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Ryan W. Rieger
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Vertical sensor assembly method
Patent number
8,703,543
Issue date
Apr 22, 2014
Honeywell International Inc.
Hong Wan
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Systems and methods for three dimensional sensors
Patent number
8,459,112
Issue date
Jun 11, 2013
Honeywell International Inc.
Ryan W. Rieger
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for three-axis sensor chip packages
Patent number
8,316,552
Issue date
Nov 27, 2012
Honeywell International Inc.
Lakshman Withanawasam
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Integrated 3-axis field sensor and fabrication methods
Patent number
7,564,237
Issue date
Jul 21, 2009
Honeywell International Inc.
Ryan W. Rieger
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for linear positioning
Patent number
7,355,389
Issue date
Apr 8, 2008
Honeywell International, Inc.
Ryan W. Rieger
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEMS AND METHODS FOR THREE DIMENSIONAL SENSORS
Publication number
20120313193
Publication date
Dec 13, 2012
Honeywell International Inc.
Ryan W. Rieger
G01 - MEASURING TESTING
Information
Patent Application
THREE-AXIS MAGNETIC SENSORS
Publication number
20120299587
Publication date
Nov 29, 2012
Honeywell International Inc.
Ryan W. Rieger
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR THREE-AXIS SENSOR CHIP PACKAGES
Publication number
20120279077
Publication date
Nov 8, 2012
Honeywell International Inc.
Lakshman Withanawasam
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
VERTICAL SENSOR ASSEMBLY METHOD
Publication number
20110012213
Publication date
Jan 20, 2011
Honeywell International Inc.
Hong Wan
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
INTEGRATED 3-AXIS FIELD SENSOR AND FABRICATION METHODS
Publication number
20090102475
Publication date
Apr 23, 2009
Honeywell International Inc.
Ryan W. Rieger
G01 - MEASURING TESTING
Information
Patent Application
3D INTEGRATED COMPASS PACKAGE
Publication number
20090072823
Publication date
Mar 19, 2009
Honeywell International Inc.
Hong Wan
G01 - MEASURING TESTING
Information
Patent Application
Method and system for linear positioning
Publication number
20070096723
Publication date
May 3, 2007
Honeywell International Inc.
Ryan W. Rieger
G01 - MEASURING TESTING