Robert W. Wells

Person

Cupertino, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Testing of a programmable device
- Patent number 7,725,787
- Issue date May 25, 2010
- Xilinx, Inc.
- Robert W. Wells
- G01 - MEASURING TESTING
Information Patent Grant
Testing of a programmable device
- Patent number 7,454,675
- Issue date Nov 18, 2008
- Xilinx, Inc.
- Robert W. Wells
- G01 - MEASURING TESTING
Information Patent Grant
Application-specific methods for testing molectronic or nanoscale d...
- Patent number 7,219,314
- Issue date May 15, 2007
- Xilinx, Inc.
- Steven M. Trimberger
- G01 - MEASURING TESTING
Information Patent Grant
Methods of utilizing programmable logic devices having localized de...
- Patent number 7,127,697
- Issue date Oct 24, 2006
- Xilinx, Inc.
- Robert W. Wells
- G01 - MEASURING TESTING
Information Patent Grant
Application-specific methods useful for testing look up tables in p...
- Patent number 7,007,250
- Issue date Feb 28, 2006
- Xilinx, Inc.
- Shekhar Bapat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods of testing for shorts in programmable logic devices using r...
- Patent number 6,920,621
- Issue date Jul 19, 2005
- Xilinx, Inc.
- Shahin Toutounchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Application-specific testing methods for programmable logic devices
- Patent number 6,891,395
- Issue date May 10, 2005
- Xilinx, Inc.
- Robert W. Wells
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Application-specific testing methods for programmable logic devices
- Patent number 6,817,006
- Issue date Nov 9, 2004
- Xilinx, Inc.
- Robert W. Wells
- G01 - MEASURING TESTING
Information Patent Grant
Method of using partially defective programmable logic devices
- Patent number 6,664,808
- Issue date Dec 16, 2003
- Xilinx, Inc.
- Zhi-Min Ling
- G01 - MEASURING TESTING
Information Patent Grant
Providing fault coverage of interconnect in an FPGA
- Patent number 6,651,238
- Issue date Nov 18, 2003
- Xilinx, Inc.
- Robert W. Wells
- G01 - MEASURING TESTING
Information Patent Grant
Built-in self test using pulse generators
- Patent number 6,611,477
- Issue date Aug 26, 2003
- Xilinx, Inc.
- Gil A. Speyer
- G01 - MEASURING TESTING
Information Patent Grant
Methods and circuits for precise edge placement of test signals
- Patent number 6,594,797
- Issue date Jul 15, 2003
- Xilinx, Inc.
- Rick W. Dudley
- G01 - MEASURING TESTING
Information Patent Grant
Fault emulation testing of programmable logic devices
- Patent number 6,594,610
- Issue date Jul 15, 2003
- Xilinx, Inc.
- Shahin Toutounchi
- G01 - MEASURING TESTING
Information Patent Grant
Methods and circuits for testing programmable logic
- Patent number 6,539,508
- Issue date Mar 25, 2003
- Xilinx, Inc.
- Robert D. Patrie
- G01 - MEASURING TESTING
Information Patent Grant
Built-in AC self test using pulse generators
- Patent number 6,466,520
- Issue date Oct 15, 2002
- Xilinx, Inc.
- Gil A. Speyer
- G01 - MEASURING TESTING
Information Patent Grant
Built-in self test method for measuring clock to out delays
- Patent number 6,356,514
- Issue date Mar 12, 2002
- Xilinx, Inc.
- Robert W. Wells
- G01 - MEASURING TESTING
Information Patent Grant
Method for configuring circuits over a data communications link
- Patent number 6,324,672
- Issue date Nov 27, 2001
- Xilinx, Inc.
- Gary R. Lawman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built-in self test method for measuring clock to out delays
- Patent number 6,233,205
- Issue date May 15, 2001
- Xilinx, Inc.
- Robert W. Wells
- G01 - MEASURING TESTING
Information Patent Grant
Circuit for measuring signal delays in synchronous memory elements
- Patent number 6,232,845
- Issue date May 15, 2001
- Xilinx, Inc.
- Christopher H. Kingsley
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for measuring signal propagation delays using rin...
- Patent number 6,219,305
- Issue date Apr 17, 2001
- Xilinx, Inc.
- Robert D. Patrie
- G01 - MEASURING TESTING
Information Patent Grant
System with downstream set or clear for measuring signal propagatio...
- Patent number 6,075,418
- Issue date Jun 13, 2000
- Xilinx, Inc.
- Christopher H. Kingsley
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring signal propagation delays using the...
- Patent number 6,069,849
- Issue date May 30, 2000
- Xilinx, Inc.
- Christopher H. Kingsley
- G01 - MEASURING TESTING
Information Patent Grant
Method for configuring circuits over a data communications link
- Patent number 6,023,565
- Issue date Feb 8, 2000
- Xilinx, Inc.
- Gary R. Lawman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Concurrent electronic circuit design and implementation
- Patent number 5,673,198
- Issue date Sep 30, 1997
- Xilinx, Inc.
- Gary R. Lawman
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Application-specific testing methods for programmable logic devices
- Publication number 20040216081
- Publication date Oct 28, 2004
- Xilinx, Inc.
- Robert W. Wells
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of using partially defective programmable logic devices
- Publication number 20030062923
- Publication date Apr 3, 2003
- Xilinx, Inc.
- Zhi-Min Ling
- G01 - MEASURING TESTING

Robert W. Wells

Person

Patents Grantslast 30 patents

Testing of a programmable device

Testing of a programmable device

Application-specific methods for testing molectronic or nanoscale d...

Methods of utilizing programmable logic devices having localized de...

Application-specific methods useful for testing look up tables in p...

Methods of testing for shorts in programmable logic devices using r...

Application-specific testing methods for programmable logic devices

Application-specific testing methods for programmable logic devices

Method of using partially defective programmable logic devices

Providing fault coverage of interconnect in an FPGA

Built-in self test using pulse generators

Methods and circuits for precise edge placement of test signals

Fault emulation testing of programmable logic devices

Methods and circuits for testing programmable logic

Built-in AC self test using pulse generators

Built-in self test method for measuring clock to out delays

Method for configuring circuits over a data communications link

Built-in self test method for measuring clock to out delays

Circuit for measuring signal delays in synchronous memory elements

Method and system for measuring signal propagation delays using rin...

System with downstream set or clear for measuring signal propagatio...

Method and system for measuring signal propagation delays using the...

Method for configuring circuits over a data communications link

Concurrent electronic circuit design and implementation

Patents Applicationslast 30 patents

Application-specific testing methods for programmable logic devices

Method of using partially defective programmable logic devices