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Richard L. Sands
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Rochester, MN, US
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Patents Grants
last 30 patents
Information
Patent Grant
Hard drive test fixture
Patent number
7,232,101
Issue date
Jun 19, 2007
Pemstar, Inc.
Donald Wanek
G11 - INFORMATION STORAGE
Information
Patent Grant
Environmental test chamber and a carrier for use therein
Patent number
7,070,323
Issue date
Jul 4, 2006
Pemstar, Inc.
Donald L. Wanek
G01 - MEASURING TESTING
Information
Patent Grant
Hard drive test fixture
Patent number
6,806,700
Issue date
Oct 19, 2004
Pemstar, Inc.
Donald J. Wanek
G11 - INFORMATION STORAGE
Information
Patent Grant
Environmental test chamber
Patent number
6,679,128
Issue date
Jan 20, 2004
Pemstar, Inc.
Donald J. Wanek
G01 - MEASURING TESTING
Information
Patent Grant
Environmental test chamber and a carrier for use therein
Patent number
6,526,841
Issue date
Mar 4, 2003
Pemstar, Inc.
Donald L. Wanek
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Hard drive test fixture
Publication number
20050225338
Publication date
Oct 13, 2005
Richard Lyle Sands
G11 - INFORMATION STORAGE
Information
Patent Application
Hard drive test fixture
Publication number
20050116702
Publication date
Jun 2, 2005
Donald J. Wanek
G11 - INFORMATION STORAGE
Information
Patent Application
Hard drive test fixture
Publication number
20050109131
Publication date
May 26, 2005
Donald Wanek
G11 - INFORMATION STORAGE
Information
Patent Application
Hard drive test fixture
Publication number
20030150284
Publication date
Aug 14, 2003
Donald J. Wanek
G11 - INFORMATION STORAGE
Information
Patent Application
Environmental test chamber and a carrier for use therein
Publication number
20030121337
Publication date
Jul 3, 2003
Donald J. Wanek
G01 - MEASURING TESTING
Information
Patent Application
Hard drive test fixture
Publication number
20020174732
Publication date
Nov 28, 2002
Donald J. Wanek
G11 - INFORMATION STORAGE
Information
Patent Application
Environmental test chamber and a carrier for use therein
Publication number
20010035058
Publication date
Nov 1, 2001
Donald J. Wanek
G01 - MEASURING TESTING