Romain Sappey

Person

San Diego, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for defect detection and photoluminescence measur...
- Patent number 9,772,289
- Issue date Sep 26, 2017
- KLA-Tencor Corporation
- Romain Sappey
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for spectral luminescence measurement
- Patent number 9,410,890
- Issue date Aug 9, 2016
- KLA-Tencor Corporation
- Romain Sappey
- G01 - MEASURING TESTING
Information Patent Grant
System and method for defect detection and photoluminescence measur...
- Patent number 9,354,177
- Issue date May 31, 2016
- KLA-Tencor Corporation
- Romain Sappey
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection
- Patent number 8,736,831
- Issue date May 27, 2014
- KLA-Tencor Corp.
- Mahendra Prabhu Ramachandran
- G01 - MEASURING TESTING
Information Patent Grant
Measuring the shape and thickness variation of a wafer with high sl...
- Patent number 7,847,954
- Issue date Dec 7, 2010
- KLA-Tencor Corporation
- Shouhong Tang
- G01 - MEASURING TESTING
Information Patent Grant
Surface characteristic analysis
- Patent number 7,554,654
- Issue date Jun 30, 2009
- KLA-Tencor Corporation
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic reference plane compensation
- Patent number 7,505,143
- Issue date Mar 17, 2009
- KLA-Tencor Corporation
- Harald F. Hess
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
System and Method for Defect Detection and Photoluminescence Measur...
- Publication number 20160377548
- Publication date Dec 29, 2016
- KLA-Tencor Corporation
- Romain SAPPEY
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Defect Detection and Photoluminescence Measur...
- Publication number 20150001421
- Publication date Jan 1, 2015
- KLA-Tencor Corporation
- Romain SAPPEY
- G01 - MEASURING TESTING
Information Patent Application
Substrate Inspection
- Publication number 20130308124
- Publication date Nov 21, 2013
- KLA-Tencor Corporation
- Mahendra Prabhu Ramachandran
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR SPECTRAL LUMINESCENCE MEASUREMENT
- Publication number 20130242300
- Publication date Sep 19, 2013
- KLA-Tencor Corporation
- Romain SAPPEY
- G01 - MEASURING TESTING
Information Patent Application
MEASURING THE SHAPE AND THICKNESS VARIATION OF A WAFER WITH HIGH SL...
- Publication number 20090284734
- Publication date Nov 19, 2009
- KLA-Tencor Corporation
- Shouhong Tang
- G01 - MEASURING TESTING
Information Patent Application
SURFACE CHARACTERISTIC ANALYSIS
- Publication number 20080180656
- Publication date Jul 31, 2008
- KLA-Tencor Technologies Corporation
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
Dynamic reference plane compensation
- Publication number 20060262291
- Publication date Nov 23, 2006
- Harald F. Hess
- G01 - MEASURING TESTING
Information Patent Application
Interferometry measurement in disturbed environments
- Publication number 20060256345
- Publication date Nov 16, 2006
- KLA-Tencor Technologies Corp.
- Romain Sappey
- G01 - MEASURING TESTING

Romain Sappey

Person

Patents Grantslast 30 patents

System and method for defect detection and photoluminescence measur...

Methods and apparatus for spectral luminescence measurement

System and method for defect detection and photoluminescence measur...

Substrate inspection

Measuring the shape and thickness variation of a wafer with high sl...

Surface characteristic analysis

Dynamic reference plane compensation

Patents Applicationslast 30 patents

System and Method for Defect Detection and Photoluminescence Measur...

System and Method for Defect Detection and Photoluminescence Measur...

Substrate Inspection

METHODS AND APPARATUS FOR SPECTRAL LUMINESCENCE MEASUREMENT

MEASURING THE SHAPE AND THICKNESS VARIATION OF A WAFER WITH HIGH SL...

SURFACE CHARACTERISTIC ANALYSIS

Dynamic reference plane compensation

Interferometry measurement in disturbed environments