Robert L. Moreland

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Lothian, MD, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for measurement of dielectric constant of thin fi...
- Patent number 7,285,963
- Issue date Oct 23, 2007
- Solid State Measurements, Inc.
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Grant
Apertured probes for localized measurements of a material's complex...
- Patent number 6,959,481
- Issue date Nov 1, 2005
- Neocera, Inc.
- Robert L. Moreland
- G01 - MEASURING TESTING
Information Patent Grant
System and method for quantitative measurements of a material's com...
- Patent number 6,856,140
- Issue date Feb 15, 2005
- Neocera, Inc.
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Grant
Apertured probes for localized measurements of a material's...
- Patent number 6,680,617
- Issue date Jan 20, 2004
- Neocera, Inc.
- Robert L. Moreland
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for localized measurements of complex permittivity of a m...
- Patent number 6,597,185
- Issue date Jul 22, 2003
- Neocera, Inc.
- Vladimir Vladimirovich Talanov
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and system for measurement of dielectric constant of thin fi...
- Publication number 20050230619
- Publication date Oct 20, 2005
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Application
System and method for quantitative measurements of a material's com...
- Publication number 20040004484
- Publication date Jan 8, 2004
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Application
Apertured probes for localized measurements of a material's complex...
- Publication number 20030155934
- Publication date Aug 21, 2003
- Robert L. Moreland
- G01 - MEASURING TESTING
Information Patent Application
Apertured probes for localized measurements of a material's complex...
- Publication number 20030030449
- Publication date Feb 13, 2003
- Robert L. Moreland
- B82 - NANO-TECHNOLOGY