Richard G. Murphy

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Binghamton, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for in-situ testing of integrated circuit chips
- Patent number 6,414,509
- Issue date Jul 2, 2002
- International Business Machines Corporation
- Anilkumar Chinuprasad Bhatt
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a decoupling capacitor structure
- Patent number 5,799,379
- Issue date Sep 1, 1998
- International Business Machines Corporation
- John Galvagni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Decoupling capacitor structure
- Patent number 5,517,385
- Issue date May 14, 1996
- International Business Machines Corporation
- John Galvagni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for testing of integrated circuit chips
- Patent number 5,420,520
- Issue date May 30, 1995
- International Business Machines Corporation
- Morris Anschel
- G01 - MEASURING TESTING