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Ruimin Qiao
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Berkeley, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
X-ray sequential array wavelength dispersive spectrometer
Patent number
11,885,755
Issue date
Jan 30, 2024
Sigray, Inc.
Wenbing Yun
G01 - MEASURING TESTING
Information
Patent Grant
System and method for x-ray absorption spectroscopy using a crystal...
Patent number
11,428,651
Issue date
Aug 30, 2022
Sigray, Inc.
Wenbing Yun
G01 - MEASURING TESTING
Information
Patent Grant
System and method for x-ray absorption spectroscopy using a crystal...
Patent number
11,215,572
Issue date
Jan 4, 2022
Sigray, Inc.
Wenbing Yun
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
X-RAY SEQUENTIAL ARRAY WAVELENGTH DISPERSIVE SPECTROMETER
Publication number
20230349842
Publication date
Nov 2, 2023
Sigray, Inc.
Wenbing Yun
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING A CRYSTAL...
Publication number
20220082516
Publication date
Mar 17, 2022
Sigray, Inc.
Wenbing Yun
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING A CRYSTAL...
Publication number
20210356412
Publication date
Nov 18, 2021
Sigray, Inc.
Wenbing Yun
G01 - MEASURING TESTING