Roger A. Dufresne

Person

Fairfax, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Test structures for dielectric reliability evaluations
- Patent number 10,103,060
- Issue date Oct 16, 2018
- GLOBALFOUNDRIES Inc.
- David G. Brochu
- G01 - MEASURING TESTING
Information Patent Grant
Via leakage and breakdown testing
- Patent number 9,851,398
- Issue date Dec 26, 2017
- GLOBALFOUNDRIES Inc.
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wiring structures
- Patent number 9,780,031
- Issue date Oct 3, 2017
- Globalfoudries Inc.
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-planar field effect transistor test structure and lateral diele...
- Patent number 9,453,873
- Issue date Sep 27, 2016
- GLOBALFOUNDRIES Inc.
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Grant
Alternating open-ended via chains for testing via formation and die...
- Patent number 9,059,052
- Issue date Jun 16, 2015
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
On-chip poly-to-contact process monitoring and reliability evaluati...
- Patent number 9,029,172
- Issue date May 12, 2015
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analyzing EM performance during IC manufacturing
- Patent number 8,917,104
- Issue date Dec 23, 2014
- International Business Machines Corporation
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Grant
Real-time on-chip EM performance monitoring
- Patent number 8,890,556
- Issue date Nov 18, 2014
- International Business Machines Corporation
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Grant
Test structure, method and circuit for simultaneously testing time...
- Patent number 8,754,655
- Issue date Jun 17, 2014
- International Business Machines Corporation
- David G. Brochu
- G01 - MEASURING TESTING
Information Patent Grant
Negative differential resistance reoxidized nitride silicon-based p...
- Patent number 6,743,655
- Issue date Jun 1, 2004
- International Business Machines Corporation
- Fen Chen
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Negative differential resistance reoxidized nitride silicon-based p...
- Patent number 6,445,021
- Issue date Sep 3, 2002
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for reliability stressing of dielectrics
- Patent number 5,898,706
- Issue date Apr 27, 1999
- International Business Machines Corporation
- Roger Aime Dufresne
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST STRUCTURES FOR DIELECTRIC RELIABILITY EVALUATIONS
- Publication number 20160372389
- Publication date Dec 22, 2016
- GLOBALFOUNDRIES INC.
- David G. Brochu
- G01 - MEASURING TESTING
Information Patent Application
VIA LEAKAGE AND BREAKDOWN TESTING
- Publication number 20160291084
- Publication date Oct 6, 2016
- GLOBALFOUNDRIES INC.
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Application
WIRING STRUCTURES
- Publication number 20160071790
- Publication date Mar 10, 2016
- International Business Machines Corporation
- Fen CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ALTERNATING OPEN-ENDED VIA CHAINS FOR TESTING VIA FORMATION AND DIE...
- Publication number 20150221567
- Publication date Aug 6, 2015
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-PLANAR FIELD EFFECT TRANSISTOR TEST STRUCTURE AND LATERAL DIELE...
- Publication number 20150198654
- Publication date Jul 16, 2015
- International Business Machines Corporation
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Application
ALTERNATING OPEN-ENDED VIA CHAINS FOR TESTING VIA FORMATION AND DIE...
- Publication number 20140339558
- Publication date Nov 20, 2014
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ON-CHIP POLY-TO-CONTACT PROCESS MONITORING AND RELIABILITY EVALUATI...
- Publication number 20130191047
- Publication date Jul 25, 2013
- International Business Machines Corporation
- Fen CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REAL-TIME ON-CHIP EM PERFORMANCE MONITORING
- Publication number 20130106452
- Publication date May 2, 2013
- International Business Machines Corporation
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Application
ANALYZING EM PERFORMANCE DURING IC MANUFACTURING
- Publication number 20130049793
- Publication date Feb 28, 2013
- International Business Machines Corporation
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Application
TEST STRUCTURE, METHOD AND CIRCUIT FOR SIMULTANEOUSLY TESTING TIME...
- Publication number 20130038334
- Publication date Feb 14, 2013
- International Business Machines Corporation
- David G. Brochu
- G01 - MEASURING TESTING
Information Patent Application
Dual Stage Voltage Ramp Stress Test for Gate Dielectrics
- Publication number 20120187974
- Publication date Jul 26, 2012
- International Business Machines Corporation
- David G. Brochu, JR.
- G01 - MEASURING TESTING
Information Patent Application
Negative differential resistance reoxidized nitride silicon-based p...
- Publication number 20020185703
- Publication date Dec 12, 2002
- International Business Machines Corporation
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS

Roger A. Dufresne

Person

Patents Grantslast 30 patents

Test structures for dielectric reliability evaluations

Via leakage and breakdown testing

Wiring structures

Non-planar field effect transistor test structure and lateral diele...

Alternating open-ended via chains for testing via formation and die...

On-chip poly-to-contact process monitoring and reliability evaluati...

Analyzing EM performance during IC manufacturing

Real-time on-chip EM performance monitoring

Test structure, method and circuit for simultaneously testing time...

Negative differential resistance reoxidized nitride silicon-based p...

Negative differential resistance reoxidized nitride silicon-based p...

Structure and method for reliability stressing of dielectrics

Patents Applicationslast 30 patents

TEST STRUCTURES FOR DIELECTRIC RELIABILITY EVALUATIONS

VIA LEAKAGE AND BREAKDOWN TESTING

WIRING STRUCTURES

ALTERNATING OPEN-ENDED VIA CHAINS FOR TESTING VIA FORMATION AND DIE...

NON-PLANAR FIELD EFFECT TRANSISTOR TEST STRUCTURE AND LATERAL DIELE...

ALTERNATING OPEN-ENDED VIA CHAINS FOR TESTING VIA FORMATION AND DIE...

ON-CHIP POLY-TO-CONTACT PROCESS MONITORING AND RELIABILITY EVALUATI...

REAL-TIME ON-CHIP EM PERFORMANCE MONITORING

ANALYZING EM PERFORMANCE DURING IC MANUFACTURING

TEST STRUCTURE, METHOD AND CIRCUIT FOR SIMULTANEOUSLY TESTING TIME...

Dual Stage Voltage Ramp Stress Test for Gate Dielectrics

Negative differential resistance reoxidized nitride silicon-based p...