Ronald Baker

Person

Raleigh, NC, US

People

Patents Grantslast 30 patents

Information Patent Grant
Multi-component module fly-by output alignment arrangement and method
- Patent number 7,873,857
- Issue date Jan 18, 2011
- Qimonda AG
- Ronald Baker
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device that provides test results to multiple output pads
- Patent number 7,457,170
- Issue date Nov 25, 2008
- Infineon Technologies AG
- Ronald Baker
- G11 - INFORMATION STORAGE
Information Patent Grant
Internal generation of reference voltage
- Patent number 6,744,271
- Issue date Jun 1, 2004
- Infineon Technologies AG
- Ronald N. Baker
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Multi-Component Module Fly-By Output Alignment Arrangement and Method
- Publication number 20080177911
- Publication date Jul 24, 2008
- QIMONDA NORTH AMERICA CORP.
- Ronald Baker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Memory device that provides test results to multiple output pads
- Publication number 20070109887
- Publication date May 17, 2007
- Ronald Baker
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated circuit with test circuit
- Publication number 20070109888
- Publication date May 17, 2007
- Ronald Baker
- G11 - INFORMATION STORAGE
Information Patent Application
Memory tester having master/slave configuration
- Publication number 20070088993
- Publication date Apr 19, 2007
- Ronald Baker
- G01 - MEASURING TESTING
Information Patent Application
Test modes for a semiconductor integrated circuit device
- Publication number 20070046308
- Publication date Mar 1, 2007
- Ronald Baker
- G01 - MEASURING TESTING
Information Patent Application
Multiple function results using single pattern and method
- Publication number 20060236185
- Publication date Oct 19, 2006
- Ronald Baker
- G01 - MEASURING TESTING
Information Patent Application
Internal generation of reference voltage
- Publication number 20040041578
- Publication date Mar 4, 2004
- Ronald N. Baker
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for selecting the operational mode of an integ...
- Publication number 20030212939
- Publication date Nov 13, 2003
- Ronald N. Baker
- G11 - INFORMATION STORAGE

Ronald Baker

Person

Patents Grantslast 30 patents

Multi-component module fly-by output alignment arrangement and method

Memory device that provides test results to multiple output pads

Internal generation of reference voltage

Patents Applicationslast 30 patents

Multi-Component Module Fly-By Output Alignment Arrangement and Method

Memory device that provides test results to multiple output pads

Integrated circuit with test circuit

Memory tester having master/slave configuration

Test modes for a semiconductor integrated circuit device

Multiple function results using single pattern and method

Internal generation of reference voltage

Method and apparatus for selecting the operational mode of an integ...