068
- Publication date Jun 3, 2004
- RENISHAW PLC
- Mark A. Chapman
- G01 - MEASURING TESTING

Raymond John CHANEY

Person

Patents Grantslast 30 patents

Laser device

Rotation detection kit

Motion detection and analysis

Apparatus for producing and guiding a light beam

Frequency stabilized semiconductor laser

Real-time compensation system and method

Detector for explosive substances

Spectroscopic apparatus and methods

Laser interferometer for measuring object displacement over large d...

Interferometric measuring apparatus for making absolute measurement...

Apparatus for calibration of an angular displacement

Two component straightness interferometer apparatus for measuring m...

Absolute gas refractometer wherein the optical path difference of s...

Laser interferometer for measuring distance using a frequency diffe...

Method and apparatus for measurement of angular displacement

Optical apparatus for use with inteferometric measuring devices

Straightness interferometer system

Scales for position determining apparatus having marks of different...

Optical detection system with means for equalizing ambient light le...

Combined scale and interferometer

Optical measuring apparatus for use on machines

Patents Applicationslast 30 patents

LASER DEVICE

ROTATION DETECTION KIT

Dynamic Air Turbulence Compensation for Laser Measurement Apparatus

Optical readhead

Laser calibration apparatus

Frequency stabilized laser system comprising phase modulation of ba...

Motion detection and analysis