Rudolf M. Tromp

Person

North Salem, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Surface force apparatus based on a spherical lens
- Patent number 11,054,320
- Issue date Jul 6, 2021
- International Business Machines Corporation
- Arthur W. Ellis
- G01 - MEASURING TESTING
Information Patent Grant
Resistive processing unit with hysteretic updates for neural networ...
- Patent number 10,755,170
- Issue date Aug 25, 2020
- International Business Machines Corporation
- Tayfun Gokmen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring spherical and chromatic aberrations in cathode lens elect...
- Patent number 10,593,510
- Issue date Mar 17, 2020
- International Business Machines Corporation
- Rudolf M. Tromp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface force apparatus based on a spherical lens
- Patent number 10,564,056
- Issue date Feb 18, 2020
- International Business Machines Corporation
- Arthur W. Ellis
- G01 - MEASURING TESTING
Information Patent Grant
Height measurement using optical interference
- Patent number 10,330,457
- Issue date Jun 25, 2019
- International Business Machines Corporation
- Richard A. Haight
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Height measurement using optical interference
- Patent number 10,330,458
- Issue date Jun 25, 2019
- International Business Machines Corporation
- Richard A. Haight
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Measuring spherical and chromatic aberrations in cathode lens elect...
- Patent number 10,283,315
- Issue date May 7, 2019
- International Business Machines Corporation
- Rudolf M. Tromp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Height measurement using optical interference
- Patent number 10,119,801
- Issue date Nov 6, 2018
- International Business Machines Corporation
- Richard A. Haight
- G01 - MEASURING TESTING
Information Patent Grant
Surface force apparatus based on a spherical lens
- Patent number 10,101,224
- Issue date Oct 16, 2018
- International Business Machines Corporation
- Arthur W. Ellis
- G01 - MEASURING TESTING
Information Patent Grant
Height measurement using optical interference
- Patent number 9,752,865
- Issue date Sep 5, 2017
- International Business Machines Corporation
- Richard A. Haight
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Surface force apparatus based on a spherical lens
- Patent number 9,625,331
- Issue date Apr 18, 2017
- International Business Machines Corporation
- Arthur W. Ellis
- G01 - MEASURING TESTING
Information Patent Grant
Scanning transmission electron microscope having multiple beams and...
- Patent number 9,607,804
- Issue date Mar 28, 2017
- International Business Machines Corporation
- Rudolf M. Tromp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning transmission electron microscope having multiple beams and...
- Patent number 9,552,961
- Issue date Jan 24, 2017
- International Business Machines Corporation
- Rudolf M. Tromp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pentacene-carbon nanotube composite, method of forming the composit...
- Patent number 8,598,569
- Issue date Dec 3, 2013
- International Business Machines Corporation
- Ali Afzali-Ardakani
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Low-voltage transmission electron microscopy
- Patent number 8,586,919
- Issue date Nov 19, 2013
- International Business Machines Corporation
- Rudolf Tromp
- G01 - MEASURING TESTING
Information Patent Grant
Low-voltage transmission electron microscopy
- Patent number 8,586,923
- Issue date Nov 19, 2013
- International Business Machines Corporation
- Rudolf Tromp
- G01 - MEASURING TESTING
Information Patent Grant
Method for preparation of flat step-free silicon carbide surfaces
- Patent number 8,465,799
- Issue date Jun 18, 2013
- International Business Machines Corporation
- James B. Hannon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Complexes of carbon nanotubes and fullerenes with molecular-clips a...
- Patent number 7,955,585
- Issue date Jun 7, 2011
- International Business Machines Corporation
- Ali Afzali-Ardakani
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Complexes of carbon nanotubes and fullerenes with molecular-clips a...
- Patent number 7,883,685
- Issue date Feb 8, 2011
- International Business Machines Corporation
- Ali Afzali-Ardakani
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Complexes of carbon nanotubes and fullerenes with molecular-clips a...
- Patent number 7,879,307
- Issue date Feb 1, 2011
- International Business Machines Corporation
- Ali Afzali-Ardakani
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Complexes of carbon nanotubes and fullerenes with molecular-clips a...
- Patent number 7,867,469
- Issue date Jan 11, 2011
- International Business Machines Corporation
- Ali Afzali-Ardakani
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Complexes of carbon nanotubes and fullerenes with molecular-clips a...
- Patent number 7,771,695
- Issue date Aug 10, 2010
- International Business Machines Corporation
- Ali Afzali-Ardakani
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for surface potential reflection electron mask...
- Patent number 7,592,612
- Issue date Sep 22, 2009
- International Business Machiens Corporation
- Rudolf M. Tromp
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Methods involving resetting spin-torque magnetic random access memo...
- Patent number 7,525,862
- Issue date Apr 28, 2009
- International Business Machines Corporation
- Jonathan Z. Sun
- G11 - INFORMATION STORAGE
Information Patent Grant
Energy-filtering cathode lens microscopy instrument
- Patent number 7,453,062
- Issue date Nov 18, 2008
- International Business Machines Corporation
- Rudolf M. Tromp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for surface potential reflection electron mask...
- Patent number 7,432,514
- Issue date Oct 7, 2008
- International Business Machines Corporation
- Rudolf M. Tromp
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Aberration-correcting cathode lens microscopy instrument
- Patent number 7,348,566
- Issue date Mar 25, 2008
- International Business Machines Corporation
- Rudolf M. Tromp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Localized lattice-mismatch-accomodation dislocation network epitaxy
- Patent number 5,997,638
- Issue date Dec 7, 1999
- International Business Machines Corporation
- Matthew Warren Copel
- C30 - CRYSTAL GROWTH
Information Patent Grant
Fabrication of atomic step-free surfaces
- Patent number 5,910,339
- Issue date Jun 8, 1999
- Cornell Research Foundation, Inc.
- Jack M. Blakely
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surfactant-enhanced epitaxy
- Patent number 5,628,834
- Issue date May 13, 1997
- International Business Machines Corporation
- Matthew W. Copel
- C30 - CRYSTAL GROWTH

Patents Applicationslast 30 patents

Information Patent Application
SURFACE FORCE APPARATUS BASED ON A SPHERICAL LENS
- Publication number 20200072687
- Publication date Mar 5, 2020
- International Business Machines Corporation
- Arthur W. Ellis
- G01 - MEASURING TESTING
Information Patent Application
MEASURING SPHERICAL AND CHROMATIC ABERRATIONS IN CATHODE LENS ELECT...
- Publication number 20190206655
- Publication date Jul 4, 2019
- International Business Machines Corporation
- Rudolf M. Tromp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HEIGHT MEASUREMENT USING OPTICAL INTERFERENCE
- Publication number 20180364022
- Publication date Dec 20, 2018
- International Business Machines Corporation
- Richard A. Haight
- G01 - MEASURING TESTING
Information Patent Application
HEIGHT MEASUREMENT USING OPTICAL INTERFERENCE
- Publication number 20180364023
- Publication date Dec 20, 2018
- International Business Machines Corporation
- Richard A. Haight
- G01 - MEASURING TESTING
Information Patent Application
SURFACE FORCE APPARATUS BASED ON A SPHERICAL LENS
- Publication number 20180356305
- Publication date Dec 13, 2018
- International Business Machines Corporation
- Arthur W. Ellis
- G01 - MEASURING TESTING
Information Patent Application
MEASURING SPHERICAL AND CHROMATIC ABERRATIONS IN CATHODE LENS ELECT...
- Publication number 20180337017
- Publication date Nov 22, 2018
- International Business Machines Corporation
- Rudolf M. Tromp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RESISTIVE PROCESSING UNIT WITH HYSTERETIC UPDATES FOR NEURAL NETWOR...
- Publication number 20180253642
- Publication date Sep 6, 2018
- International Business Machines Corporation
- Tayfun Gokmen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HEIGHT MEASUREMENT USING OPTICAL INTERFERENCE
- Publication number 20170292825
- Publication date Oct 12, 2017
- International Business Machines Corporation
- Richard A. Haight
- G01 - MEASURING TESTING
Information Patent Application
SURFACE FORCE APPARATUS BASED ON A SPHERICAL LENS
- Publication number 20170167929
- Publication date Jun 15, 2017
- International Business Machines Corporation
- Arthur W. Ellis
- G01 - MEASURING TESTING
Information Patent Application
SURFACE FORCE APPARATUS BASED ON A SPHERICAL LENS
- Publication number 20170074733
- Publication date Mar 16, 2017
- International Business Machines Corporation
- Arthur W. Ellis
- G01 - MEASURING TESTING
Information Patent Application
SCANNING TRANSMISSION ELECTRON MICROSCOPE HAVING MULTIPLE BEAMS AND...
- Publication number 20160300689
- Publication date Oct 13, 2016
- International Business Machines Corporation
- Rudolf M. Tromp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING TRANSMISSION ELECTRON MICROSCOPE HAVING MULTIPLE BEAMS AND...
- Publication number 20160300688
- Publication date Oct 13, 2016
- International Business Machines Corporation
- Rudolf M. Tromp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PENTACENE-CARBON NANOTUBE COMPOSITE, METHOD OF FORMING THE COMPOSIT...
- Publication number 20130015433
- Publication date Jan 17, 2013
- International Business Machines Corporation
- Ali Afzali-Ardakani
- B82 - NANO-TECHNOLOGY
Information Patent Application
COMPLEXES OF CARBON NANOTUBES AND FULLERENES WITH MOLECULAR-CLIPS A...
- Publication number 20100320438
- Publication date Dec 23, 2010
- International Business Machines Corporation
- Ali Afzali-Ardakani
- B82 - NANO-TECHNOLOGY
Information Patent Application
COMPLEXES OF CARBON NANOTUBES AND FULLERENES WITH MOLECULAR-CLIPS A...
- Publication number 20100297833
- Publication date Nov 25, 2010
- International Business Machines Corporation
- Ali Afzali-Ardakani
- B82 - NANO-TECHNOLOGY
Information Patent Application
COMPLEXES OF CARBON NANOTUBES AND FULLERENES WITH MOLECULAR-CLIPS A...
- Publication number 20100291759
- Publication date Nov 18, 2010
- International Business Machines Corporation
- Ali Afzali-Ardakani
- B82 - NANO-TECHNOLOGY
Information Patent Application
COMPLEXES OF CARBON NANOTUBES AND FULLERENES WITH MOLECULAR-CLIPS A...
- Publication number 20100170418
- Publication date Jul 8, 2010
- International Business Machines Corporation
- Ali Afzali-Ardakani
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method for Preparation of Flat Step-Free Silicon Carbide Surfaces
- Publication number 20100065988
- Publication date Mar 18, 2010
- International Business Machines Corporation
- James B. Hannon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PENTACENE-CARBON NANOTUBE COMPOSITE, METHOD OF FORMING THE COMPOSIT...
- Publication number 20090272967
- Publication date Nov 5, 2009
- International Business Machines Corporation
- Ali Afzali-Ardakani
- C07 - ORGANIC CHEMISTRY
Information Patent Application
METHOD AND APPARATUS FOR SURFACE POTENTIAL REFLECTION ELECTRON MASK...
- Publication number 20080128634
- Publication date Jun 5, 2008
- Rudolf M. Tromp
- B82 - NANO-TECHNOLOGY
Information Patent Application
Aberration-correcting cathode lens microscopy instrument
- Publication number 20070200070
- Publication date Aug 30, 2007
- International Business Machines Corporation
- Rudolf M. Tromp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Energy-filtering cathode lens microscopy instrument
- Publication number 20070200062
- Publication date Aug 30, 2007
- International Business Machines Corporation
- Rudolf M. Tromp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for surface potential reflection electron mask...
- Publication number 20030183781
- Publication date Oct 2, 2003
- International Busines Machiness Corporation
- Rudolf M. Tromp
- B82 - NANO-TECHNOLOGY

Rudolf M. Tromp

Person

Patents Grantslast 30 patents

Surface force apparatus based on a spherical lens

Resistive processing unit with hysteretic updates for neural networ...

Measuring spherical and chromatic aberrations in cathode lens elect...

Surface force apparatus based on a spherical lens

Height measurement using optical interference

Height measurement using optical interference

Measuring spherical and chromatic aberrations in cathode lens elect...

Height measurement using optical interference

Surface force apparatus based on a spherical lens

Height measurement using optical interference

Surface force apparatus based on a spherical lens

Scanning transmission electron microscope having multiple beams and...

Scanning transmission electron microscope having multiple beams and...

Pentacene-carbon nanotube composite, method of forming the composit...

Low-voltage transmission electron microscopy

Low-voltage transmission electron microscopy

Method for preparation of flat step-free silicon carbide surfaces

Complexes of carbon nanotubes and fullerenes with molecular-clips a...

Complexes of carbon nanotubes and fullerenes with molecular-clips a...

Complexes of carbon nanotubes and fullerenes with molecular-clips a...

Complexes of carbon nanotubes and fullerenes with molecular-clips a...

Complexes of carbon nanotubes and fullerenes with molecular-clips a...

Method and apparatus for surface potential reflection electron mask...

Methods involving resetting spin-torque magnetic random access memo...

Energy-filtering cathode lens microscopy instrument

Method and apparatus for surface potential reflection electron mask...

Aberration-correcting cathode lens microscopy instrument

Localized lattice-mismatch-accomodation dislocation network epitaxy

Fabrication of atomic step-free surfaces

Surfactant-enhanced epitaxy

Patents Applicationslast 30 patents

SURFACE FORCE APPARATUS BASED ON A SPHERICAL LENS

MEASURING SPHERICAL AND CHROMATIC ABERRATIONS IN CATHODE LENS ELECT...

HEIGHT MEASUREMENT USING OPTICAL INTERFERENCE

HEIGHT MEASUREMENT USING OPTICAL INTERFERENCE

SURFACE FORCE APPARATUS BASED ON A SPHERICAL LENS

MEASURING SPHERICAL AND CHROMATIC ABERRATIONS IN CATHODE LENS ELECT...

RESISTIVE PROCESSING UNIT WITH HYSTERETIC UPDATES FOR NEURAL NETWOR...

HEIGHT MEASUREMENT USING OPTICAL INTERFERENCE

SURFACE FORCE APPARATUS BASED ON A SPHERICAL LENS

SURFACE FORCE APPARATUS BASED ON A SPHERICAL LENS

SCANNING TRANSMISSION ELECTRON MICROSCOPE HAVING MULTIPLE BEAMS AND...

SCANNING TRANSMISSION ELECTRON MICROSCOPE HAVING MULTIPLE BEAMS AND...

PENTACENE-CARBON NANOTUBE COMPOSITE, METHOD OF FORMING THE COMPOSIT...

COMPLEXES OF CARBON NANOTUBES AND FULLERENES WITH MOLECULAR-CLIPS A...

COMPLEXES OF CARBON NANOTUBES AND FULLERENES WITH MOLECULAR-CLIPS A...

COMPLEXES OF CARBON NANOTUBES AND FULLERENES WITH MOLECULAR-CLIPS A...

COMPLEXES OF CARBON NANOTUBES AND FULLERENES WITH MOLECULAR-CLIPS A...

Method for Preparation of Flat Step-Free Silicon Carbide Surfaces

PENTACENE-CARBON NANOTUBE COMPOSITE, METHOD OF FORMING THE COMPOSIT...

METHOD AND APPARATUS FOR SURFACE POTENTIAL REFLECTION ELECTRON MASK...

Aberration-correcting cathode lens microscopy instrument

Energy-filtering cathode lens microscopy instrument

Method and apparatus for surface potential reflection electron mask...