Ronald L. Roncone

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Optical compensation in high numerical aperture photomask inspectio...
- Patent number 6,952,256
- Issue date Oct 4, 2005
- KLA-Tencor Technologies Corporation
- Ronald L. Roncone
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Optical compensation in high numerical aperture photomask inspectio...
- Publication number 20040042002
- Publication date Mar 4, 2004
- KLA-Tencor Technologies Corporation
- Ronald L. Roncone
- G01 - MEASURING TESTING