Reuben Quintanilla

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for declusturing semiconductor defect data
- Patent number 5,831,865
- Issue date Nov 3, 1998
- Advanced Micro Devices, Inc.
- Alan Berezin
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for automated die yield prediction in semiconduct...
- Patent number 5,777,901
- Issue date Jul 7, 1998
- Advanced Micro Devices, Inc.
- Alan Berezin
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for declustering semiconductor defect data
- Patent number 5,649,169
- Issue date Jul 15, 1997
- Advanced Micro Devices, Inc.
- Alan Berezin
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for automated analysis of semiconductor defect data
- Patent number 5,539,752
- Issue date Jul 23, 1996
- Advanced Micro Devices, Inc.
- Alan Berezin
- H01 - BASIC ELECTRIC ELEMENTS