Robert J. Burke

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method of forming a field effect transistor having source/drain mat...
- Patent number 8,802,520
- Issue date Aug 12, 2014
- Micron Technology, Inc.
- Sanh D. Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of forming a field effect transistor
- Patent number 8,440,515
- Issue date May 14, 2013
- Micron Technology, Inc.
- Sanh D. Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vertical wrap-around-gate field-effect-transistor for high density,...
- Patent number 8,138,039
- Issue date Mar 20, 2012
- Micron Technology, Inc.
- Sanh D. Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vertical wrap-around-gate field-effect-transistor for high density,...
- Patent number 7,936,000
- Issue date May 3, 2011
- Micron Technology, Inc.
- Sanh D. Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vertical wrap-around-gate field-effect-transistor for high density,...
- Patent number 7,528,439
- Issue date May 5, 2009
- Micron Technology, Inc.
- Sanh D. Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process of forming a semiconductor assembly having a contact struct...
- Patent number 7,524,756
- Issue date Apr 28, 2009
- Micron Technology, Inc.
- Grant S. Huglin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming field effect transistor gate lines
- Patent number 7,470,576
- Issue date Dec 30, 2008
- Micron Technology, Inc.
- Sanh D. Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of forming a field effect transistor
- Patent number 7,465,616
- Issue date Dec 16, 2008
- Micron Technology, Inc.
- Sanh D. Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vertical wrap-around-gate field-effect-transistor for high density,...
- Patent number 7,374,990
- Issue date May 20, 2008
- Micron Technology, Inc.
- Sanh D. Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating a vertical wrap-around-gate field-effect-tran...
- Patent number 7,241,655
- Issue date Jul 10, 2007
- Micron Technology, Inc.
- Sanh D. Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cross diffusion barrier layer in polysilicon
- Patent number 7,214,613
- Issue date May 8, 2007
- Micron Technology, Inc.
- Sanh D. Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact structure and contact liner process
- Patent number 7,170,174
- Issue date Jan 30, 2007
- Micron Technology, Inc.
- Grant S. Huglin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cross diffusion barrier layer in polysilicon
- Patent number 7,166,896
- Issue date Jan 23, 2007
- Micron Technology, Inc.
- Sanh D. Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a field effect transistor
- Patent number 7,118,950
- Issue date Oct 10, 2006
- Micron Technology, Inc.
- Sanh D. Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods of forming a field effect transistor having source/drain ma...
- Patent number 7,071,043
- Issue date Jul 4, 2006
- Micron Technology, Inc.
- Sanh D. Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of forming field effect transistors
- Patent number 6,936,507
- Issue date Aug 30, 2005
- Micron Technology, Inc.
- Sanh D. Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Double sided container capacitor for DRAM cell array and method of...
- Patent number 6,599,799
- Issue date Jul 29, 2003
- Micron Technology, Inc.
- Sanh D. Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reflectance method for evaluating the surface characteristics of op...
- Patent number 6,594,013
- Issue date Jul 15, 2003
- Micron Technology, Inc.
- Randhir P. S. Thakur
- G01 - MEASURING TESTING
Information Patent Grant
Forming metal silicide resistant to subsequent thermal processing
- Patent number 6,537,910
- Issue date Mar 25, 2003
- Micron Technology, Inc.
- Robert Burke
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Double sided container capacitor for DRAM cell array and method of...
- Patent number 6,507,064
- Issue date Jan 14, 2003
- Micron Technology, Inc.
- Sanh D. Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reflectance method for evaluating the surface characteristics of op...
- Patent number 6,452,678
- Issue date Sep 17, 2002
- Micron Technology, Inc.
- Randhir P. S. Thakur
- G01 - MEASURING TESTING
Information Patent Grant
Reflectance method for evaluating the surface characteristics of op...
- Patent number 6,417,928
- Issue date Jul 9, 2002
- Micron Technology, Inc.
- Randhir P. S. Thakur
- G01 - MEASURING TESTING
Information Patent Grant
Reflectance method for evaluating the surface characteristics of op...
- Patent number 6,327,040
- Issue date Dec 4, 2001
- Micron Technology, Inc.
- Randhir P. S. Thakur
- G01 - MEASURING TESTING
Information Patent Grant
Methods of thermal processing and rapid thermal processing
- Patent number 6,287,927
- Issue date Sep 11, 2001
- Micron Technology, Inc.
- Robert Burke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reflectance method for evaluating the surface characteristics of op...
- Patent number 6,275,292
- Issue date Aug 14, 2001
- Micron Technology, Inc.
- Randhir P. S. Thakur
- G01 - MEASURING TESTING
Information Patent Grant
Forming metal silicide resistant to subsequent thermal processing
- Patent number 6,210,813
- Issue date Apr 3, 2001
- Micron Technology, Inc.
- Robert Burke
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Reflectance method for evaluating the surface characteristics of op...
- Patent number 6,195,163
- Issue date Feb 27, 2001
- Micron Technology, Inc.
- Randhir P. S. Thakur
- G01 - MEASURING TESTING
Information Patent Grant
Methods of thermal processing and rapid thermal processing
- Patent number 6,090,677
- Issue date Jul 18, 2000
- Micron Technology, Inc.
- Robert Burke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultraviolet light reflectance method for evaluating the surface cha...
- Patent number 5,825,498
- Issue date Oct 20, 1998
- Micron Technology, Inc.
- Randhir P. S. Thakur
- G01 - MEASURING TESTING
Information Patent Grant
Reflectance method for accurate process calibration in semiconducto...
- Patent number 5,783,804
- Issue date Jul 21, 1998
- Micron Technology, Inc.
- Robert James Burke
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
Method of Forming a Field Effect Transistor Having Source/Drain Mat...
- Publication number 20130230959
- Publication date Sep 5, 2013
- Micron Technology, Inc.
- Sanh D. Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VERTICAL WRAP-AROUND-GATE FIELD-EFFECT-TRANSISTOR FOR HIGH DENSITY,...
- Publication number 20110171796
- Publication date Jul 14, 2011
- Sanh D. Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VERTICAL WRAP-AROUND-GATE FIELD-EFFECT-TRANSISTOR FOR HIGH DENSITY,...
- Publication number 20090207649
- Publication date Aug 20, 2009
- Sanh D. Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method Of Forming A Field Effect Transistor
- Publication number 20080311719
- Publication date Dec 18, 2008
- Sanh D. Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VERTICAL WRAP-AROUND-GATE FIELD-EFFECT-TRANSISTOR FOR HIGH DENSITY,...
- Publication number 20070224753
- Publication date Sep 27, 2007
- Sanh D. Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of forming a field effect transistor
- Publication number 20070105323
- Publication date May 10, 2007
- Sanh D. Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Cross diffusion barrier layer in gate structure
- Publication number 20070102753
- Publication date May 10, 2007
- Micron Technology, Inc.
- Sanh D. Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Vertical wrap-around-gate field-effect-transistor for high density,...
- Publication number 20070048943
- Publication date Mar 1, 2007
- Sanh D. Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Contact structure and contact liner process
- Publication number 20060276035
- Publication date Dec 7, 2006
- Grant S. Huglin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods of forming field effect transistors and methods of forming...
- Publication number 20060258107
- Publication date Nov 16, 2006
- Sanh D. Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Contact structure and contact liner process
- Publication number 20060043429
- Publication date Mar 2, 2006
- Grant S. Huglin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Vertical wrap-around-gate field-effect-transistor for high density,...
- Publication number 20060046391
- Publication date Mar 2, 2006
- Sanh D. Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods of forming field effect transistors and methods of forming...
- Publication number 20050106795
- Publication date May 19, 2005
- Sanh D. Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of forming a field effect transistors
- Publication number 20050101075
- Publication date May 12, 2005
- Sanh D. Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of forming a field effect transistor
- Publication number 20050095756
- Publication date May 5, 2005
- Sanh D. Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS OF FORMING FIELD EFFECT TRANSISTORS AND METHODS OF FORMING...
- Publication number 20050095767
- Publication date May 5, 2005
- Sanh D. Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Cross diffusion barrier layer in polysilicon
- Publication number 20050032316
- Publication date Feb 10, 2005
- Micron Technology, Inc.
- Sanh D. Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Cross diffusion barrier layer in polysilicon
- Publication number 20040036119
- Publication date Feb 26, 2004
- Sanh D. Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods of forming field effect transistors, and methods of forming...
- Publication number 20040033646
- Publication date Feb 19, 2004
- Sanh D. Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Double sided container capacitor for DRAM cell array and method of...
- Publication number 20020109170
- Publication date Aug 15, 2002
- Sanh D. Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reflectance method for evaluating the surface characteristics of op...
- Publication number 20020067489
- Publication date Jun 6, 2002
- Micron Technology, Inc.
- Randhir P.S. Thakur
- G01 - MEASURING TESTING
Information Patent Application
Reflectance method for evaluating the surface characteristics of op...
- Publication number 20020003622
- Publication date Jan 10, 2002
- Randhir P.S. Thakur
- G01 - MEASURING TESTING
Information Patent Application
Reflectance method for evaluating the surface characteristics of op...
- Publication number 20010017698
- Publication date Aug 30, 2001
- Randhir P.S. Thakur
- G01 - MEASURING TESTING
Information Patent Application
Reflectance method for evaluating the surface characteristics of op...
- Publication number 20010008448
- Publication date Jul 19, 2001
- Randhir P.S. Thakur
- G01 - MEASURING TESTING

Robert J. Burke

Person

Patents Grantslast 30 patents

Method of forming a field effect transistor having source/drain mat...

Method of forming a field effect transistor

Vertical wrap-around-gate field-effect-transistor for high density,...

Vertical wrap-around-gate field-effect-transistor for high density,...

Vertical wrap-around-gate field-effect-transistor for high density,...

Process of forming a semiconductor assembly having a contact struct...

Methods of forming field effect transistor gate lines

Method of forming a field effect transistor

Vertical wrap-around-gate field-effect-transistor for high density,...

Method of fabricating a vertical wrap-around-gate field-effect-tran...

Cross diffusion barrier layer in polysilicon

Contact structure and contact liner process

Cross diffusion barrier layer in polysilicon

Method of forming a field effect transistor

Methods of forming a field effect transistor having source/drain ma...

Method of forming field effect transistors

Double sided container capacitor for DRAM cell array and method of...

Reflectance method for evaluating the surface characteristics of op...

Forming metal silicide resistant to subsequent thermal processing

Double sided container capacitor for DRAM cell array and method of...

Reflectance method for evaluating the surface characteristics of op...

Reflectance method for evaluating the surface characteristics of op...

Reflectance method for evaluating the surface characteristics of op...

Methods of thermal processing and rapid thermal processing

Reflectance method for evaluating the surface characteristics of op...

Forming metal silicide resistant to subsequent thermal processing

Reflectance method for evaluating the surface characteristics of op...

Methods of thermal processing and rapid thermal processing

Ultraviolet light reflectance method for evaluating the surface cha...

Reflectance method for accurate process calibration in semiconducto...

Patents Applicationslast 30 patents

Method of Forming a Field Effect Transistor Having Source/Drain Mat...

VERTICAL WRAP-AROUND-GATE FIELD-EFFECT-TRANSISTOR FOR HIGH DENSITY,...

VERTICAL WRAP-AROUND-GATE FIELD-EFFECT-TRANSISTOR FOR HIGH DENSITY,...

Method Of Forming A Field Effect Transistor

VERTICAL WRAP-AROUND-GATE FIELD-EFFECT-TRANSISTOR FOR HIGH DENSITY,...

Method of forming a field effect transistor

Cross diffusion barrier layer in gate structure

Vertical wrap-around-gate field-effect-transistor for high density,...

Contact structure and contact liner process

Methods of forming field effect transistors and methods of forming...

Contact structure and contact liner process

Vertical wrap-around-gate field-effect-transistor for high density,...

Methods of forming field effect transistors and methods of forming...

Method of forming a field effect transistors

Method of forming a field effect transistor

METHODS OF FORMING FIELD EFFECT TRANSISTORS AND METHODS OF FORMING...

Cross diffusion barrier layer in polysilicon

Cross diffusion barrier layer in polysilicon

Methods of forming field effect transistors, and methods of forming...

Double sided container capacitor for DRAM cell array and method of...

Reflectance method for evaluating the surface characteristics of op...

Reflectance method for evaluating the surface characteristics of op...

Reflectance method for evaluating the surface characteristics of op...

Reflectance method for evaluating the surface characteristics of op...