Reynaldo M. Rincon

Person

Richardson, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Cantilever probe card
- Patent number 7,679,383
- Issue date Mar 16, 2010
- SV Probe Pte. Ltd.
- Lich Thanh Tran
- G01 - MEASURING TESTING
Information Patent Grant
Multiple-chip probe and universal tester contact assemblage
- Patent number 7,026,833
- Issue date Apr 11, 2006
- Texas Instruments Incorporated
- Reynaldo M. Rincon
- G01 - MEASURING TESTING
Information Patent Grant
Multiple-chip probe and universal tester contact assemblage
- Patent number 6,970,005
- Issue date Nov 29, 2005
- Texas Instruments Incorporated
- Reynaldo M. Rincon
- G01 - MEASURING TESTING
Information Patent Grant
Multiple contact vertical probe solution enabling Kelvin connection...
- Patent number 6,911,834
- Issue date Jun 28, 2005
- Texas Instruments Incorporated
- Scott W. Mitchell
- G01 - MEASURING TESTING
Information Patent Grant
High density, area array probe card apparatus
- Patent number 6,906,539
- Issue date Jun 14, 2005
- Texas Instruments Incorporated
- Lester Wilson
- G01 - MEASURING TESTING
Information Patent Grant
Combined electrical test and mechanical test system for thin film c...
- Patent number 6,752,012
- Issue date Jun 22, 2004
- Texas Instruments Incorporated
- Jerry J. Broz
- G01 - MEASURING TESTING
Information Patent Grant
High density probe card apparatus and method of manufacture
- Patent number 6,720,780
- Issue date Apr 13, 2004
- Texas Instruments Incorporated
- Reynaldo M. Rincon
- G01 - MEASURING TESTING
Information Patent Grant
Probe card with contact apparatus and method of manufacture
- Patent number 6,636,063
- Issue date Oct 21, 2003
- Texas Instruments Incorporated
- Richard W. Arnold
- G01 - MEASURING TESTING
Information Patent Grant
Approach to structurally reinforcing the mechanical performance of...
- Patent number 6,586,839
- Issue date Jul 1, 2003
- Texas Instruments Incorporated
- Michael F. Chisholm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for maximizing interconnection integrity and reliability bet...
- Patent number 5,981,370
- Issue date Nov 9, 1999
- Texas Instruments Incorporated
- Reynaldo M. Rincon
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Cantilever probe card
- Publication number 20080204062
- Publication date Aug 28, 2008
- Lich Thanh Tran
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE-CHIP PROBE AND UNIVERSAL TESTER CONTACT ASSEMBLAGE
- Publication number 20060033516
- Publication date Feb 16, 2006
- Reynaldo M. Rincon
- G01 - MEASURING TESTING
Information Patent Application
High density, area array probe card apparatus
- Publication number 20050140382
- Publication date Jun 30, 2005
- Lester Wilson
- G01 - MEASURING TESTING
Information Patent Application
High density probe card apparatus and method of manufacture
- Publication number 20040169521
- Publication date Sep 2, 2004
- Reynaldo M. Rincon
- G01 - MEASURING TESTING
Information Patent Application
Combined electrical test and mechanical test system for thin film c...
- Publication number 20030140684
- Publication date Jul 31, 2003
- Jerry J. Broz
- G01 - MEASURING TESTING
Information Patent Application
Multiple contact vertical probe solution enabling kelvin connection...
- Publication number 20030141883
- Publication date Jul 31, 2003
- Scott W. Mitchell
- G01 - MEASURING TESTING
Information Patent Application
Low cost area array probe for circuits having solder-ball contacts...
- Publication number 20030116346
- Publication date Jun 26, 2003
- James Allam Forster
- G01 - MEASURING TESTING
Information Patent Application
Micromechanical device contact terminals free of particle generation
- Publication number 20030107137
- Publication date Jun 12, 2003
- Roger J. Stierman
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Dual plane probe card assembly and method of manufacture
- Publication number 20030094962
- Publication date May 22, 2003
- Reynaldo M. Rincon
- G01 - MEASURING TESTING
Information Patent Application
Probe card with contact apparatus and method of manufacture
- Publication number 20030062915
- Publication date Apr 3, 2003
- Richard W. Arnold
- G01 - MEASURING TESTING
Information Patent Application
Multiple-chip probe and universal tester contact assemblage
- Publication number 20020043980
- Publication date Apr 18, 2002
- Reynaldo M. Rincon
- G01 - MEASURING TESTING
Information Patent Application
High density probe card apparatus and method of manufacture
- Publication number 20020027443
- Publication date Mar 7, 2002
- Reynaldo M. Rincon
- G01 - MEASURING TESTING
Information Patent Application
Novel approach to structurally reinforcing the mechanical performan...
- Publication number 20020025417
- Publication date Feb 28, 2002
- Michael F. Chisholm
- B32 - LAYERED PRODUCTS
Information Patent Application
High density, area array probe card apparatus
- Publication number 20020008529
- Publication date Jan 24, 2002
- Lester Wilson
- G01 - MEASURING TESTING

Reynaldo M. Rincon

Person

Patents Grantslast 30 patents

Cantilever probe card

Multiple-chip probe and universal tester contact assemblage

Multiple-chip probe and universal tester contact assemblage

Multiple contact vertical probe solution enabling Kelvin connection...

High density, area array probe card apparatus

Combined electrical test and mechanical test system for thin film c...

High density probe card apparatus and method of manufacture

Probe card with contact apparatus and method of manufacture

Approach to structurally reinforcing the mechanical performance of...

Method for maximizing interconnection integrity and reliability bet...

Patents Applicationslast 30 patents

Cantilever probe card

MULTIPLE-CHIP PROBE AND UNIVERSAL TESTER CONTACT ASSEMBLAGE

High density, area array probe card apparatus

High density probe card apparatus and method of manufacture

Combined electrical test and mechanical test system for thin film c...

Multiple contact vertical probe solution enabling kelvin connection...

Low cost area array probe for circuits having solder-ball contacts...

Micromechanical device contact terminals free of particle generation

Dual plane probe card assembly and method of manufacture

Probe card with contact apparatus and method of manufacture

Multiple-chip probe and universal tester contact assemblage

High density probe card apparatus and method of manufacture

Novel approach to structurally reinforcing the mechanical performan...

High density, area array probe card apparatus