Rich Ackerman

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Wilsonville, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Field triage of EOS failures in semiconductor devices
- Patent number 9,939,488
- Issue date Apr 10, 2018
- Teseda Corporation
- Joseph M. Salazar
- G01 - MEASURING TESTING
Information Patent Grant
Scan chain fault diagnosis
- Patent number 8,892,972
- Issue date Nov 18, 2014
- Teseda Corporation
- Rich Ackerman
- G01 - MEASURING TESTING
Information Patent Grant
Scan chain fault diagnosis
- Patent number 8,560,904
- Issue date Oct 15, 2013
- Teseda Corporation
- Rich Ackerman
- G01 - MEASURING TESTING
Information Patent Grant
Scan chain fault diagnosis
- Patent number 8,412,991
- Issue date Apr 2, 2013
- Teseda Corporation
- Rich Ackerman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FIELD TRIAGE OF EOS FAILURES IN SEMICONDUCTOR DEVICES
- Publication number 20150149106
- Publication date May 28, 2015
- TESEDA CORPORATION
- Joseph M. Salazar
- G01 - MEASURING TESTING
Information Patent Application
SCAN CHAIN FAULT DIAGNOSIS
- Publication number 20140115412
- Publication date Apr 24, 2014
- TESEDA CORPORATION
- Rich Ackerman
- G01 - MEASURING TESTING
Information Patent Application
SCAN CHAIN FAULT DIAGNOSIS
- Publication number 20130219237
- Publication date Aug 22, 2013
- TESEDA CORPORATION
- Rich Ackerman
- G01 - MEASURING TESTING
Information Patent Application
Scan Chain Fault Diagnosis
- Publication number 20130061103
- Publication date Mar 7, 2013
- TESEDA CORPORATION
- Rich Ackerman
- G01 - MEASURING TESTING