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Richard Stallcup
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Frisco, TX, US
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Patents Grants
last 30 patents
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Patent Grant
Probe-based data collection system with adaptive mode of probing co...
Patent number
9,891,280
Issue date
Feb 13, 2018
FEI EFA, Inc.
Vladimir A. Ukraintsev
G01 - MEASURING TESTING
Information
Patent Grant
System and method for non-contact microscopy for three-dimensional...
Patent number
9,506,947
Issue date
Nov 29, 2016
DCG Systems, Inc.
Vladimir A. Ukraintsev
G01 - MEASURING TESTING
Information
Patent Grant
Probe-based data collection system with adaptive mode of probing
Patent number
9,057,740
Issue date
Jun 16, 2015
DCG Systems, Inc.
Vladimir A. Ukraintsev
G01 - MEASURING TESTING
Information
Patent Grant
System and method for non-contact microscopy for three-dimensional...
Patent number
8,895,923
Issue date
Nov 25, 2014
DCG Systems, Inc.
Vladimir A. Ukraintsev
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
AUTOMATED PROBE LANDING
Publication number
20230258707
Publication date
Aug 17, 2023
Innovatum Instruments Inc.
Richard E Stallcup
G01 - MEASURING TESTING
Information
Patent Application
PROBE TIP X-Y LOCATION IDENTIFICATION USING A CHARGED PARTICLE BEAM
Publication number
20230168274
Publication date
Jun 1, 2023
Innovatum Instruments Inc.
Richard E Stallcup
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PROBE-BASED DATA COLLECTION SYSTEM WITH ADAPTIVE MODE OF PROBING CO...
Publication number
20170082685
Publication date
Mar 23, 2017
DCG SYSTEMS, INC.
Vladimir A. Ukraintsev
G01 - MEASURING TESTING
Information
Patent Application
Particle Beam Heating to Identify Defects
Publication number
20160370425
Publication date
Dec 22, 2016
DCG SYSTEMS, INC.
Richard Stallcup
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR NON-CONTACT MICROSCOPY FOR THREE-DIMENSIONAL...
Publication number
20150301078
Publication date
Oct 22, 2015
DCG SYSTEMS, INC.
Vladimir A. Ukraintsev
G01 - MEASURING TESTING
Information
Patent Application
PROBE-BASED DATA COLLECTION SYSTEM WITH ADAPTIVE MODE OF PROBING
Publication number
20150168444
Publication date
Jun 18, 2015
DCG SYSTEMS, INC.
Vladimir A. Ukraintsev
G01 - MEASURING TESTING
Information
Patent Application
PROBE-BASED DATA COLLECTION SYSTEM WITH ADAPTIVE MODE OF PROBING CO...
Publication number
20140380531
Publication date
Dec 25, 2014
Vladimir A. Ukraintsev
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR NON-CONTACT MICROSCOPY FOR THREE-DIMENSIONAL...
Publication number
20140143912
Publication date
May 22, 2014
Vladimir A. Ukraintsev
G01 - MEASURING TESTING