Rusmin Kudinar

Person

Union City, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
3D microscope including insertable components to provide multiple i...
- Patent number 11,536,940
- Issue date Dec 27, 2022
- KLA-Tencor Corporation
- James Jianguo Xu
- G02 - OPTICS
Information Patent Grant
3D microscope including insertable components to provide multiple i...
- Patent number 11,294,161
- Issue date Apr 5, 2022
- KLA-Tencor Corporation
- James Jianguo Xu
- G02 - OPTICS
Information Patent Grant
3D microscope including insertable components to provide multiple i...
- Patent number 10,884,228
- Issue date Jan 5, 2021
- KLA-Tencor Corporation
- James Jianguo Xu
- G02 - OPTICS
Information Patent Grant
Dual mode inspector
- Patent number 10,769,769
- Issue date Sep 8, 2020
- KLA-Tencor Corporation
- Steven W. Meeks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dual mode inspector
- Patent number 10,475,173
- Issue date Nov 12, 2019
- KLA-Tencor Corporation
- Steven W. Meeks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
3D microscope and methods of measuring patterned substrates
- Patent number 10,209,501
- Issue date Feb 19, 2019
- KLA-Tencor Corporation
- Zhen Hou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-surface specular reflection inspector
- Patent number 10,094,787
- Issue date Oct 9, 2018
- KLA-Tencor Corporation
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
3D microscope including insertable components to provide multiple i...
- Patent number 10,048,480
- Issue date Aug 14, 2018
- Zeta Instruments, Inc.
- James Jianguo Xu
- G02 - OPTICS
Information Patent Grant
Method of detecting defect location using multi-surface specular re...
- Patent number 9,921,169
- Issue date Mar 20, 2018
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Multi-surface optical 3D microscope
- Patent number 9,664,888
- Issue date May 30, 2017
- Zeta Instruments, Inc.
- Ken Kinsun Lee
- G02 - OPTICS
Information Patent Grant
Multi-surface optical 3D microscope
- Patent number 9,645,381
- Issue date May 9, 2017
- Zeta Instruments, Inc.
- Ken Kinsun Lee
- G02 - OPTICS
Information Patent Grant
3D microscope and methods of measuring patterned substrates
- Patent number 9,389,408
- Issue date Jul 12, 2016
- Zeta Instruments, Inc.
- Zhen Hou
- G01 - MEASURING TESTING
Information Patent Grant
Multi-surface optical 3D microscope
- Patent number 9,036,869
- Issue date May 19, 2015
- Zeta Instruments, Inc.
- Ken Kinsun Lee
- G02 - OPTICS
Information Patent Grant
System and method for monitoring LED chip surface roughening process
- Patent number 8,976,366
- Issue date Mar 10, 2015
- Zeta Instruments, Inc.
- James Jianguo Xu
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspector
- Patent number 8,896,825
- Issue date Nov 25, 2014
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Multi-surface scattered radiation differentiation
- Patent number 8,848,181
- Issue date Sep 30, 2014
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspector with selective scattered radiation blocker
- Patent number 8,836,935
- Issue date Sep 16, 2014
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspector
- Patent number 8,830,456
- Issue date Sep 9, 2014
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Multi-surface optical inspector
- Patent number 8,830,457
- Issue date Sep 9, 2014
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Interchangeable disk clamp
- Patent number 8,498,184
- Issue date Jul 30, 2013
- KLA-Tencor Corporation
- Rusmin Kudinar
- G11 - INFORMATION STORAGE
Information Patent Grant
Wafer edge inspection
- Patent number 7,656,519
- Issue date Feb 2, 2010
- KLA-Tencor Corporation
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Wafer edge inspection
- Patent number 7,532,318
- Issue date May 12, 2009
- KLA-Tencor Corporation
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Wafer edge inspection
- Patent number 7,161,667
- Issue date Jan 9, 2007
- KLA-Tencor Technologies Corporation
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Wafer edge inspection
- Patent number 7,161,668
- Issue date Jan 9, 2007
- KLA-Tencor Technologies Corporation
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Combined high speed optical profilometer and ellipsometer
- Patent number 7,110,097
- Issue date Sep 19, 2006
- KLA-Tencor Technologies Corporation
- Steven W Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Combined high speed optical profilometer and ellipsometer
- Patent number 7,075,630
- Issue date Jul 11, 2006
- KLA-Tencor Technologies Corporation
- Steven W Meeks
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring object characteristics using phase...
- Patent number 6,956,658
- Issue date Oct 18, 2005
- KLA-Tencor Technologies Corporation
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring properties of an object using a pha...
- Patent number 6,956,660
- Issue date Oct 18, 2005
- KLA Tencor Technologies
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Combined high speed optical profilometer and ellipsometer
- Patent number 6,757,056
- Issue date Jun 29, 2004
- Candela Instruments
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
System for simultaneously measuring thin film layer thickness, refl...
- Patent number 6,717,671
- Issue date Apr 6, 2004
- Candela Instruments
- Steven W. Meeks
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
3D Microscope Including Insertable Components To Provide Multiple I...
- Publication number 20230087619
- Publication date Mar 23, 2023
- KLA-Tencor Corporation
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
3D MICROSCOPE INCLUDING INSERTABLE COMPONENTS TO PROVIDE MULTIPLE I...
- Publication number 20210088768
- Publication date Mar 25, 2021
- KLA-Tencor Corporation
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
3D MICROSCOPE INCLUDING INSERTABLE COMPONENTS TO PROVIDE MULTIPLE I...
- Publication number 20210080710
- Publication date Mar 18, 2021
- KLA-Tencor Corporation
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
3D MICROSCOPE INCLUDING INSERTABLE COMPONENTS TO PROVIDE MULTIPLE I...
- Publication number 20180356623
- Publication date Dec 13, 2018
- KLA-Tencor Corporation
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
DUAL MODE INSPECTOR
- Publication number 20180005364
- Publication date Jan 4, 2018
- Zeta Instruments, Inc.
- Steven W. Meeks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DETECTING DEFECT LOCATION USING MULTI-SURFACE SPECULAR RE...
- Publication number 20170336330
- Publication date Nov 23, 2017
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
MULTI-SURFACE SPECULAR REFLECTION INSPECTOR
- Publication number 20170336331
- Publication date Nov 23, 2017
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
3D Microscope And Methods Of Measuring Patterned Substrates
- Publication number 20160253813
- Publication date Sep 1, 2016
- Zeta Instruments, Inc.
- Zhen Hou
- G02 - OPTICS
Information Patent Application
3D Microscope And Methods Of Measuring Patterned Substrates
- Publication number 20160252714
- Publication date Sep 1, 2016
- Zeta Instruments, Inc.
- Zhen Hou
- G02 - OPTICS
Information Patent Application
Multi-Surface Optical 3D Microscope
- Publication number 20150226952
- Publication date Aug 13, 2015
- Zeta Instruments, Inc.
- Ken Kinsun Lee
- G02 - OPTICS
Information Patent Application
Multi-Surface Optical 3D Microscope
- Publication number 20150226953
- Publication date Aug 13, 2015
- Zeta Instruments, Inc.
- Ken Kinsun Lee
- G02 - OPTICS
Information Patent Application
MULTI-SURFACE SCATTERED RADIATION DIFFERENTIATION
- Publication number 20140307255
- Publication date Oct 16, 2014
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
Optical Inspector
- Publication number 20140218722
- Publication date Aug 7, 2014
- Zeta Instruments, Inc.
- Steven W. Meeks
- G02 - OPTICS
Information Patent Application
Optical Inspector
- Publication number 20140218724
- Publication date Aug 7, 2014
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
System And Method For Monitoring LED Chip Surface Roughening Process
- Publication number 20120327414
- Publication date Dec 27, 2012
- Zeta Instruments, Inc.
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
3D Microscope Including Insertable Components To Provide Multiple I...
- Publication number 20120176475
- Publication date Jul 12, 2012
- Zeta Instruments, Inc.
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
Multi-Surface Optical 3D Microscope
- Publication number 20120051660
- Publication date Mar 1, 2012
- Zeta Instruments, Inc.
- Ken Kinsun Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
3D Microscope And Methods Of Measuring Patterned Substrates
- Publication number 20120019626
- Publication date Jan 26, 2012
- Zeta Instruments, Inc.
- Zhen Hou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Wafer Edge Inspection
- Publication number 20090059236
- Publication date Mar 5, 2009
- KLA-Tencor Technologies Corporation
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
WAFER EDGE INSPECTION
- Publication number 20070127016
- Publication date Jun 7, 2007
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
Wafer edge inspection
- Publication number 20060250609
- Publication date Nov 9, 2006
- KLA-Tencor Technologies Corp.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
Wafer edge inspection
- Publication number 20060250610
- Publication date Nov 9, 2006
- KLA-Tencor Technologies Corp.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
Combined high speed optical profilometer and ellipsometer
- Publication number 20060066854
- Publication date Mar 30, 2006
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
Combined high speed optical profilometer and ellipsometer
- Publication number 20040233419
- Publication date Nov 25, 2004
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
System for simultaneously measuring thin file layer thickness, refl...
- Publication number 20040160604
- Publication date Aug 19, 2004
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
Combined high speed optical profilometer and ellipsometer
- Publication number 20020015146
- Publication date Feb 7, 2002
- Steven W. Meeks
- G01 - MEASURING TESTING

Rusmin Kudinar

Person

Patents Grantslast 30 patents

3D microscope including insertable components to provide multiple i...

3D microscope including insertable components to provide multiple i...

3D microscope including insertable components to provide multiple i...

Dual mode inspector

Dual mode inspector

3D microscope and methods of measuring patterned substrates

Multi-surface specular reflection inspector

3D microscope including insertable components to provide multiple i...

Method of detecting defect location using multi-surface specular re...

Multi-surface optical 3D microscope

Multi-surface optical 3D microscope

3D microscope and methods of measuring patterned substrates

Multi-surface optical 3D microscope

System and method for monitoring LED chip surface roughening process

Optical inspector

Multi-surface scattered radiation differentiation

Optical inspector with selective scattered radiation blocker

Optical inspector

Multi-surface optical inspector

Interchangeable disk clamp

Wafer edge inspection

Wafer edge inspection

Wafer edge inspection

Wafer edge inspection

Combined high speed optical profilometer and ellipsometer

Combined high speed optical profilometer and ellipsometer

System and method for measuring object characteristics using phase...

System and method for measuring properties of an object using a pha...

Combined high speed optical profilometer and ellipsometer

System for simultaneously measuring thin film layer thickness, refl...

Patents Applicationslast 30 patents

3D Microscope Including Insertable Components To Provide Multiple I...

3D MICROSCOPE INCLUDING INSERTABLE COMPONENTS TO PROVIDE MULTIPLE I...

3D MICROSCOPE INCLUDING INSERTABLE COMPONENTS TO PROVIDE MULTIPLE I...

3D MICROSCOPE INCLUDING INSERTABLE COMPONENTS TO PROVIDE MULTIPLE I...

DUAL MODE INSPECTOR

METHOD OF DETECTING DEFECT LOCATION USING MULTI-SURFACE SPECULAR RE...

MULTI-SURFACE SPECULAR REFLECTION INSPECTOR

3D Microscope And Methods Of Measuring Patterned Substrates

3D Microscope And Methods Of Measuring Patterned Substrates

Multi-Surface Optical 3D Microscope

Multi-Surface Optical 3D Microscope

MULTI-SURFACE SCATTERED RADIATION DIFFERENTIATION

Optical Inspector

Optical Inspector

System And Method For Monitoring LED Chip Surface Roughening Process

3D Microscope Including Insertable Components To Provide Multiple I...

Multi-Surface Optical 3D Microscope

3D Microscope And Methods Of Measuring Patterned Substrates

Wafer Edge Inspection

WAFER EDGE INSPECTION

Wafer edge inspection

Wafer edge inspection

Combined high speed optical profilometer and ellipsometer

Combined high speed optical profilometer and ellipsometer

System for simultaneously measuring thin file layer thickness, refl...

Combined high speed optical profilometer and ellipsometer