Ronald A. Warren

Person

Troy, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Etch apparatus
- Patent number 7,332,054
- Issue date Feb 19, 2008
- International Business Machines Corporation
- Arne W. Ballantine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal oxide temperature monitor
- Patent number 6,759,260
- Issue date Jul 6, 2004
- International Business Machines Corporation
- Arne W. Ballantine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Etch process and apparatus therefor
- Patent number 6,699,400
- Issue date Mar 2, 2004
- Arne W. Ballantine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal oxide temperature monitor
- Patent number 6,580,140
- Issue date Jun 17, 2003
- International Business Machines Corporation
- Arne W. Ballantine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of annealing copper metallurgy
- Patent number 6,339,022
- Issue date Jan 15, 2002
- International Business Machines Corporation
- Arne W. Ballantine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for detection of physical interference during...
- Patent number 6,282,459
- Issue date Aug 28, 2001
- International Business Machines Corporation
- Arne W. Ballantine
- G01 - MEASURING TESTING
Information Patent Grant
Cryogenic/phase change cooling for rapid thermal process systems
- Patent number 6,105,274
- Issue date Aug 22, 2000
- International Business Machines Corporation
- Arne W. Ballantine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enhanced collimated sputtering apparatus and its method of use
- Patent number 6,036,821
- Issue date Mar 14, 2000
- International Business Machines Corporation
- Ronald A. Warren
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Hot electron compensation for improved MOS transistor reliability
- Patent number 5,982,225
- Issue date Nov 9, 1999
- International Business Machines Corporation
- Timothy E. Forhan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Wear-through detector for multilayered parts and methods of using same
- Patent number 5,947,053
- Issue date Sep 7, 1999
- International Business Machines Corporation
- Jay Burnham
- G01 - MEASURING TESTING
Information Patent Grant
Method for extended ion implanter source lifetime with control mech...
- Patent number 5,943,594
- Issue date Aug 24, 1999
- International Business Machines Corporation
- Michael E. Bailey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for extended ion implanter source lifetime
- Patent number 5,940,724
- Issue date Aug 17, 1999
- International Business Machines Corporation
- Ronald A. Warren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for uniform cleaning of wafers using megasonic energy
- Patent number 5,579,792
- Issue date Dec 3, 1996
- International Business Machines Corporation
- David Stanasolovich
- E04 - BUILDING
Information Patent Grant
Polyimide and a semiconductor prepared therefrom
- Patent number 5,539,080
- Issue date Jul 23, 1996
- International Business Machines Corporation
- Dennis P. Hogan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Antireflective polymide dielectric for photolithography
- Patent number 5,536,792
- Issue date Jul 16, 1996
- International Business Machines Corporation
- Dennis P. Hogan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus for uniform cleaning of wafers using megasonic energy
- Patent number 5,533,540
- Issue date Jul 9, 1996
- Inernational Business Machines Corporation
- David Stanasolovich
- E04 - BUILDING
Information Patent Grant
Antireflective polyimide dielectric for photolithography
- Patent number 5,441,797
- Issue date Aug 15, 1995
- International Business Machines Corporation
- Dennis P. Hogan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for uniform cleaning of wafers using megasonic energy
- Patent number 5,427,622
- Issue date Jun 27, 1995
- International Business Machines Corporation
- David Stanasolovich
- E04 - BUILDING
Information Patent Grant
Antireflective polyimide dielectric for photolithography
- Patent number 5,397,684
- Issue date Mar 14, 1995
- International Business Machines Corporation
- Dennis P. Hogan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Self-aligned contact studs for semiconductor structures
- Patent number 5,352,927
- Issue date Oct 4, 1994
- International Business Machines Corporation
- Donna R. Cote
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-aligned contact studs for semiconductor structures
- Patent number 5,216,282
- Issue date Jun 1, 1993
- International Business Machines Corporation
- Donna R. Cote
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for fabrication of a semiconductor structure and contact stud
- Patent number 5,187,121
- Issue date Feb 16, 1993
- International Business Machines Corporation
- Donna R. Cote
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for fabricating self-aligned contact studs for semiconducto...
- Patent number 5,166,096
- Issue date Nov 24, 1992
- International Business Machines Corporation
- Donna R. Cote
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ETCH APPARATUS
- Publication number 20080066864
- Publication date Mar 20, 2008
- Arne W. Ballantine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Etch process and apparatus therefor
- Publication number 20040144750
- Publication date Jul 29, 2004
- Arne W. Ballantine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Metal oxide temperature monitor
- Publication number 20030183897
- Publication date Oct 2, 2003
- Arne W. Ballantine
- H01 - BASIC ELECTRIC ELEMENTS

Ronald A. Warren

Person

Patents Grantslast 30 patents

Etch apparatus

Metal oxide temperature monitor

Etch process and apparatus therefor

Metal oxide temperature monitor

Method of annealing copper metallurgy

Structure and method for detection of physical interference during...

Cryogenic/phase change cooling for rapid thermal process systems

Enhanced collimated sputtering apparatus and its method of use

Hot electron compensation for improved MOS transistor reliability

Wear-through detector for multilayered parts and methods of using same

Method for extended ion implanter source lifetime with control mech...

Method for extended ion implanter source lifetime

Apparatus for uniform cleaning of wafers using megasonic energy

Polyimide and a semiconductor prepared therefrom

Antireflective polymide dielectric for photolithography

Apparatus for uniform cleaning of wafers using megasonic energy

Antireflective polyimide dielectric for photolithography

Method for uniform cleaning of wafers using megasonic energy

Antireflective polyimide dielectric for photolithography

Self-aligned contact studs for semiconductor structures

Self-aligned contact studs for semiconductor structures

Process for fabrication of a semiconductor structure and contact stud

Process for fabricating self-aligned contact studs for semiconducto...

Patents Applicationslast 30 patents

ETCH APPARATUS

Etch process and apparatus therefor

Metal oxide temperature monitor