Ronald A. Sartschev

Person

Andover, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for operating source synchronous devices
- Patent number 11,514,958
- Issue date Nov 29, 2022
- Teradyne, Inc.
- Ronald A. Sartschev
- G11 - INFORMATION STORAGE
Information Patent Grant
Deskew of rising and falling signal edges
- Patent number 9,503,065
- Issue date Nov 22, 2016
- Teradyne, Inc.
- Jan Paul Antonie van der Wagt
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Edge generator-based phase locked loop reference clock generator fo...
- Patent number 9,397,670
- Issue date Jul 19, 2016
- Teradyne, Inc.
- Jan Paul Anthonie van der Wagt
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Automated test system with edge steering
- Patent number 9,279,857
- Issue date Mar 8, 2016
- Teradyne, Inc.
- Howard Lin
- G01 - MEASURING TESTING
Information Patent Grant
Automated test system with event detection capability
- Patent number 9,244,126
- Issue date Jan 26, 2016
- Teradyne, Inc.
- Ronald A. Sartschev
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Edge triggered calibration
- Patent number 9,147,620
- Issue date Sep 29, 2015
- Teradyne, Inc.
- Jan Paul Anthonie van der Wagt
- G01 - MEASURING TESTING
Information Patent Grant
Pin electronics liquid cooled multi-module for high performance, lo...
- Patent number 8,289,039
- Issue date Oct 16, 2012
- Teradyne, Inc.
- Keith Breinlinger
- G01 - MEASURING TESTING
Information Patent Grant
Calibrating jitter
- Patent number 7,991,046
- Issue date Aug 2, 2011
- Teradyne, Inc.
- Ronald A. Sartschev
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Strobe technique for test of digital signal timing
- Patent number 7,856,578
- Issue date Dec 21, 2010
- Teradyne, Inc.
- Ronald A. Sartschev
- G01 - MEASURING TESTING
Information Patent Grant
Strobe technique for recovering a clock in a digital signal
- Patent number 7,573,957
- Issue date Aug 11, 2009
- Teradyne, Inc.
- Ronald A. Sartschev
- G01 - MEASURING TESTING
Information Patent Grant
Strobe technique for time stamping a digital signal
- Patent number 7,574,632
- Issue date Aug 11, 2009
- Teradyne, Inc.
- Ronald A. Sartschev
- G01 - MEASURING TESTING
Information Patent Grant
Pin electronics driver
- Patent number 7,560,947
- Issue date Jul 14, 2009
- Teradyne, Inc.
- Ronald A. Sartschev
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for monitoring test signals for semiconductor dev...
- Patent number 7,508,228
- Issue date Mar 24, 2009
- Teradyne, Inc.
- Ernest P. Walker
- G11 - INFORMATION STORAGE
Information Patent Grant
Using parametric measurement units as a source of power for a devic...
- Patent number 7,403,030
- Issue date Jul 22, 2008
- Teradyne, Inc.
- Ernest Walker
- G01 - MEASURING TESTING
Information Patent Grant
Pin electronics driver
- Patent number 7,323,898
- Issue date Jan 29, 2008
- Teradyne, Inc.
- Ronald A. Sartschev
- G01 - MEASURING TESTING
Information Patent Grant
Using a parametric measurement unit to sense a voltage at a device...
- Patent number 7,271,610
- Issue date Sep 18, 2007
- Teradyne, Inc.
- Ernest Walker
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for testing semiconductor devices
- Patent number 7,256,600
- Issue date Aug 14, 2007
- Teradyne, Inc.
- Ernest Walker
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for producing signals to test semiconductor devices
- Patent number 7,135,881
- Issue date Nov 14, 2006
- Teradyne, Inc.
- Ernest Walker
- G01 - MEASURING TESTING
Information Patent Grant
Pin electronics with high voltage functionality
- Patent number 7,102,375
- Issue date Sep 5, 2006
- Teradyne, Inc.
- Ernest Walker
- G01 - MEASURING TESTING
Information Patent Grant
Using a parametric measurement unit for converter testing
- Patent number 7,023,366
- Issue date Apr 4, 2006
- Teradyne, Inc.
- Ernest Walker
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Compact ATE with time stamp system
- Patent number 6,868,047
- Issue date Mar 15, 2005
- Teradyne, Inc.
- Ronald A. Sartschev
- G11 - INFORMATION STORAGE
Information Patent Grant
High speed tester with narrow output pulses
- Patent number 6,771,061
- Issue date Aug 3, 2004
- Teradyne, Inc.
- Ronald A. Sartschev
- G01 - MEASURING TESTING
Information Patent Grant
Temperature control structure
- Patent number 6,448,575
- Issue date Sep 10, 2002
- Teradyne, Inc.
- Alexander H. Slocum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low-cost configuration for monitoring and controlling parametric me...
- Patent number 6,374,379
- Issue date Apr 16, 2002
- Teradyne, Inc.
- Ernest P. Walker
- G01 - MEASURING TESTING
Information Patent Grant
Automatic test equipment with narrow output pulses
- Patent number 6,291,981
- Issue date Sep 18, 2001
- Teradyne, Inc.
- Ronald A. Sartschev
- G01 - MEASURING TESTING
Information Patent Grant
Automatic test equipment using sigma delta modulation to create ref...
- Patent number 6,282,682
- Issue date Aug 28, 2001
- Teradyne, Inc.
- Ernest P. Walker
- G01 - MEASURING TESTING
Information Patent Grant
Low cost CMOS tester with high channel density
- Patent number 6,073,259
- Issue date Jun 6, 2000
- Teradyne, Inc.
- Ronald A. Sartschev
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR OPERATING SOURCE SYNCHRONOUS DEVICES
- Publication number 20220044715
- Publication date Feb 10, 2022
- Teradyne, Inc.
- Ronald A. Sartschev
- G11 - INFORMATION STORAGE
Information Patent Application
Edge Generator-Based Phase Locked Loop Reference Clock Generator fo...
- Publication number 20160006441
- Publication date Jan 7, 2016
- Teradyne, Inc.
- Jan Paul Anthonie van der Wagt
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
AUTOMATED TEST SYSTEM WITH EDGE STEERING
- Publication number 20150137838
- Publication date May 21, 2015
- Teradyne, Inc.
- Howard Lin
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEST SYSTEM WITH EVENT DETECTION CAPABILITY
- Publication number 20150128003
- Publication date May 7, 2015
- Teradyne, Inc.
- Ronald A. Sartschev
- G01 - MEASURING TESTING
Information Patent Application
EDGE TRIGGERED CALIBRATION
- Publication number 20130260485
- Publication date Oct 3, 2013
- Teradyne, Inc.
- Jan Paul Anthonie van der Wagt
- G01 - MEASURING TESTING
Information Patent Application
Pin Electronics Liquid Cooled Multi-module for High Performance, Lo...
- Publication number 20100231250
- Publication date Sep 16, 2010
- Keith Breinlinger
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATING JITTER
- Publication number 20080285636
- Publication date Nov 20, 2008
- Teradyne, Inc.
- Ronald A. Sartschev
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Strobe technique for recovering a clock in a digital signal
- Publication number 20070126487
- Publication date Jun 7, 2007
- Ronald A. Sartschev
- G01 - MEASURING TESTING
Information Patent Application
Strobe technique for test of digital signal timing
- Publication number 20070091991
- Publication date Apr 26, 2007
- Teradyne, Inc.
- Ronald A. Sartschev
- G01 - MEASURING TESTING
Information Patent Application
Strobe technique for time stamping a digital signal
- Publication number 20070071080
- Publication date Mar 29, 2007
- Teradyne, Inc.
- Ronald A. Sartschev
- G01 - MEASURING TESTING
Information Patent Application
Pin electronics driver
- Publication number 20070069755
- Publication date Mar 29, 2007
- Ronald A. Sartschev
- G01 - MEASURING TESTING
Information Patent Application
Pin electronics driver
- Publication number 20070018681
- Publication date Jan 25, 2007
- Ronald A. Sartschev
- G01 - MEASURING TESTING
Information Patent Application
Method and system for monitoring test signals for semiconductor dev...
- Publication number 20060279310
- Publication date Dec 14, 2006
- Teradyne, Inc.
- Ernest P. Walker
- G01 - MEASURING TESTING
Information Patent Application
PIN ELECTRONICS WITH HIGH VOLTAGE FUNCTIONALITY
- Publication number 20060139048
- Publication date Jun 29, 2006
- Ernest Walker
- G01 - MEASURING TESTING
Information Patent Application
Using a parametric measurement unit to sense a voltage at a device...
- Publication number 20060132164
- Publication date Jun 22, 2006
- Ernest Walker
- G01 - MEASURING TESTING
Information Patent Application
Method and system for producing signals to test semiconductor devices
- Publication number 20060132166
- Publication date Jun 22, 2006
- Ernest Walker
- G01 - MEASURING TESTING
Information Patent Application
Using parametric measurement units as a source of power for a devic...
- Publication number 20060132163
- Publication date Jun 22, 2006
- Ernest Walker
- G01 - MEASURING TESTING
Information Patent Application
Method and system for testing semiconductor devices
- Publication number 20060132165
- Publication date Jun 22, 2006
- Ernest Walker
- G01 - MEASURING TESTING
Information Patent Application
Test system with high accuracy time measurement system
- Publication number 20040199842
- Publication date Oct 7, 2004
- Ronald A. Sartschev
- G04 - HOROLOGY
Information Patent Application
High speed tester with narrow output pulses
- Publication number 20040051518
- Publication date Mar 18, 2004
- Ronald A. Sartschev
- G01 - MEASURING TESTING
Information Patent Application
Compact ate with time stamp system
- Publication number 20030107951
- Publication date Jun 12, 2003
- Ronald A. Sartschev
- G01 - MEASURING TESTING

Ronald A. Sartschev

Person

Patents Grantslast 30 patents

Apparatus and method for operating source synchronous devices

Deskew of rising and falling signal edges

Edge generator-based phase locked loop reference clock generator fo...

Automated test system with edge steering

Automated test system with event detection capability

Edge triggered calibration

Pin electronics liquid cooled multi-module for high performance, lo...

Calibrating jitter

Strobe technique for test of digital signal timing

Strobe technique for recovering a clock in a digital signal

Strobe technique for time stamping a digital signal

Pin electronics driver

Method and system for monitoring test signals for semiconductor dev...

Using parametric measurement units as a source of power for a devic...

Pin electronics driver

Using a parametric measurement unit to sense a voltage at a device...

Method and system for testing semiconductor devices

Method and system for producing signals to test semiconductor devices

Pin electronics with high voltage functionality

Using a parametric measurement unit for converter testing

Compact ATE with time stamp system

High speed tester with narrow output pulses

Temperature control structure

Low-cost configuration for monitoring and controlling parametric me...

Automatic test equipment with narrow output pulses

Automatic test equipment using sigma delta modulation to create ref...

Low cost CMOS tester with high channel density

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR OPERATING SOURCE SYNCHRONOUS DEVICES

Edge Generator-Based Phase Locked Loop Reference Clock Generator fo...

AUTOMATED TEST SYSTEM WITH EDGE STEERING

AUTOMATED TEST SYSTEM WITH EVENT DETECTION CAPABILITY

EDGE TRIGGERED CALIBRATION

Pin Electronics Liquid Cooled Multi-module for High Performance, Lo...

CALIBRATING JITTER

Strobe technique for recovering a clock in a digital signal

Strobe technique for test of digital signal timing

Strobe technique for time stamping a digital signal

Pin electronics driver

Pin electronics driver

Method and system for monitoring test signals for semiconductor dev...

PIN ELECTRONICS WITH HIGH VOLTAGE FUNCTIONALITY

Using a parametric measurement unit to sense a voltage at a device...

Method and system for producing signals to test semiconductor devices

Using parametric measurement units as a source of power for a devic...

Method and system for testing semiconductor devices

Test system with high accuracy time measurement system

High speed tester with narrow output pulses

Compact ate with time stamp system