Reinhard Duregger

Person

Poing, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Testing a data store using an external test unit for generating tes...
- Patent number 7,428,662
- Issue date Sep 23, 2008
- Infineon Technologies AG
- Alexander Benedix
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory system for network broadcasting applications and method for...
- Patent number 7,305,525
- Issue date Dec 4, 2007
- Infineon Technologies, AG
- Alexander Benedix
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing a device and a test configuration including a de...
- Patent number 6,895,538
- Issue date May 17, 2005
- Infineon Technologies AG
- Alexander Benedix
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing semiconductor circuit devices
- Patent number 6,876,217
- Issue date Apr 5, 2005
- Infineon Technologies AG
- Stefan Dankowski
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit with temperature sensor and method for heating t...
- Patent number 6,798,706
- Issue date Sep 28, 2004
- Infineon Technologies AG
- Roland Barth
- G01 - MEASURING TESTING
Information Patent Grant
Connection of packaged integrated memory chips to a printed circuit...
- Patent number 6,798,051
- Issue date Sep 28, 2004
- Infineon Technologies AG
- Alexander Benedix
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Dynamic semiconductor memory with refresh and method for operating...
- Patent number 6,590,824
- Issue date Jul 8, 2003
- Infineon Technologies AG
- Alexander Benedix
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Memory system for network broadcasting applications and method for...
- Publication number 20050248994
- Publication date Nov 10, 2005
- Alexander Benedix
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method for testing a device and a test configuration including a de...
- Publication number 20040015313
- Publication date Jan 22, 2004
- Alexander Benedix
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated circuit with temperature sensor and method for heating t...
- Publication number 20030142724
- Publication date Jul 31, 2003
- Roland Barth
- G01 - MEASURING TESTING
Information Patent Application
Method for testing semiconductor circuit devices
- Publication number 20030071649
- Publication date Apr 17, 2003
- Stefan Dankowski
- G11 - INFORMATION STORAGE
Information Patent Application
Connection of packaged integrated memory chips to a printed circuit...
- Publication number 20030015777
- Publication date Jan 23, 2003
- Alexander Benedix
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dynamic semiconductor memory with refresh and method for operating...
- Publication number 20020141272
- Publication date Oct 3, 2002
- Alexander Benedix
- G11 - INFORMATION STORAGE

Reinhard Duregger

Person

Patents Grantslast 30 patents

Testing a data store using an external test unit for generating tes...

Memory system for network broadcasting applications and method for...

Method for testing a device and a test configuration including a de...

Method for testing semiconductor circuit devices

Integrated circuit with temperature sensor and method for heating t...

Connection of packaged integrated memory chips to a printed circuit...

Dynamic semiconductor memory with refresh and method for operating...

Patents Applicationslast 30 patents

Memory system for network broadcasting applications and method for...

Method for testing a device and a test configuration including a de...

Integrated circuit with temperature sensor and method for heating t...

Method for testing semiconductor circuit devices

Connection of packaged integrated memory chips to a printed circuit...

Dynamic semiconductor memory with refresh and method for operating...