Robert W. Standley

Person

Chesterfield, MO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods for forming single crystal silicon ingots with improved res...
- Patent number 12,024,789
- Issue date Jul 2, 2024
- GlobalWafers Co., Ltd.
- Richard J. Phillips
- C30 - CRYSTAL GROWTH
Information Patent Grant
Radio frequency silicon on insulator structure with superior perfor...
- Patent number 11,942,360
- Issue date Mar 26, 2024
- GlobalWafers Co., Ltd.
- Michael R. Seacrist
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radio frequency silicon on insulator wafer platform with superior p...
- Patent number 11,887,885
- Issue date Jan 30, 2024
- GlobalWafers Co., Ltd.
- Michael R. Seacrist
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resistivity stabilization measurement of fat neck slabs for high re...
- Patent number 11,739,437
- Issue date Aug 29, 2023
- GlobalWafers Co., Ltd.
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Grant
Radio frequency silicon on insulator structure with superior perfor...
- Patent number 11,626,318
- Issue date Apr 11, 2023
- GlobalWafers Co., Ltd.
- Michael R. Seacrist
- C30 - CRYSTAL GROWTH
Information Patent Grant
Radio frequency silicon on insulator wafer platform with superior p...
- Patent number 11,532,501
- Issue date Dec 20, 2022
- GlobalWafers Co., Ltd.
- Michael R. Seacrist
- C30 - CRYSTAL GROWTH
Information Patent Grant
Radio frequency silicon on insulator structure with superior perfor...
- Patent number 11,075,109
- Issue date Jul 27, 2021
- GlobalWafers Co., Ltd.
- Michael R. Seacrist
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radio frequency silicon on insulator wafer platform with superior p...
- Patent number 10,943,813
- Issue date Mar 9, 2021
- GlobalWafers Co., Ltd.
- Michael R. Seacrist
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for forming single crystal silicon ingots with improved res...
- Patent number 10,920,337
- Issue date Feb 16, 2021
- GlobalWafers Co., Ltd.
- Richard J. Phillips
- C30 - CRYSTAL GROWTH
Information Patent Grant
Sample rod growth and resistivity measurement during single crystal...
- Patent number 10,793,969
- Issue date Oct 6, 2020
- GlobalWafers Co., Ltd.
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Grant
High resistivity silicon-on-insulator substrate comprising a charge...
- Patent number 10,796,945
- Issue date Oct 6, 2020
- GlobalWafers Co., Ltd.
- Qingmin Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for determining the resistivity of a polycrystalline silico...
- Patent number 10,781,532
- Issue date Sep 22, 2020
- GlobalWafers Co., Ltd.
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Grant
High resistivity silicon-on-insulator substrate comprising a charge...
- Patent number 10,403,541
- Issue date Sep 3, 2019
- GlobalWafers Co., Ltd.
- Qingmin Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resistivity silicon-on-insulator substrate comprising a charge...
- Patent number 10,224,233
- Issue date Mar 5, 2019
- GlobalWafers Co., Ltd.
- Qingmin Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for producing silicon on insulator structures having high r...
- Patent number 8,846,493
- Issue date Sep 30, 2014
- SunEdison Semiconductor Limited
- Jeffrey L. Libbert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for stripping the edge of a semiconductor wafer
- Patent number 8,735,261
- Issue date May 27, 2014
- MEMC Electronic Materials, Inc.
- Robert W. Standley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Modified susceptor for use in chemical vapor deposition process
- Patent number 6,652,650
- Issue date Nov 25, 2003
- MEMC Electronic Materials, Inc.
- Charles Chiun-Chieh Yang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Epitaxial silicon wafer free from autodoping and backside halo and...
- Patent number 6,596,095
- Issue date Jul 22, 2003
- MEMC Electronic Materials, Inc.
- Michael J. Ries
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Modified susceptor for use in chemical vapor deposition process
- Patent number 6,444,027
- Issue date Sep 3, 2002
- MEMC Electronic Materials, Inc.
- Charles Chiun-Chieh Yang
- C30 - CRYSTAL GROWTH
Information Patent Grant
Flattening process for epitaxial semiconductor wafers
- Patent number 6,030,887
- Issue date Feb 29, 2000
- MEMC Electronic Materials, Inc.
- Ankur H. Desai
- C30 - CRYSTAL GROWTH

Patents Applicationslast 30 patents

Information Patent Application
RESISTIVITY STABILIZATION MEASUREMENT OF FAT NECK SLABS FOR HIGH RE...
- Publication number 20230340690
- Publication date Oct 26, 2023
- GLOBALWAFERS CO., LTD.
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Application
RADIO FREQUENCY SILICON ON INSULATOR STRUCTURE WITH SUPERIOR PERFOR...
- Publication number 20230215759
- Publication date Jul 6, 2023
- GLOBALWAFERS CO., LTD.
- Michael R. Seacrist
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RADIO FREQUENCY SILICON ON INSULATOR WAFER PLATFORM WITH SUPERIOR P...
- Publication number 20230062816
- Publication date Mar 2, 2023
- GLOBALWAFERS CO., LTD.
- Michael R. Seacrist
- C30 - CRYSTAL GROWTH
Information Patent Application
RADIO FREQUENCY SILICON ON INSULATOR STRUCTURE WITH SUPERIOR PERFOR...
- Publication number 20210242075
- Publication date Aug 5, 2021
- GLOBALWAFERS CO., LTD.
- Michael R. Seacrist
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RADIO FREQUENCY SILICON ON INSULATOR WAFER PLATFORM WITH SUPERIOR P...
- Publication number 20210159114
- Publication date May 27, 2021
- GLOBALWAFERS CO., LTD.
- Michael R. Seacrist
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR FORMING SINGLE CRYSTAL SILICON INGOTS WITH IMPROVED RES...
- Publication number 20210071315
- Publication date Mar 11, 2021
- GLOBALWAFERS CO., LTD.
- Richard J. Phillips
- C30 - CRYSTAL GROWTH
Information Patent Application
RESISTIVITY STABILIZATION MEASUREMENT OF FAT NECK SLABS FOR HIGH RE...
- Publication number 20200208294
- Publication date Jul 2, 2020
- GLOBALWAFERS CO., LTD.
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Application
RADIO FREQUENCY SILICON ON INSULATOR STRUCTURE WITH SUPERIOR PERFOR...
- Publication number 20200020571
- Publication date Jan 16, 2020
- GLOBALWAFERS CO., LTD.
- Michael R. Seacrist
- C30 - CRYSTAL GROWTH
Information Patent Application
RADIO FREQUENCY SILICON ON INSULATOR WAFER PLATFORM WITH SUPERIOR P...
- Publication number 20200020766
- Publication date Jan 16, 2020
- GLOBALWAFERS CO., LTD.
- Michael R. Seacrist
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR DETERMINING THE RESISTIVITY OF A POLYCRYSTALLINE SILICO...
- Publication number 20200002835
- Publication date Jan 2, 2020
- Global Wafers Co., Ltd
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Application
SAMPLE ROD GROWTH AND RESISTIVITY MEASUREMENT DURING SINGLE CRYSTAL...
- Publication number 20200002836
- Publication date Jan 2, 2020
- Global Wafers Co., Ltd
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Application
HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE COMPRISING A CHARGE...
- Publication number 20190341296
- Publication date Nov 7, 2019
- GLOBALWAFERS CO., LTD.
- Qingmin Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE COMPRISING A CHARGE...
- Publication number 20180261496
- Publication date Sep 13, 2018
- SunEdison Semiconductor Limited (UEN201334164H)
- Qingmin Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR FORMING SINGLE CRYSTAL SILICON INGOTS WITH IMPROVED RES...
- Publication number 20180179660
- Publication date Jun 28, 2018
- SunEdison Semiconductor Limited (UEN201334164H)
- Richard J. Phillips
- C30 - CRYSTAL GROWTH
Information Patent Application
HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE COMPRISING A CHARGE...
- Publication number 20170358484
- Publication date Dec 14, 2017
- Qingmin Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON ON INSULATOR STRUCTURES HAVING HIGH RESISTIVITY REGIONS IN...
- Publication number 20120235283
- Publication date Sep 20, 2012
- MEMC Electronic Materials, Inc.
- Jeffrey L. Libbert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR PRODUCING SILICON ON INSULATOR STRUCTURES HAVING HIGH R...
- Publication number 20120238070
- Publication date Sep 20, 2012
- MEMC Electronic Materials, Inc.
- Jeffrey L. Libbert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR STRIPPING THE EDGE OF A SEMICONDUCTOR WAFER
- Publication number 20110223741
- Publication date Sep 15, 2011
- MEMC Electronic Materials, Inc.
- Robert W. Standley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PROCESSING A SILICON-ON-INSULATOR STRUCTURE
- Publication number 20100130021
- Publication date May 27, 2010
- MEMC Electronic Materials, Inc.
- Michael J. Ries
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Internally gettered heteroepitaxial semiconductor wafers and method...
- Publication number 20060138601
- Publication date Jun 29, 2006
- MEMC Electronic Materials, Inc.
- Michael R. Seacrist
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for the preparation of a semiconductor substrate with a non-...
- Publication number 20060075960
- Publication date Apr 13, 2006
- MEMC Electronic Materials, Inc.
- Marco Borgini
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Modified susceptor for use in chemical vapor deposition process
- Publication number 20030041799
- Publication date Mar 6, 2003
- MEMC Electronic Materials, Inc.
- Charles Chiun-Chieh Yang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Method for the preparation of a semiconductor substrate with a non-...
- Publication number 20020179006
- Publication date Dec 5, 2002
- MEMC Electronic Materials, Inc.
- Marco Borgini
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor wafer manufacturing process
- Publication number 20020127766
- Publication date Sep 12, 2002
- MEMC Electronic Materials, Inc.
- Michael J. Ries
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Epitaxial silicon wafer free from autodoping and backside halo and...
- Publication number 20010037761
- Publication date Nov 8, 2001
- Michael J. Ries
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Robert W. Standley

Person

Patents Grantslast 30 patents

Methods for forming single crystal silicon ingots with improved res...

Radio frequency silicon on insulator structure with superior perfor...

Radio frequency silicon on insulator wafer platform with superior p...

Resistivity stabilization measurement of fat neck slabs for high re...

Radio frequency silicon on insulator structure with superior perfor...

Radio frequency silicon on insulator wafer platform with superior p...

Radio frequency silicon on insulator structure with superior perfor...

Radio frequency silicon on insulator wafer platform with superior p...

Methods for forming single crystal silicon ingots with improved res...

Sample rod growth and resistivity measurement during single crystal...

High resistivity silicon-on-insulator substrate comprising a charge...

Methods for determining the resistivity of a polycrystalline silico...

High resistivity silicon-on-insulator substrate comprising a charge...

High resistivity silicon-on-insulator substrate comprising a charge...

Methods for producing silicon on insulator structures having high r...

Method and system for stripping the edge of a semiconductor wafer

Modified susceptor for use in chemical vapor deposition process

Epitaxial silicon wafer free from autodoping and backside halo and...

Modified susceptor for use in chemical vapor deposition process

Flattening process for epitaxial semiconductor wafers

Patents Applicationslast 30 patents

RESISTIVITY STABILIZATION MEASUREMENT OF FAT NECK SLABS FOR HIGH RE...

RADIO FREQUENCY SILICON ON INSULATOR STRUCTURE WITH SUPERIOR PERFOR...

RADIO FREQUENCY SILICON ON INSULATOR WAFER PLATFORM WITH SUPERIOR P...

RADIO FREQUENCY SILICON ON INSULATOR STRUCTURE WITH SUPERIOR PERFOR...

RADIO FREQUENCY SILICON ON INSULATOR WAFER PLATFORM WITH SUPERIOR P...

METHODS FOR FORMING SINGLE CRYSTAL SILICON INGOTS WITH IMPROVED RES...

RESISTIVITY STABILIZATION MEASUREMENT OF FAT NECK SLABS FOR HIGH RE...

RADIO FREQUENCY SILICON ON INSULATOR STRUCTURE WITH SUPERIOR PERFOR...

RADIO FREQUENCY SILICON ON INSULATOR WAFER PLATFORM WITH SUPERIOR P...

METHODS FOR DETERMINING THE RESISTIVITY OF A POLYCRYSTALLINE SILICO...

SAMPLE ROD GROWTH AND RESISTIVITY MEASUREMENT DURING SINGLE CRYSTAL...

HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE COMPRISING A CHARGE...

HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE COMPRISING A CHARGE...

METHODS FOR FORMING SINGLE CRYSTAL SILICON INGOTS WITH IMPROVED RES...

HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE COMPRISING A CHARGE...

SILICON ON INSULATOR STRUCTURES HAVING HIGH RESISTIVITY REGIONS IN...

METHODS FOR PRODUCING SILICON ON INSULATOR STRUCTURES HAVING HIGH R...

METHOD AND SYSTEM FOR STRIPPING THE EDGE OF A SEMICONDUCTOR WAFER

METHOD FOR PROCESSING A SILICON-ON-INSULATOR STRUCTURE

Internally gettered heteroepitaxial semiconductor wafers and method...

Method for the preparation of a semiconductor substrate with a non-...

Modified susceptor for use in chemical vapor deposition process

Method for the preparation of a semiconductor substrate with a non-...

Semiconductor wafer manufacturing process

Epitaxial silicon wafer free from autodoping and backside halo and...