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Roy J. Henson
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Pleasanton, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method of designing an application specific probe card test system
Patent number
8,581,610
Issue date
Nov 12, 2013
Charles A Miller
G01 - MEASURING TESTING
Information
Patent Grant
Self-referencing voltage regulator
Patent number
8,154,315
Issue date
Apr 10, 2012
FormFactor, Inc.
Roy John Henson
G05 - CONTROLLING REGULATING
Information
Patent Grant
Sharing resources in a system for testing semiconductor devices
Patent number
7,852,094
Issue date
Dec 14, 2010
FormFactor, Inc.
Matthew E. Chraft
G01 - MEASURING TESTING
Information
Patent Grant
Sawing tile corners on probe card substrates
Patent number
7,692,433
Issue date
Apr 6, 2010
FormFactor, Inc.
Benjamin N. Eldridge
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for switching tester resources
Patent number
7,649,366
Issue date
Jan 19, 2010
FormFactor, Inc.
Roy J. Henson
G01 - MEASURING TESTING
Information
Patent Grant
Intelligent probe card architecture
Patent number
7,307,433
Issue date
Dec 11, 2007
FormFactor, Inc.
Charles A. Miller
G01 - MEASURING TESTING
Information
Patent Grant
Probe head arrays
Patent number
7,282,933
Issue date
Oct 16, 2007
FormFactor, Inc.
Roy John Henson
G01 - MEASURING TESTING
Information
Patent Grant
Probe card assembly including a programmable device to selectively...
Patent number
7,245,134
Issue date
Jul 17, 2007
FormFactor, Inc.
Dane C. Granicher
G01 - MEASURING TESTING
Information
Patent Grant
High performance probe system
Patent number
6,911,835
Issue date
Jun 28, 2005
FormFactor, Inc.
Matthew Chraft
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Self-Referencing Voltage Regulator
Publication number
20090251123
Publication date
Oct 8, 2009
FormFactor, Inc.
Roy John Henson
G05 - CONTROLLING REGULATING
Information
Patent Application
SHARING RESOURCES IN A SYSTEM FOR TESTING SEMICONDUCTOR DEVICES
Publication number
20080136432
Publication date
Jun 12, 2008
FormFactor, Inc.
Matthew E. Chraft
G01 - MEASURING TESTING
Information
Patent Application
Intelligent probe card architecture
Publication number
20080100320
Publication date
May 1, 2008
FormFactor, Inc.
Charles A. Miller
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARTUS FOR SWITCHING TESTER RESOURCES
Publication number
20080054917
Publication date
Mar 6, 2008
FormFactor, Inc.
Roy J. Henson
G01 - MEASURING TESTING
Information
Patent Application
Sawing tile corners on probe card substrates
Publication number
20070290705
Publication date
Dec 20, 2007
FormFactor, Inc.
Benjamin N. Eldridge
G01 - MEASURING TESTING
Information
Patent Application
PROGRAMMABLE DEVICES TO ROUTE SIGNALS ON PROBE CARDS
Publication number
20070261009
Publication date
Nov 8, 2007
FormFactor, Inc.
Dane C. Granicher
G01 - MEASURING TESTING
Information
Patent Application
Method of designing an application specific probe card test system
Publication number
20060273809
Publication date
Dec 7, 2006
FormFactor, Inc.
Charles A. Miller
G01 - MEASURING TESTING
Information
Patent Application
Active diagnostic interface for wafer probe applications
Publication number
20060214679
Publication date
Sep 28, 2006
FormFactor, Inc.
Roy J. Henson
G01 - MEASURING TESTING
Information
Patent Application
Programmable devices to route signals on probe cards
Publication number
20060170435
Publication date
Aug 3, 2006
FormFactor Inc.
Dane C. Granicher
G01 - MEASURING TESTING
Information
Patent Application
Probe head arrays
Publication number
20060145713
Publication date
Jul 6, 2006
Roy John Henson
G01 - MEASURING TESTING
Information
Patent Application
Intelligent probe card architecture
Publication number
20050237073
Publication date
Oct 27, 2005
FormFactor, Inc.
Charles A. Miller
G01 - MEASURING TESTING
Information
Patent Application
High performance probe system
Publication number
20040046579
Publication date
Mar 11, 2004
FormFactor, Inc.
Matthew Chraft
G01 - MEASURING TESTING