Roland Chanclou

Person

77930 Perthes en Gatinais, FR

People

Patents Grantslast 30 patents

Information Patent Grant
Stacked conductive resistive polysilicon lands in multilevel semico...
- Patent number 5,381,046
- Issue date Jan 10, 1995
- International Business Machines Corporation
- Carl Cederbaum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming thin film pseudo-planar FET devices and structure...
- Patent number 5,320,975
- Issue date Jun 14, 1994
- International Business Machines Corporation
- Carl Cederbaum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming stacked conductive and/or resistive polysilicon l...
- Patent number 5,275,963
- Issue date Jan 4, 1994
- International Business Machines Corporation
- Carl Cederbaum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Follow-up system for etch process monitoring
- Patent number 5,223,914
- Issue date Jun 29, 1993
- International Business Machines Corporation
- Bernard Auda
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of producing high resolution and reproducible patterns
- Patent number 5,139,904
- Issue date Aug 18, 1992
- Bernard Auda
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of forming stacked tungsten gate PFET devices and structures...
- Patent number 5,112,765
- Issue date May 12, 1992
- International Business Machines Corporation
- Carl Cederbaum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming stacked self-aligned polysilicon PFET devices and...
- Patent number 5,100,817
- Issue date Mar 31, 1992
- International Business Machines Corporation
- Carl Cederbaum
- H01 - BASIC ELECTRIC ELEMENTS

Roland Chanclou

Person

Patents Grantslast 30 patents

Stacked conductive resistive polysilicon lands in multilevel semico...

Method of forming thin film pseudo-planar FET devices and structure...

Method of forming stacked conductive and/or resistive polysilicon l...

Follow-up system for etch process monitoring

Method of producing high resolution and reproducible patterns

Method of forming stacked tungsten gate PFET devices and structures...

Method of forming stacked self-aligned polysilicon PFET devices and...