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Rolf Stephan
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Dresden, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Methods of reducing material loss in isolation structures by introd...
Patent number
8,871,586
Issue date
Oct 28, 2014
GLOBALFOUNDRIES Inc.
Thilo Scheiper
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device comprising replacement gate electrode structur...
Patent number
8,846,513
Issue date
Sep 30, 2014
GLOBALFOUNDRIES Inc.
Peter Baars
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Temperature monitoring in a semiconductor device by using a PN junc...
Patent number
8,796,807
Issue date
Aug 5, 2014
Advanced Micro Devices, Inc.
Rolf Stephan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High-k metal gate electrode structure formed by removing a work fun...
Patent number
8,735,236
Issue date
May 27, 2014
GLOBALFOUNDRIES Inc.
Klaus Hempel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device comprising a metal gate stack of reduced heigh...
Patent number
8,293,610
Issue date
Oct 23, 2012
GLOBALFOUNDRIES Inc.
Sven Beyer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Enhancing transistor characteristics by a late deep implantation in...
Patent number
8,288,256
Issue date
Oct 16, 2012
Advanced Micro Devices, Inc.
Thomas Feudel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
In situ monitoring of metal contamination during microstructure pro...
Patent number
8,158,065
Issue date
Apr 17, 2012
Advanced Micro Devices, Inc.
Martin Trentzsch
G01 - MEASURING TESTING
Information
Patent Grant
Reducing the creation of charge traps at gate dielectrics in MOS tr...
Patent number
8,119,461
Issue date
Feb 21, 2012
GLOBALFOUNDRIES Inc.
Martin Trentzsch
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of forming a semiconductor structure comprising a formation...
Patent number
8,003,460
Issue date
Aug 23, 2011
GLOBALFOUNDRIES Inc.
Frank Wirbeleit
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Technique for locally adapting transistor characteristics by using...
Patent number
7,745,334
Issue date
Jun 29, 2010
Advanced Micro Devices, Inc.
Patrick Press
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of forming a semiconductor structure
Patent number
7,727,827
Issue date
Jun 1, 2010
GLOBALFOUNDRIES Inc.
Frank Wirbeleit
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Field effect transistor and method of forming a field effect transi...
Patent number
7,629,211
Issue date
Dec 8, 2009
Advanced Micro Devices, Inc.
Sven Beyer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having improved halo structures and a method o...
Patent number
7,625,802
Issue date
Dec 1, 2009
Advanced Micro Devices, Inc.
Thomas Feudel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor structure comprising field effect transistors with st...
Patent number
7,608,499
Issue date
Oct 27, 2009
Advanced Micro Devices, Inc.
Karla Romero
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Field effect transistors and methods for fabricating the same
Patent number
7,605,045
Issue date
Oct 20, 2009
Advanced Micro Devices, Inc.
Igor Peidous
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Field effect transistor having a stressed dielectric layer based on...
Patent number
7,563,731
Issue date
Jul 21, 2009
Advanced Micro Devices, Inc.
Christoph Schwan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for increasing product yield by controlling litho...
Patent number
7,325,224
Issue date
Jan 29, 2008
Advanced Micro Devices, Inc.
Rolf Seltmann
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Semiconductor device having a retrograde dopant profile in a channe...
Patent number
7,297,994
Issue date
Nov 20, 2007
Advanced Micro Devices, Inc.
Karsten Wieczorek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of forming a semiconductor structure comprising transistor e...
Patent number
7,238,578
Issue date
Jul 3, 2007
Advanced Micro Devices, Inc.
Gert Burbach
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of forming different silicide portions on different silicon-...
Patent number
7,226,859
Issue date
Jun 5, 2007
Advanced Micro Devices, Inc.
Karsten Wieczorek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having different metal silicide portions and m...
Patent number
7,217,657
Issue date
May 15, 2007
Advanced Micro Devices, Inc.
Karsten Wieczorek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having T-shaped gate structure comprising in s...
Patent number
7,148,145
Issue date
Dec 12, 2006
Advanced Micro Devices, Inc.
Karsten Wieczorek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having different metal-semiconductor portions...
Patent number
7,115,464
Issue date
Oct 3, 2006
Advanced Micro Devices, Inc.
Rolf Stephan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of removing features using an improved removal process in th...
Patent number
7,041,583
Issue date
May 9, 2006
Advanced Micro Devices, Inc.
Karsten Wieczorek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having improved doping profiles and method of...
Patent number
6,924,216
Issue date
Aug 2, 2005
Advanced Micro Devices, Inc.
Thomas Feudel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having a retrograde dopant profile in a channe...
Patent number
6,881,641
Issue date
Apr 19, 2005
Advanced Micro Devices, Inc.
Karsten Wieczorek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having improved doping profiles and a method o...
Patent number
6,846,708
Issue date
Jan 25, 2005
Advanced Micro Devices, Inc.
Thomas Feudel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of assessing lateral dopant and/or charge carrier profiles
Patent number
6,822,430
Issue date
Nov 23, 2004
Advanced Micro Devices, Inc.
Thomas Feudel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Field effect transistor with reduced gate delay and method of fabri...
Patent number
6,798,028
Issue date
Sep 28, 2004
Advanced Micro Devices, Inc.
Manfred Horstmann
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of forming a semiconductor device having T-shaped gate struc...
Patent number
6,770,552
Issue date
Aug 3, 2004
Advanced Micro Devices, Inc.
Karsten Wieczorek
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHODS OF REDUCING MATERIAL LOSS IN ISOLATION STRUCTURES BY INTROD...
Publication number
20140113419
Publication date
Apr 24, 2014
GLOBALFOUNDRIES INC.
Thilo Scheiper
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
High-K Metal Gate Electrode Structure Formed by Removing a Work Fun...
Publication number
20130168773
Publication date
Jul 4, 2013
GLOBALFOUNDRIES INC.
Klaus Hempel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Prevention of ILD Loss in Replacement Gate Technologies by Surface...
Publication number
20130115773
Publication date
May 9, 2013
GLOBALFOUNDRIES INC.
Rohit Pal
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor Device Comprising Replacement Gate Electrode Structur...
Publication number
20130075821
Publication date
Mar 28, 2013
GLOBALFOUNDRIES INC.
Peter Baars
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TEMPERATURE MONITORING IN A SEMICONDUCTOR DEVICE BY USING A PN JUNC...
Publication number
20120025276
Publication date
Feb 2, 2012
Advanced Micro Devices, Inc.
Rolf Stephan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
REDUCING THE CREATION OF CHARGE TRAPS AT GATE DIELECTRICS IN MOS TR...
Publication number
20110045665
Publication date
Feb 24, 2011
GLOBALFOUNDRIES INC.
Martin Trentzsch
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF FORMING A SEMICONDUCTOR STRUCTURE
Publication number
20100203698
Publication date
Aug 12, 2010
GLOBALFOUNDRIES INC.
Frank Wirbeleit
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IN SITU MONITORING OF METAL CONTAMINATION DURING MICROSTRUCTURE PRO...
Publication number
20100077839
Publication date
Apr 1, 2010
Martin Trentzsch
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE MONITORING IN A SEMICONDUCTOR DEVICE BY USING AN PN JUN...
Publication number
20090218601
Publication date
Sep 3, 2009
Rolf Stephan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE COMPRISING A METAL GATE STACK OF REDUCED HEIGH...
Publication number
20090218639
Publication date
Sep 3, 2009
Sven Beyer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
REDUCING THE CREATION OF CHARGE TRAPS AT GATE DIELECTRICS IN MOS TR...
Publication number
20090170339
Publication date
Jul 2, 2009
Martin Trentzsch
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF FORMING A SEMICONDUCTOR STRUCTURE COMPRISING A FORMATION...
Publication number
20090004799
Publication date
Jan 1, 2009
Frank Wirbeleit
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ENHANCING TRANSISTOR CHARACTERISTICS BY A LATE DEEP IMPLANTATION IN...
Publication number
20080268625
Publication date
Oct 30, 2008
Thomas Feudel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF FORMING A SEMICONDUCTOR STRUCTURE
Publication number
20080242040
Publication date
Oct 2, 2008
Frank Wirbeleit
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TECHNIQUE FOR LOCALLY ADAPTING TRANSISTOR CHARACTERISTICS BY USING...
Publication number
20080081471
Publication date
Apr 3, 2008
Patrick Press
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FIELD EFFECT TRANSISTOR HAVING A STRESSED DIELECTRIC LAYER BASED ON...
Publication number
20080081486
Publication date
Apr 3, 2008
Christoph Schwan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR STRUCTURE COMPRISING FIELD EFFECT TRANSISTORS WITH ST...
Publication number
20080023771
Publication date
Jan 31, 2008
Karla Romero
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FIELD EFFECT TRANSISTOR AND METHOD OF FORMING A FIELD EFFECT TRANSI...
Publication number
20080026531
Publication date
Jan 31, 2008
Sven Beyer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FIELD EFFECT TRANSISTORS AND METHODS FOR FABRICATING THE SAME
Publication number
20080014704
Publication date
Jan 17, 2008
Igor Peidous
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF FORMING A SEMICONDUCTOR STRUCTURE COMPRISING TRANSISTOR E...
Publication number
20070207583
Publication date
Sep 6, 2007
Advanced Micro Devices, Inc.
Gert Burbach
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FORMATION OF SILICIDED SURFACES FOR SILICON/CARBON SOURCE/DRAIN REG...
Publication number
20070200176
Publication date
Aug 30, 2007
Thorsten Kammler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of forming a semiconductor structure comprising transistor e...
Publication number
20060046400
Publication date
Mar 2, 2006
Gert Burbach
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device having a retrograde dopant profile in a channe...
Publication number
20050151202
Publication date
Jul 14, 2005
Advanced Micro Devices, Inc.
Karsten Wieczorek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and system for increasing product yield by controlling litho...
Publication number
20050120328
Publication date
Jun 2, 2005
Rolf Seltmann
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Method of assessing lateral dopant and/or charge carrier profiles
Publication number
20040152222
Publication date
Aug 5, 2004
Thomas Feudel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Semiconductor device having improved doping profiles and a method o...
Publication number
20040137687
Publication date
Jul 15, 2004
Thomas Feudel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of removing features using an improved removal process in th...
Publication number
20040121531
Publication date
Jun 24, 2004
Karsten Wieczorek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of removing sidewall spacers in the fabrication of a semicon...
Publication number
20040087155
Publication date
May 6, 2004
Karsten Wieczorek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device having improved doping profiles and method of...
Publication number
20040087120
Publication date
May 6, 2004
Thomas Feudel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device having improved halo structures and a method o...
Publication number
20040063262
Publication date
Apr 1, 2004
Thomas Feudel
H01 - BASIC ELECTRIC ELEMENTS