Ricardo Pureza Coimbra

Person

Campinas, BR

People

Patents Grantslast 30 patents

Information Patent Grant
Self-turn-on temperature detector circuit
- Patent number 11,867,571
- Issue date Jan 9, 2024
- NXP B.V.
- Ricardo Pureza Coimbra
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Temperature detection circuit
- Patent number 11,774,297
- Issue date Oct 3, 2023
- NXP USA, INC.
- Ricardo Pureza Coimbra
- G01 - MEASURING TESTING
Information Patent Grant
Circuits and methods for voltage measurement
- Patent number 11,733,277
- Issue date Aug 22, 2023
- NXP B.V.
- Ricardo Pureza Coimbra
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Low power relaxation oscillator circuit
- Patent number 11,689,157
- Issue date Jun 27, 2023
- NXP B.V.
- Ricardo Pureza Coimbra
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Sample and hold circuit for current
- Patent number 11,521,693
- Issue date Dec 6, 2022
- NXP B.V.
- Ricardo Pureza Coimbra
- G11 - INFORMATION STORAGE
Information Patent Grant
Low power comparator
- Patent number 11,374,559
- Issue date Jun 28, 2022
- NXP USA, INC.
- Ricardo Pureza Coimbra
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Crystal oscillator circuit and method of operation
- Patent number 11,368,126
- Issue date Jun 21, 2022
- NXP B.V.
- Ricardo Pureza Coimbra
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Bandgap voltage regulator
- Patent number 11,353,910
- Issue date Jun 7, 2022
- NXP B.V.
- Sanjay Kumar Wadhwa
- G05 - CONTROLLING REGULATING
Information Patent Grant
Voltage level-shifter
- Patent number 11,251,780
- Issue date Feb 15, 2022
- NXP B.V.
- Ricardo Pureza Coimbra
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Temperature detection circuitry
- Patent number 11,125,629
- Issue date Sep 21, 2021
- NXP USA, INC.
- Ricardo Pureza Coimbra
- G05 - CONTROLLING REGULATING
Information Patent Grant
Clock generation
- Patent number 11,128,306
- Issue date Sep 21, 2021
- NXP USA, INC.
- Stefano Pietri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Capless voltage regulator with adaptative compensation
- Patent number 11,106,231
- Issue date Aug 31, 2021
- NXP USA, INC.
- Vitor Moreira Gomes
- G05 - CONTROLLING REGULATING
Information Patent Grant
Bias regulation system
- Patent number 11,043,893
- Issue date Jun 22, 2021
- NXP USA, INC.
- Marcos Mauricio Pelicia
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Low power crystal oscillator
- Patent number 10,819,279
- Issue date Oct 27, 2020
- NXP USA, INC.
- Juan Camilo Monsalve
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Self-referenced, high-accuracy temperature sensors
- Patent number 10,712,210
- Issue date Jul 14, 2020
- NXP USA, INC.
- Ricardo Pureza Coimbra
- G01 - MEASURING TESTING
Information Patent Grant
Back-biasing regulation system and method for integrated circuits
- Patent number 10,658,927
- Issue date May 19, 2020
- NXP USA, INC.
- Marcos Mauricio Pelicia
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Bandgap reference voltage circuitry
- Patent number 10,429,879
- Issue date Oct 1, 2019
- NXP USA, INC.
- Ricardo Pureza Coimbra
- G05 - CONTROLLING REGULATING
Information Patent Grant
Back bias regulator circuit and method therefor
- Patent number 10,394,264
- Issue date Aug 27, 2019
- NXP USA, INC.
- Ricardo Pureza Coimbra
- G05 - CONTROLLING REGULATING
Information Patent Grant
Rail-to-rail source follower
- Patent number 10,205,423
- Issue date Feb 12, 2019
- NXP USA, INC.
- Pedro B. Zanetta
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Low-dropout regulator with pole-zero tracking frequency compensation
- Patent number 10,156,861
- Issue date Dec 18, 2018
- NXP USA, INC.
- Ricardo Coimbra
- G05 - CONTROLLING REGULATING
Information Patent Grant
Symmetrical positive and negative reference voltage generation
- Patent number 9,785,177
- Issue date Oct 10, 2017
- NXP USA, INC.
- Ricardo Coimbra
- G05 - CONTROLLING REGULATING
Information Patent Grant
Low power circuit for amplifying a voltage without using resistors
- Patent number 9,641,129
- Issue date May 2, 2017
- NXP USA, INC.
- Ricardo Pureza Coimbra
- G05 - CONTROLLING REGULATING
Information Patent Grant
Rail-to-rail follower circuits
- Patent number 9,467,107
- Issue date Oct 11, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Ricardo P. Coimbra
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Production test trimming acceleration
- Patent number 9,356,590
- Issue date May 31, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Edevaldo Pereira da Silva
- G01 - MEASURING TESTING
Information Patent Grant
Production-test die temperature measurement method and apparatus
- Patent number 9,310,261
- Issue date Apr 12, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Ricardo P. Coimbra
- G01 - MEASURING TESTING
Information Patent Grant
Metal-oxide-semiconductor (MOS) voltage divider with dynamic impeda...
- Patent number 9,194,890
- Issue date Nov 24, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Ricardo P. Coimbra
- G01 - MEASURING TESTING
Information Patent Grant
Production-test die temperature measurement
- Patent number 9,074,943
- Issue date Jul 7, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Ricardo Pureza Coimbra
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically biased output structure
- Patent number 8,890,612
- Issue date Nov 18, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Ricardo Pureza Coimbra
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Programmable temperature sensing circuit for an integrated circuit
- Patent number 8,432,214
- Issue date Apr 30, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Alfredo Olmos
- G01 - MEASURING TESTING
Information Patent Grant
Die temperature sensor circuit
- Patent number 8,378,735
- Issue date Feb 19, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Edevaldo Pereira Da Silva
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CIRCUITS AND METHODS FOR VOLTAGE MEASUREMENT
- Publication number 20230176097
- Publication date Jun 8, 2023
- NXP B.V.
- Ricardo Pureza Coimbra
- G01 - MEASURING TESTING
Information Patent Application
Self-Turn-On Temperature Detector Circuit
- Publication number 20230108765
- Publication date Apr 6, 2023
- NXP B.V.
- Ricardo Pureza Coimbra
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
LOW POWER RELAXATION OSCILLATOR CIRCUIT
- Publication number 20230071036
- Publication date Mar 9, 2023
- NXP B.V.
- Ricardo Pureza Coimbra
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SAMPLE AND HOLD CIRCUIT FOR CURRENT
- Publication number 20220254424
- Publication date Aug 11, 2022
- NXP B.V.
- Ricardo Pureza Coimbra
- G11 - INFORMATION STORAGE
Information Patent Application
TEMPERATURE DETECTION CIRCUIT
- Publication number 20210396597
- Publication date Dec 23, 2021
- NXP USA, Inc.
- Ricardo Pureza Coimbra
- G01 - MEASURING TESTING
Information Patent Application
LOW POWER COMPARATOR
- Publication number 20210359673
- Publication date Nov 18, 2021
- NXP USA, Inc.
- Ricardo Pureza Coimbra
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEMPERATURE DETECTION CIRCUITRY
- Publication number 20200173862
- Publication date Jun 4, 2020
- NXP USA, Inc.
- Ricardo Pureza COIMBRA
- G05 - CONTROLLING REGULATING
Information Patent Application
BACK BIAS REGULATOR CIRCUIT AND METHOD THEREFOR
- Publication number 20190250656
- Publication date Aug 15, 2019
- NXP USA, Inc.
- Ricardo Pureza Coimbra
- G05 - CONTROLLING REGULATING
Information Patent Application
SELF-REFERENCED, HIGH-ACCURACY TEMPERATURE SENSORS
- Publication number 20190204164
- Publication date Jul 4, 2019
- NXP USA, Inc.
- Ricardo Pureza Coimbra
- G01 - MEASURING TESTING
Information Patent Application
Rail-To-Rail Source Follower
- Publication number 20190052228
- Publication date Feb 14, 2019
- NXP USA, Inc.
- Pedro B. Zanetta
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Low-Dropout Regulator with Pole-Zero Tracking Frequency Compensation
- Publication number 20180024580
- Publication date Jan 25, 2018
- NXP B.V.
- Ricardo Coimbra
- G05 - CONTROLLING REGULATING
Information Patent Application
LOW POWER CIRCUIT FOR AMPLIFYING A VOLTAGE WITHOUT USING RESISTORS
- Publication number 20170077872
- Publication date Mar 16, 2017
- FREESCALE SEMICONDUCTOR, INC.
- Ricardo Pureza COIMBRA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PRODUCTION TEST TRIMMING ACCELERATION
- Publication number 20160173076
- Publication date Jun 16, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Edevaldo Pereira da Silva
- G01 - MEASURING TESTING
Information Patent Application
RAIL-TO-RAIL FOLLOWER CIRCUITS
- Publication number 20150256135
- Publication date Sep 10, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Ricardo P. Coimbra
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PRODUCTION-TEST DIE TEMPERATURE MEASUREMENT METHOD AND APPARATUS
- Publication number 20150177075
- Publication date Jun 25, 2015
- FREESCALE SEMICONDUCTOR, INC.
- RICARDO P. COIMBRA
- G01 - MEASURING TESTING
Information Patent Application
METAL-OXIDE-SEMICONDUCTOR (MOS) VOLTAGE DIVIDER WITH DYNAMIC IMPEDA...
- Publication number 20140333367
- Publication date Nov 13, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Ricardo P. Coimbra
- G01 - MEASURING TESTING
Information Patent Application
PRODUCTION-TEST DIE TEMPERATURE MEASUREMENT
- Publication number 20140119405
- Publication date May 1, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Ricardo Pureza COIMBRA
- G01 - MEASURING TESTING
Information Patent Application
DYNAMICALLY BIASED OUTPUT STRUCTURE
- Publication number 20140111278
- Publication date Apr 24, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Ricardo Pureza COIMBRA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PROGRAMMABLE TEMPERATURE SENSING CIRCUIT FOR AN INTEGRATED CIRCUIT
- Publication number 20120242398
- Publication date Sep 27, 2012
- Alfredo Olmos
- G01 - MEASURING TESTING
Information Patent Application
DIE TEMPERATURE SENSOR CIRCUIT
- Publication number 20120133422
- Publication date May 31, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Edevaldo Pereira da Silva, JR.
- G01 - MEASURING TESTING

Ricardo Pureza Coimbra

Person

Patents Grantslast 30 patents

Self-turn-on temperature detector circuit

Temperature detection circuit

Circuits and methods for voltage measurement

Low power relaxation oscillator circuit

Sample and hold circuit for current

Low power comparator

Crystal oscillator circuit and method of operation

Bandgap voltage regulator

Voltage level-shifter

Temperature detection circuitry

Clock generation

Capless voltage regulator with adaptative compensation

Bias regulation system

Low power crystal oscillator

Self-referenced, high-accuracy temperature sensors

Back-biasing regulation system and method for integrated circuits

Bandgap reference voltage circuitry

Back bias regulator circuit and method therefor

Rail-to-rail source follower

Low-dropout regulator with pole-zero tracking frequency compensation

Symmetrical positive and negative reference voltage generation

Low power circuit for amplifying a voltage without using resistors

Rail-to-rail follower circuits

Production test trimming acceleration

Production-test die temperature measurement method and apparatus

Metal-oxide-semiconductor (MOS) voltage divider with dynamic impeda...

Production-test die temperature measurement

Dynamically biased output structure

Programmable temperature sensing circuit for an integrated circuit

Die temperature sensor circuit

Patents Applicationslast 30 patents

CIRCUITS AND METHODS FOR VOLTAGE MEASUREMENT

Self-Turn-On Temperature Detector Circuit

LOW POWER RELAXATION OSCILLATOR CIRCUIT

SAMPLE AND HOLD CIRCUIT FOR CURRENT

TEMPERATURE DETECTION CIRCUIT

LOW POWER COMPARATOR

TEMPERATURE DETECTION CIRCUITRY

BACK BIAS REGULATOR CIRCUIT AND METHOD THEREFOR

SELF-REFERENCED, HIGH-ACCURACY TEMPERATURE SENSORS

Rail-To-Rail Source Follower

Low-Dropout Regulator with Pole-Zero Tracking Frequency Compensation

LOW POWER CIRCUIT FOR AMPLIFYING A VOLTAGE WITHOUT USING RESISTORS

PRODUCTION TEST TRIMMING ACCELERATION

RAIL-TO-RAIL FOLLOWER CIRCUITS

PRODUCTION-TEST DIE TEMPERATURE MEASUREMENT METHOD AND APPARATUS

METAL-OXIDE-SEMICONDUCTOR (MOS) VOLTAGE DIVIDER WITH DYNAMIC IMPEDA...

PRODUCTION-TEST DIE TEMPERATURE MEASUREMENT

DYNAMICALLY BIASED OUTPUT STRUCTURE

PROGRAMMABLE TEMPERATURE SENSING CIRCUIT FOR AN INTEGRATED CIRCUIT

DIE TEMPERATURE SENSOR CIRCUIT