TREA

Richard D. Moore

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  • Hopewell Junction, NY, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Electron beam nano-metrology system
    • Patent number 5,585,629
    • Issue date Dec 17, 1996
    • International Business Machines Corporation
    • Samuel K. Doran
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Pattern inspection tool - method and apparatus
    • Patent number 4,365,163
    • Issue date Dec 21, 1982
    • International Business Machines Corporation
    • Donald E. Davis
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY