Ronald J. Peiffer

Person

Fort Collins, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for discharging voltages from a circuit under...
- Patent number 7,411,383
- Issue date Aug 12, 2008
- Agilent Technologies, Inc.
- Dayton Norrgard
- G01 - MEASURING TESTING
Information Patent Grant
Printed circuit board test access point structures and method for m...
- Patent number 7,307,222
- Issue date Dec 11, 2007
- Agilent Technologies, Inc.
- Kenneth P. Parker
- G01 - MEASURING TESTING
Information Patent Grant
System for discharging electronic circuitry
- Patent number 7,132,876
- Issue date Nov 7, 2006
- Agilent Technologies, Inc.
- Ronald J. Peiffer
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive sensor measurement method for discrete time sampled syst...
- Patent number 7,132,834
- Issue date Nov 7, 2006
- Agilent Technologies, Inc.
- Curtis A. Tesdahl
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive sensor measurement method for discrete time sampled syst...
- Patent number 7,061,250
- Issue date Jun 13, 2006
- Agilent Technologies, Inc.
- Curtis A. Tesdahl
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive sensor measurement method for discrete time sampled syst...
- Patent number 6,998,849
- Issue date Feb 14, 2006
- Agilent Technologies, Inc.
- Curtis A. Tesdahl
- G01 - MEASURING TESTING
Information Patent Grant
Testing series passive components without contacting the driven node
- Patent number 5,760,596
- Issue date Jun 2, 1998
- Hewlett-Packard Company
- Ronald J. Peiffer
- G01 - MEASURING TESTING
Information Patent Grant
Identification of pin-open faults by measuring current or voltage c...
- Patent number 5,489,851
- Issue date Feb 6, 1996
- Hewlett-Packard Company
- John M. Heumann
- G01 - MEASURING TESTING
Information Patent Grant
Capacitively-coupled amplifier with improved low frequency response
- Patent number 5,392,001
- Issue date Feb 21, 1995
- Hewlett-Packard Company
- Thomas F. Uhling
- G01 - MEASURING TESTING
Information Patent Grant
Capacitively-coupled test probe
- Patent number 5,274,336
- Issue date Dec 28, 1993
- Hewlett-Packard Company
- David T. Crook
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Integrated circuit transfer test device system utilizing lateral tr...
- Patent number 5,101,152
- Issue date Mar 31, 1992
- Hewlett-Packard Company
- Vance R. Harwood
- G01 - MEASURING TESTING
Information Patent Grant
In-circuit transistor beta test and method
- Patent number 4,801,878
- Issue date Jan 31, 1989
- Hewlett-Packard Company
- Ronald J. Peiffer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Interface circuit for electronic test system
- Publication number 20060139017
- Publication date Jun 29, 2006
- Ronald J. Peiffer
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method and apparatus for discharging voltages from a circuit under...
- Publication number 20060139824
- Publication date Jun 29, 2006
- Dayton Norrgard
- G01 - MEASURING TESTING
Information Patent Application
System for discharging electronic circuitry
- Publication number 20060139087
- Publication date Jun 29, 2006
- Ronald J. Peiffer
- G01 - MEASURING TESTING
Information Patent Application
Capacitive sensor measurement method for discrete time sampled syst...
- Publication number 20060076960
- Publication date Apr 13, 2006
- Curtis A. Tesdahl
- G01 - MEASURING TESTING
Information Patent Application
Capacitive sensor measurement method for discrete time sampled syst...
- Publication number 20060076959
- Publication date Apr 13, 2006
- Curtis A. Tesdahl
- G01 - MEASURING TESTING
Information Patent Application
Capacitive sensor measurement method for discrete time sampled syst...
- Publication number 20050068051
- Publication date Mar 31, 2005
- Curtis A. Tesdahl
- G01 - MEASURING TESTING
Information Patent Application
Printed circuit board test access point structures and method for m...
- Publication number 20050061540
- Publication date Mar 24, 2005
- Kenneth P. Parker
- G01 - MEASURING TESTING

Ronald J. Peiffer

Person

Patents Grantslast 30 patents

Method and apparatus for discharging voltages from a circuit under...

Printed circuit board test access point structures and method for m...

System for discharging electronic circuitry

Capacitive sensor measurement method for discrete time sampled syst...

Capacitive sensor measurement method for discrete time sampled syst...

Capacitive sensor measurement method for discrete time sampled syst...

Testing series passive components without contacting the driven node

Identification of pin-open faults by measuring current or voltage c...

Capacitively-coupled amplifier with improved low frequency response

Capacitively-coupled test probe

Integrated circuit transfer test device system utilizing lateral tr...

In-circuit transistor beta test and method

Patents Applicationslast 30 patents

Interface circuit for electronic test system

Method and apparatus for discharging voltages from a circuit under...

System for discharging electronic circuitry

Capacitive sensor measurement method for discrete time sampled syst...

Capacitive sensor measurement method for discrete time sampled syst...

Capacitive sensor measurement method for discrete time sampled syst...

Printed circuit board test access point structures and method for m...