Reinhold Schmitt

Person

Munchen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for testing an electrical component
- Patent number 6,459,283
- Issue date Oct 1, 2002
- Advantest Corp.
- Jürgen Frosien
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically compensated objective lens-detection device and method
- Patent number 6,232,601
- Issue date May 15, 2001
- Advantest Corporation
- Reinhold Schmitt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical unit
- Patent number 6,051,838
- Issue date Apr 18, 2000
- ACT Advanced Circuit Testing Gesellschaft fur Testsystementwicklung
- Jurgen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deflection system
- Patent number 5,847,399
- Issue date Dec 8, 1998
- ACT Advanced Circuit Testing Gesellschaft fur Testsystementwicklung mbH
- Reinhold Schmitt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for particle beam testing of substrates for liquid crystal d...
- Patent number 5,414,374
- Issue date May 9, 1995
- Siemens Aktiengesellschaft
- Matthias Brunner
- G02 - OPTICS
Information Patent Grant
Method for particle beam testing of substrates for liquid crystal d...
- Patent number 5,371,459
- Issue date Dec 6, 1994
- Siemens Aktiengesellschaft
- Matthias Brunner
- G02 - OPTICS
Information Patent Grant
Particle beam testing method with countervoltage or retarding volta...
- Patent number 5,369,359
- Issue date Nov 29, 1994
- Siemens Aktiengesellschaft
- Reinhold Schmitt
- G01 - MEASURING TESTING
Information Patent Grant
Method for particle beam testing of substrates for liquid crystal d...
- Patent number 5,268,638
- Issue date Dec 7, 1993
- Siemens Aktiengesellschaft
- Matthias Brunner
- G02 - OPTICS
Information Patent Grant
Particle beam measuring method for non-contact testing of interconn...
- Patent number 4,985,681
- Issue date Jan 15, 1991
- Siemens Aktiengesellschaft
- Matthias Brunner
- G01 - MEASURING TESTING
Information Patent Grant
Circuit for image displacement in a particle beam apparatus indepen...
- Patent number 4,891,523
- Issue date Jan 2, 1990
- Siemens Aktiengesellschaft
- Reinhold Schmitt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for measuring time dependent signals with a pa...
- Patent number 4,748,407
- Issue date May 31, 1988
- Siemens Aktiengesellschaft
- Matthias Brunner
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement for testing micro interconnections and a method for ope...
- Patent number 4,587,481
- Issue date May 6, 1986
- Siemens Aktiengesellschaft
- Burkhard Lischke
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for suppressing disturbances in the measuremen...
- Patent number 4,539,477
- Issue date Sep 3, 1985
- Siemens Aktiengesellschaft
- Hans-Peter Feuerbaum
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for the regulation of a magnetic deflection system
- Patent number 4,380,703
- Issue date Apr 19, 1983
- Siemens Aktiengesellschaft
- Reinhold Schmitt
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
ADJUSTABLE APERTURE ELEMENT FOR PARTICLE BEAM DEVICE, METHOD OF OPE...
- Publication number 20080135786
- Publication date Jun 12, 2008
- Stefan Lanio
- H01 - BASIC ELECTRIC ELEMENTS

Reinhold Schmitt

Person

Patents Grantslast 30 patents

Method and system for testing an electrical component

Dynamically compensated objective lens-detection device and method

Optical unit

Deflection system

Method for particle beam testing of substrates for liquid crystal d...

Method for particle beam testing of substrates for liquid crystal d...

Particle beam testing method with countervoltage or retarding volta...

Method for particle beam testing of substrates for liquid crystal d...

Particle beam measuring method for non-contact testing of interconn...

Circuit for image displacement in a particle beam apparatus indepen...

Method and apparatus for measuring time dependent signals with a pa...

Arrangement for testing micro interconnections and a method for ope...

Method and apparatus for suppressing disturbances in the measuremen...

Method and device for the regulation of a magnetic deflection system

Patents Applicationslast 30 patents

ADJUSTABLE APERTURE ELEMENT FOR PARTICLE BEAM DEVICE, METHOD OF OPE...